Patents Assigned to A-Tech Corporation
  • Publication number: 20240142477
    Abstract: Provided is an automatic analyzer without necessity of manual air vent in a pump. This automatic analyzer comprises a water supply tank, a supply path connected to each mechanism of an automatic analyzer from the water supply tank, a water supply pump which supplies water to each mechanism from the water supply tank through the supply path, a detector which detects abnormality in the supply path, a waste liquid path branched from the supply path in a branch pipe provided in the supply path, a relief valve provided in the waste liquid path, and a control unit which controls the operation of each mechanism in the automatic analyzer, in which the control unit opens the relief valve while driving the water supply pump, based on the abnormality in the supply path detected by the detector.
    Type: Application
    Filed: February 17, 2022
    Publication date: May 2, 2024
    Applicant: HITACHI HIGH-TECH CORPORATION
    Inventors: Yasuhisa Oguro, Hiroyuki Takayama, Kouhei Nonaka
  • Patent number: 11971424
    Abstract: An automatic analyzer is provided which is easier to investigate when some troubles such as data abnormality occur in a sample analysis result as compared with an automatic analyzer according to the related art. The automatic analyzer includes: analysis units that perform analysis and quality control analysis for ensuring quality of the analysis; a storage medium that stores quality control results of the quality control analysis performed by the analysis units; a monitor that displays the quality control results; and a control PC that controls an operation of the analysis units (8, 9, and 16), executes, when an arbitrary result is selected from the quality control results stored in the storage medium, based on the selected quality control result, statistical calculation of the selected result and a quality control result performed in the past, and causes the monitor to display a statistical calculation screen as a statistical calculation result.
    Type: Grant
    Filed: March 20, 2019
    Date of Patent: April 30, 2024
    Assignees: HITACHI HIGH-TECH CORPORATION, ROCHE DIAGNOSTICS OPERATIONS, INC.
    Inventors: Yuichi Hirabayashi, Dai Inagi, Satoshi Yokotsuka, Youichi Aruga, Mohamed Abouelsoud
  • Patent number: 11971426
    Abstract: An automatic analysis device that avoids carryover and prevents deterioration of analysis performance without controlling reaction cell position is provided with: a reaction cell in which a sample and a reagent are mixed and allowed to react; a light source that radiates light onto the mixed liquid of the sample and the reagent; a detector that detects the light radiated from the light source; and a cleaning mechanism that cleans the reaction cell. The cleaning mechanism includes an intake nozzle that draws in liquid from the reaction cell and a discharge nozzle that discharges the liquid into the reaction cell; the intake nozzle and the discharge nozzle can move vertically; and the intake nozzle is cleaned by lowering the intake nozzle into the reaction cell, in which a cleaning liquid or cleaning water have been accumulated, without drawing in the cleaning liquid or the cleaning water.
    Type: Grant
    Filed: January 23, 2019
    Date of Patent: April 30, 2024
    Assignee: Hitachi High-Tech Corporation
    Inventors: Rei Konishi, Nobuhiko Sasaki, Masahiko Iijima
  • Patent number: 11971425
    Abstract: An automatic analysis device has a plurality of types of photometers having different quantitative ranges, and an analysis control unit for quantifying the desired component in specimens based on measurement values of one or more photometers selected from among the plurality of types of photometers. The analysis control unit: sets a switching region in an overlap region of respective quantitative ranges of the plurality of types of photometers, said switching region having a greater width than does the variation in quantitative values of the desired component based on the measurement values of photometers having the same specimen; compares the quantitative value of a quantitative range portion that corresponds to the switching region and the quantitative values of the desired component based on the measurement values of the photometers; and selects a photometer to be used in quantitative output of the desired component from among the plurality of types of photometers.
    Type: Grant
    Filed: April 28, 2023
    Date of Patent: April 30, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Yuto Kazama, Masahiko Iijima, Sakuichiro Adachi
  • Patent number: 11971427
    Abstract: Provided is an automated analysis device capable of a more accurate determination of the sizes of bubbles included in a liquid. The automated analysis device includes a detection unit which detects bubbles included in a liquid, an internal standard solution syringe which executes a first liquid supply operation in which a liquid is supplied via the detection unit, a diluent syringe, a sipper syringe, solenoid valves, and a control device which determines whether the size of the bubbles detected during the first liquid supply operation is normal or not based on the operation speed of the liquid supply unit, and controls the operation of the liquid supply unit according to the determination.
