Abstract: A transceiver integrated circuit including a transmitter section having a phase-locked loop with an oscillator to provide an output at a predetermined transmission frequency, and a receiver section having a phase-locked loop with an oscillator used to provide a recovered clock from an incoming data signal. In a second mode when no incoming data is being received, the receiver oscillator is controlled in accordance with the transmitter oscillator to operate the receiver oscillator at the expected frequency of future data. Therefore, when data is received, the receiver oscillator is at the same approximate frequency as the incoming data thereby enabling fast acquisition by merely adjusting the phase of the receiver oscillator to the incoming data.

Abstract: A test equipment pin driver having a main output channel including a pulse forming circuit, a buffer and an output amplifier connected in series. The pulse forming circuit provides pulses that are timed to a data input signal, and the buffer passes the pulses to the amplifier which produces driver pulses adapted to be transmitted to a device under test. The high and low voltage levels of the driver pulses are made substantially the same as programmed high and low voltages by providing scaled replicas of the buffer and amplifier, and using closed loop compensation to accurately drive the replica outputs to the high and low programmed voltages, respectively. The replicas mirror the DC performance of the buffer and amplifier of the main output channel, and clamping voltages are provided from the closed loops to enable operation of the main output channel in a manner that produces driver pulses with the programmed high and low voltage levels.