Patents Represented by Attorney W. Richard Brady

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  • Integrated circuit tester using ion beam
    Patent number: 5929645
    Abstract: Testing an Integrated circuit (420) for performance during exposure to an ion beam. Ion beams of atoms with atomic weights in the range of 6 to 20 impinging on an integrated circuit simulate the effects of cosmic ray neutrons interacting with silicon atoms of the integrated circuit.
    Type: Grant
    Filed: April 25, 1997
    Date of Patent: July 27, 1999
    Assignee: Texas Instruments Incorporated
    Inventor: Thomas J. Aton