    Type: Grant
    Filed: March 10, 2020
    Date of Patent: April 30, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Akinao Fujita, Takushi Miyakawa, Tetsuji Kawahara
  • Patent number: 11971423
    Abstract: An automatic analyzer is capable of transporting a sample at an optimum timing and a method of transporting the sample. An automatic analyzer includes an analysis unit which measures a sample, a transport unit which transports the sample to the analysis unit, and a control unit which controls the analysis unit and the transport unit. A sample is transported to the analysis unit by a time of starting an aspirating operation on the sample by allowing the analysis unit to perform a pre-measurement operation for each measuring method which needs to be performed before aspirating the sample even when the sample is still in the transport unit.
    Type: Grant
    Filed: May 16, 2019
    Date of Patent: April 30, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Naoto Suzuki, Masashi Akutsu, Akihiro Yasui
  • Patent number: 11971346
    Abstract: A biological sample detection device configured to acquire color information of an object of analysis without a deterioration in color extraction accuracy caused by incorrect extraction of color of a colored label and to measure the amount of liquid and determine the type of a sample, by analyzing the biological sample housed in a biological sample tube to which a colored label is attached, and determining whether or not a colored label is present on the biological sample tube; extracting the colored label determined to be present by the colored label presence determining process; removing the colored label from the color image and extracting a detection object region in the biological sample; and analyzing to acquire color information of the detection object region and analyze the liquid amount and the type of the biological sample.
    Type: Grant
    Filed: January 14, 2020
    Date of Patent: April 30, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Mayu Sao, Nobuyoshi Shimane, Fumiyasu Sato, Tomoto Kawamura
  • Patent number: 11972560
    Abstract: A machine learning device with a processor and a memory, in which the processor receives an image and calculates a feature amount of an object included in the image, the processor identifies a local part from the feature amount and calculates a local identification value, the processor calculates an overall identification value using the local identification value, and the processor generates a classifier using the local identification value and the overall identification value and stores it in the memory.
    Type: Grant
    Filed: June 24, 2019
    Date of Patent: April 30, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Hideharu Hattori, Yasuki Kakishita, Kenko Uchida, Sadamitsu Aso, Toshinari Sakurai
  • Publication number: 20240132951
    Abstract: A gene analyzer that analyzes a base sequence of a sample manages an observation environment and mobility correction amount data for correcting a position in a time direction of time-series data of signal intensities of a plurality of bases, and executes the following processes including: a process of scaling the mobility correction amount data associated with the observation environment different from a first observation environment to generate default mobility correction amount data when the gene analyzer receives time-series data of signal intensities of a plurality of bases acquired by electrophoresing the sample in the first observation environment; a process of correcting the position in the time direction of the time-series data of the signal intensities of the plurality of bases using an optimization algorithm; and a process of identifying the base sequence of the sample using the corrected time-series data of the signal intensities of the plurality of bases.
    Type: Application
    Filed: May 17, 2021
    Publication date: April 25, 2024
    Applicant: Hitachi High-Tech Corporation
    Inventor: Toru YOKOYAMA
  • Patent number: 11965820
    Abstract: A reaction vessel capable of measuring a light amount from a reaction liquid without degrading a function of maintaining the reaction vessel at a predetermined temperature is provided. A reaction vessel including a cylindrical shape centered on a first axis, in which an overall length in a first axis direction is longer than an overall length in a second axis direction and an overall length in a third axis direction, the second axis being perpendicular to the first axis and the third axis being perpendicular to the first axis and the second axis. The reaction vessel includes: an opening part which dispenses a liquid at a portion on one end side in the first axis direction; a first flat surface and a second flat surface which is substantially parallel to the first flat surface.
    Type: Grant
    Filed: June 20, 2019
    Date of Patent: April 23, 2024
    Assignee: Hitachi High-Tech Corporation
    Inventors: Yuya Matsuoka, Eiichiro Takada
  • Patent number: 11965902
    Abstract: When washing the inside of a reactor vessel which is used repeatedly, a rough suction is performed before suctioning with a washing tip; however, unwanted washing liquid may remain that may affect analysis results. The present invention provides an automatic analysis device for analyzing a sample using light, in which the automatic analysis device is characterized in that: a washing mechanism comprises a washing liquid supply nozzle that supplies washing liquid to a reactor vessel after analysis, a washing liquid suction nozzle that suctions the supplied washing liquid, a washing tip provided to the bottom end of the washing liquid suction nozzle, and a rough suction nozzle that suctions, in advance, a liquid within the reactor vessel before suctioning with the washing tip; and after the rough suction, liquid is caused to remain so that the bottom surface of the reactor vessel is not exposed.
