Abstract: Systems and methods for detecting a crack or defect in a material are described. An example method may include determining, by a computing device, for each respective adjacent pair of electrodes of a plurality of electrodes electrically coupled to the material, a respective electrode pair voltage. The method also may include determining, by the computing device, for each respective adjacent pair of electrodes, a respective temperature-corrected electrode pair value based on the respective electrode pair voltage and at least one of a respective control voltage associated with the respective adjacent pair of electrodes or a temperature correction factor. The method may further include determining, by the computing device, whether the material includes a crack or defect based on the plurality of respective temperature-corrected electrode pair values.