Abstract: An output of a common mode differential amplifier is initialized to a known state, which includes inputting a voltage to a network conductor of an electronic assembly, where the network conductor is coupled to a first input node of a first differential input of the amplifier. The amplifier is on an integrated circuit chip of the assembly and has a self-bias node. Circuitry of the amplifier normally adjusts to obtain an equilibrium voltage on the self-bias node in response to the inputted voltages. To initialize the amplifier output, however, preset circuitry on the integrated circuit chip overrides the normal equilibrium voltage on the self-bias node, forcing the self-bias node to a predetermined voltage regardless of the amplifier input voltages. In response, the amplifier produces an desired initial output state on a first output node of the amplifier.

Abstract: Integrated circuit memory is tested to discover defective memory elements. To replace the defective memory elements, spare memory elements are selected and a string is generated to indicate which ones of the spares replace which ones of the defective memory elements. The number of bits of the string depend upon how many of the memory elements are defective. Although a certain number of the memory elements are defective, which determines the number of the string bits, nevertheless, a number of fuses to program on the integrated circuit is determined responsive to how many fuses are available for programming relative to the number of the binary string bits. That is, if more fuses are available than a certain threshold number relative to the number of string bits (as is preferred), then more than the threshold number are programmed. If not, then only that certain threshold number of fuses are programmed.