    Type: Grant
    Filed: January 23, 2019
    Date of Patent: April 23, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Kei Shioya, Hiroki Akase, Rei Konishi, Masaaki Sakaguchi
  • Patent number: 11967482
    Abstract: Deflection of a secondary beam, and astigmatism correction of a primary beam or of the secondary beam are carried out using a multi-pole electromagnetic deflector which deflects the path of the secondary beam toward a detector.
    Type: Grant
    Filed: March 8, 2019
    Date of Patent: April 23, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Wen Li, Hajime Kawano, Momoyo Enyama, Makoto Sakakibara
  • Publication number: 20240125810
    Abstract: An automatic analysis system includes: a plurality of automatic analyzers; a conveyance line connected to the analyzers; and a computer configured to control the conveyance line to distribute a sample to the automatic analyzers. Each of the automatic analyzers includes a first component that is constantly used and a second component that is intermittently used. The computer is configured to compare a usage time of the first component of each automatic analyzer with a set time, select, when the usage time of the first component of any one of the plurality of automatic analyzers exceeds the set time, the automatic analyzer in which the usage time of the first component exceeds the set time as a prioritized device, and control the conveyance line such that a sample used for analysis in the second component is conveyed to the prioritized device in preference to another automatic analyzer.
    Type: Application
    Filed: January 25, 2022
    Publication date: April 18, 2024
    Applicant: Hitachi High-Tech Corporation
    Inventors: Ayako WATAHIKI, Osamu WATABE
  • Publication number: 20240125812
    Abstract: An automatic analyzer includes a dispensing mechanism having at least one horizontal drive shaft and one vertical drive shaft for moving the dispensing nozzle, a first mechanism having a stop position at which the dispensing nozzle is stopped, and a control section for positioning the dispensing nozzle with the stop position of the first mechanism. A member is disposed on the first mechanism to indicate predetermined first and second positions of the first mechanism so that the first and the second positions are detected by sensing the member using the dispensing nozzle. Based on the displacement between the first and the second positions indicating the displacement of the relative position between the dispensing mechanism and the first mechanism, the control section calculates a correction value for correcting the displacement of the stop position caused by fluctuation in a relative position between the dispensing mechanism and the first mechanism.
    Type: Application
    Filed: February 24, 2022
    Publication date: April 18, 2024
    Applicant: Hitachi High-Tech Corporation
    Inventors: Kenshiro SAKATA, Yoshihiro KABE, Takuya TAKAHASHI
  • Patent number: 11961699
    Abstract: A charged particle beam device which prevents an appearance of a shading contrast due to azimuth discrimination and obtains a clear magnetic domain contrast image with a high resolution and a high throughput. The charged particle beam device includes an electron beam source; a sample stage; an objective lens configured to focus electron beams on a sample; a detector that is mounted on a charged particle beam source side with respect to the objective lens and separately detects secondary electrons emitted in azimuth angle ranges of two or more different azimuths for the same observation region; an image processing and image management device including an image processing unit configured to perform synthesis after performing shading correction and contrast adjustment on an image obtained by detecting a first emission azimuth and an image obtained by detecting a second emission azimuth; an image database; and an image display unit.
    Type: Grant
    Filed: December 25, 2018
    Date of Patent: April 16, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Hideo Morishita, Teruo Kohashi, Hiroyuki Yamamoto, Junichi Katane
  • Patent number: 11959895
    Abstract: The analysis apparatus includes a standby section which is provided between a dispensing operation of an analysis item B? prior to an analysis item C and the sample analysis channel introduction. The sample analysis channel introduction is arranged prior to a data collection section of an analysis item A. The operation is started earlier but after a sample dispensing operation section of the analysis item A. A sample dispensing operation section of the analysis item C can be started earlier and the analysis time of the analysis item C can be moved to immediately after a sample analysis operation section of the analysis item B?. The analysis item A in a second cycle can be started earlier by the early start time of the analysis item C in a first cycle. A total processing time Tc can be shorter than a total processing time Tb.
