Abstract: According to an embodiment of a specimen inspection apparatus, the specimen inspection apparatus may comprise: a radiation unit; a reflection unit; a focus adjusting unit; a reception unit; and a control unit. The specimen inspection apparatus may comprise: a radiation unit for emitting a terahertz wave; a reflection unit for changing the path of a terahertz wave emitted from the radiation unit; a focus adjusting unit for forming an irradiation region on a specimen according to the path of the terahertz wave; a reception unit for receiving individual terahertz waves obtained by reflection, by the specimen, of the terahertz wave irradiated onto the first region; and a control unit for controlling the distance between at least two elements among the plurality of elements, and detecting whether the specimen is defective, according to the reflectivity difference between the terahertz waves.

Abstract: Disclosed is an optical image stabilization (OIS) structure that prevents camera shake occurring in a smartphone camera, and a camera module having the same. The OIS structure includes: a base housing provided with an OIS coil; a lens housing disposed over the base housing to be apart therefrom; and an OIS leaf spring for allowing the base housing and the lens housing to be elastically coupled to each other.

Abstract: Disclosed is an optical image stabilization (OIS) structure that prevents camera shake occurring in a smartphone camera, and a camera module having the same. The OIS structure includes: a hexahedral base housing provided with an OIS coil; a hexahedral lens housing disposed over the base housing to be apart therefrom; and an OIS leaf spring for allowing the base housing and the lens housing to be elastically coupled to each other.