Abstract: A thermal detection device includes a first camera, a second camera, a thermal camera, and a processor. The thermal camera is disposed between the first camera and the second camera, and detects a to-be-measured object to generate a first temperature value. The processor includes a control unit, which controls the first camera and the second camera according to settings of a first measurement mode and a second measurement mode. In the first measurement mode, the control unit captures images from the first camera and the second camera to measure a first distance between the to-be-measured object and an installation surface. In the second measurement mode, the control unit captures images from the first camera to measure a size of the to-be-measured object. The processor determines a second temperature value of the to-be-measured object according to the first temperature value, the first distance, and the size of the to-be-measured object.
Type:
Grant
Filed:
April 18, 2018
Date of Patent:
November 13, 2018
Assignee:
ADE Technology Inc.
Inventors:
Yui-Liang Chew, Chu-Sheng Su, Ping-Ying Tu
Abstract: A thermal detection device includes a first camera, a second camera, a thermal camera, and a processor. The thermal camera is disposed between the first camera and the second camera, and detects a to-be-measured object to generate a first temperature value. The processor includes a control unit, which controls the first camera and the second camera according to settings of a first measurement mode and a second measurement mode. In the first measurement mode, the control unit captures images from the first camera and the second camera to measure a first distance between the to-be-measured object and an installation surface. In the second measurement mode, the control unit captures images from the first camera to measure a size of the to-be-measured object. The processor determines a second temperature value of the to-be-measured object according to the first temperature value, the first distance, and the size of the to-be-measured object.
Type:
Application
Filed:
April 18, 2018
Publication date:
October 18, 2018
Applicant:
ADE Technology Inc.
Inventors:
Yui-Liang Chew, Chu-Sheng Su, Ping-Ying Tu
Abstract: A non-contact capacitive displacement measurement gage that provides high accuracy displacement measurements of well-connected targets and poorly-connected targets. The capacitive displacement measurement gage includes a capacitive probe, first and second amplifiers, and a signal generator. The capacitive probe includes a sensor electrode, a guard electrode, and a compensating electrode. The signal generator provides a predetermined voltage signal directly to the sensor electrode, to the guard electrode through the first amplifier having unity gain, and to the compensating electrode through the second amplifier having a predetermined transfer function. The second amplifier assures that substantially zero current is driven into the target element by the probe during gage operation, thereby allowing highly accurate displacement measurements of target elements having unknown or poorly controlled impedance.