    Type: Grant
    Filed: November 30, 2018
    Date of Patent: April 16, 2024
    Assignees: HITACHI HIGH-TECH CORPORATION, ROCHE DIAGNOSTICS OPERATIONS, INC.
    Inventors: Daisuke Akieda, Takayuki Sugime, Izumi Ogata, Makoto Nogami
  • Patent number: 11959914
    Abstract: The automatic analyzer includes: a sample dispensing unit that dispenses a sample into a reaction vessel; a reagent dispensing unit that dispenses a reagent into the reaction vessel; a control unit that controls the sample dispensing unit and the reagent dispensing unit; and a measurement unit that measures a mixed solution of the sample and the reagent mixed in the reaction vessel. The reagent includes three types of reagents of: a first reagent that specifically binds to an antigen in the sample; a second reagent that specifically binds to a site different from that to which the first reagent binds with respect to the antigen and has a label to be detected by the measurement unit; and a third reagent that specifically binds to a site different from the binding site of the first reagent and the antigen and contains insoluble carriers.
    Type: Grant
    Filed: January 29, 2019
    Date of Patent: April 16, 2024
    Assignees: HITACHI HIGH-TECH CORPORATION, ROCHE DIAGNOSTICS OPERATIONS, INC.
    Inventors: Tatsuki Takakura, Kenta Imai, Takaaki Hagiwara, Yoshihiro Yamashita, Taku Sakazume, Beatus Ofenloch-Haehnle, Michaela Windfuhr, Ursula Pauselius-Fuchs, Rita Haerteis
  • Patent number: 11961701
    Abstract: When adjusting optical axes of a multi-beam charged particle beam device, because parameters of optical systems are inter-dependent, the time required to adjust the parameters increases. Thus, the present invention provides a charged particle beam device provided with an optical parameter setting unit for setting parameters of optical systems for emitting a plurality of primary charged particle beams to a sample, detectors for individually detecting a plurality of secondary charged particle beams discharged from the sample, a plurality of memories for storing signals detected by the detectors and converted into digital pixels in the form of images, evaluation value derivation units for deriving evaluation values of the primary charged particle beams from the images, and a GUI capable of displaying the images and receiving an input from a user, wherein the GUI displays the images and evaluation results based on the evaluation values and changes various optical parameters in real-time.
    Type: Grant
    Filed: April 24, 2019
    Date of Patent: April 16, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Tomoharu Nagashima, Kazuki Ikeda, Wen Li, Masashi Wada, Hajime Kawano
  • Patent number: 11961704
    Abstract: There is provided a charged particle beam system having a computer system for controlling an acceleration voltage of a charged particle beam emitted from a charged particle source, the system including: a first diaphragm group having first and second diaphragms which are diaphragms that act on the charged particle beam and have different thicknesses; and a first diaphragm switching mechanism for switching the diaphragm in the first diaphragm group, in which the computer system controls the first diaphragm switching mechanism so as to switch from the first diaphragm to the second diaphragm according to an increase or decrease of the acceleration voltage.
    Type: Grant
    Filed: July 2, 2019
    Date of Patent: April 16, 2024
    Assignee: Hitachi High-Tech Corporation
    Inventors: Naoki Akimoto, Takashi Doi, Yuzuru Mochizuki
  • Patent number: 11961719
    Abstract: Provided is a vacuum processing method capable of preventing particles from adhering to a wafer due to a titanium (Ti)-based reaction product. The vacuum processing method is applicable to a plasma processing apparatus including: a sample stage disposed in a processing chamber inside a vacuum container, on which a wafer having a titanium (Ti)-containing film is placed; a coil supplied with a radio frequency power for forming plasma in the processing chamber; and a heating device that emits an electromagnetic wave for heating the wafer placed on an upper surface of the sample stage. The vacuum processing method includes a step of etching the titanium (Ti)-containing film, and a step of cleaning an inside of the processing chamber by using a mixed gas of nitrogen trifluoride (NF3) gas, argon gas, and a chlorine gas.
    Type: Grant
    Filed: June 25, 2020
    Date of Patent: April 16, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Nozomu Yoshioka, Kazumasa Okuma, Takao Arase