Abstract: The present invention relates to a method and apparatus for testing components in ATM networks utilizing loop-back based ATM layer testing. The method and apparatus utilize interfaces and identifier codes to send and loop-back test cells along portions of virtual channels to test the virtual channels.
Type:
Application
Filed:
March 6, 2002
Publication date:
September 11, 2003
Applicant:
ADC DSL System, Inc.
Inventors:
Randall L. Powers, Robert S. Kroninger, Melvin R. Phillips, Dieter H. Nattkemper
Abstract: A low cost differential voltage limiter circuit provides a feedback to regulate a voltage output of a voltage source. In one embodiment, the limiter circuit includes a transistor coupled to outputs of first and second voltage sources. If a differential voltage between the two sources exceeds a predetermined threshold, the output voltage of the higher source is reduced. In one embodiment, a PNP transistor is used to regulate the high voltage source.