Abstract: The disclosure features mass spectrometry systems and methods that include an ion source, an ion trap, a detector subsystem featuring first and second detector elements, and a controller electrically connected to the ion source, the ion trap, and the detector subsystem and configured so that during operation of the system, the controller: applies an electrical signal to the ion source to generate positively and negatively charged particles from sample particles in the system; applies an electrical signal to the ion trap to eject a plurality of particles from the ion trap through a common aperture of the ion trap, and determines information about the sample particles based on first and second electrical signals generated by the ejected particles.

Abstract: The disclosure features mass spectrometry systems that include: an ion source; a module featuring an ion trap, an ion detector, and a module housing that at least partially surrounds the ion trap and the ion detector; and a vacuum pump featuring a housing having a recess dimensioned to receive the module, so that when the module is positioned within the recess of the vacuum pump housing, a portion of the module is surrounded by the vacuum pump housing, and during operation of the system, the ion source, ion trap, ion detector, and vacuum pump are connected along a common gas flow path and heat is transferred from the vacuum pump to the module.

Abstract: The disclosure features methods and systems for processing samples that include introducing a sample featuring one or more components in a first electrolyte solution into a separation channel of a fluidic device, applying an electrical potential difference across the sample to cause migration of at least one sample component toward an end of the separation channel, and adjusting at least one of a gas pressure in a reservoir comprising a second electrolyte solution, and a gas pressure external to an aperture positioned at the end of the separation channel, so that the gas pressure in the reservoir is greater than the gas pressure external to the aperture, and directing a flow of the second electrolyte solution in response to the gas pressures through the pumping channel and out of the aperture to discharge the at least one sample component through the aperture.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: Mass spectrometry systems include a core featuring an ion source, an ion trap, and an ion detector connected along a gas path, a pressure regulation subsystem connected to the gas path and configured to regulate a gas pressure in the gas path, a sample pre-concentrator connected to the gas path, where the sample pre-concentrator includes an adsorbent material, and a controller connected to the sample pre-concentrator, where during operation of the system, the controller is configured to heat sample particles adsorbed on the adsorbent material to desorb the particles from the adsorbent material and introduce the desorbed particles into the gas path, and a pressure difference between a gas pressure in the sample pre-concentrator and a gas pressure in at least one of the ion source, the ion trap, and the ion detector when the desorbed particles are introduced into the gas path is 50 mTorr or less.

Abstract: The disclosure features mass spectrometry systems and methods that include an ion source, an ion trap, a detector subsystem featuring first and second detector elements, and a controller electrically connected to the ion source, the ion trap, and the detector subsystem and configured so that during operation of the system, the controller: applies an electrical signal to the ion source to generate positively and negatively charged particles from sample particles in the system; applies an electrical signal to the ion trap to eject a plurality of particles from the ion trap through a common aperture of the ion trap, and determines information about the sample particles based on first and second electrical signals generated by the ejected particles.

Abstract: The disclosure features mass spectrometry systems that include: an ion source; a module featuring an ion trap, an ion detector, and a module housing that at least partially surrounds the ion trap and the ion detector; and a vacuum pump featuring a housing having a recess dimensioned to receive the module, so that when the module is positioned within the recess of the vacuum pump housing, a portion of the module is surrounded by the vacuum pump housing, and during operation of the system, the ion source, ion trap, ion detector, and vacuum pump are connected along a common gas flow path and heat is transferred from the vacuum pump to the module.

Abstract: Mass spectrometry systems include a core featuring an ion source, an ion trap, and an ion detector connected along a gas path, a pressure regulation subsystem connected to the gas path and configured to regulate a gas pressure in the gas path, a sample pre-concentrator connected to the gas path, where the sample pre-concentrator includes an adsorbent material, and a controller connected to the sample pre-concentrator, where during operation of the system, the controller is configured to heat sample particles adsorbed on the adsorbent material to desorb the particles from the adsorbent material and introduce the desorbed particles into the gas path, and a pressure difference between a gas pressure in the sample pre-concentrator and a gas pressure in at least one of the ion source, the ion trap, and the ion detector when the desorbed particles are introduced into the gas path is 50 mTorr or less.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

Abstract: Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.