Patents Represented by Attorney WPAT, Inc
  • Patent number: 7509823
    Abstract: The present invention provides a method for producing a windproof and air-permeable single-layer knit fabric through several simple steps of designing, desizing, and brushing.
    Type: Grant
    Filed: December 5, 2005
    Date of Patent: March 31, 2009
    Assignee: Singtex Industrial Co., Ltd.
    Inventor: Kuo-Chin Chen
  • Patent number: 7491712
    Abstract: The invention relates to a novel process for the preparation of Paricalcitol and intermediates thereof.
    Type: Grant
    Filed: December 10, 2007
    Date of Patent: February 17, 2009
    Assignee: Formosa Laboratories, Inc.
    Inventors: Chze Siong Ng, Ching-Peng Wei
  • Patent number: 7486432
    Abstract: A method for preparing a periodically poled structure according to this aspect of the present invention comprises the steps of providing a ferroelectric substrate and performing a poling process by applying a poling current to at least one portion of the ferroelectric substrate according to a current waveform. The current waveform include a major phase and a tailed phase accompanying the major phase; the major phase has at least one peak current (Ip) and terminates when the current drops substantially equal to Ip/e, and the charge delivered to the portion of the ferroelectric substrate during the major phase is larger than that delivered during the tailed phase. The nucleation phase is configured to generate nucleation sites in the portion of the ferroelectric substrate and the spreading phase is configured to increase the size of the nucleation sites.
    Type: Grant
    Filed: March 8, 2007
    Date of Patent: February 3, 2009
    Assignee: HC Photonics Corp.
    Inventors: Hong Yu Chu, Joseph Lung Chang Ho, Tze Chia Lin, Ming Hsien Chou
  • Patent number: 7430052
    Abstract: A method for correlating line width roughness of gratings first performs a step (a) generating a characteristic curve of a predetermined grating having a known line width, and a step (b) performing a comparing process to select a matching spectrum from a plurality of simulated diffraction spectrum of known line width, and setting the known line width of the matching spectrum as the virtual line width of the predetermined grating. Subsequently, the method performs a step (c) changing a measuring angle and repeating the steps (a) and (b) to generate a virtual line width curve, and calculating the deviation of the virtual line width curve. The method then performs a step (d) changing the line width roughness of the predetermined grating and repeating the steps (a), (b) and (c), and a step (e) correlating the line width roughness and the deviation of the virtual line width curve to generate a correlating curve.
    Type: Grant
    Filed: April 4, 2007
    Date of Patent: September 30, 2008
    Assignee: Industrial Technology Research Institute
    Inventors: Deh Ming Shyu, Yi Sha Ku