Abstract: Method and apparatus for generating a test program for an integrated circuit having an embedded processor. One embodiment has a system which includes an embedded microprocessor; a plurality of assembly language instructions stored in a memory, where the assembly language instructions substantially exercise a critical path or a path closest to the critical path in the embedded microprocessor; and programmable test circuitry having a programmable clock circuit for providing a multiplied clock signal to the embedded microprocessor in order to execute the assembly language instructions.
Type:
Grant
Filed:
April 30, 2004
Date of Patent:
September 11, 2007
Assignee:
Xilinx, Inc.
Inventors:
Ahmad R. Ansari, Mehul R. Vashi, Nigel G. Herron, Stephen M. Douglass