Patents Assigned to ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
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Patent number: 12213733Abstract: Systems and methods for detecting physical characteristics of a multilayered tissue of a subject, such as a tear film including analyzing received detector-output indicative of optical properties of light reflected or deflected from the respective multilayered tissue, to determine spectral properties of the multilayered tissue; and determining physical characteristics of the multilayered tissue by using multiple spectral models of the of the multilayered tissue, each model being associated with spectral properties indicative of different tissue characteristics, wherein physical characteristics of the multilayered tissue are determined by hierarchal determination of a best-fit model from the multiple spectral models.Type: GrantFiled: April 25, 2021Date of Patent: February 4, 2025Assignee: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.Inventors: Yoel Cohen, Ra'anan Gefen, Yoel Arieli, Lee Barnea Nehoshtan, Naor Deri
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Patent number: 12023099Abstract: Apparatus and methods are described for performing tear film structure measurement on a tear film of an eye of a subject. A broadband light source (100) is configured to generate broadband light. A spectrometer (250) is configured to measure a spectrum of light of the broadband light that is reflected from at least one spot on the tear film, the spot having a diameter of between 100 microns and 240 microns. A computer processor (28) is coupled to the spectrometer and configured to determine a characteristic of the tear film based upon the spectrum of light measured by the spectrometer. Other applications are also described.Type: GrantFiled: September 13, 2021Date of Patent: July 2, 2024Assignee: AdOM, ADVANCED OPTICAL TECHNOLOGIES LTD.Inventors: Yoel Arieli, Yoel Cohen, Shlomi Epstein, Dror Arbel, Ra'anan Gefen
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Patent number: 11965777Abstract: Apparatus and methods are described for calibrating an optical system that is used for measuring optical properties of a portion of a subjects body. During a calibration stage, a front surface of a calibration object (300) is illuminated, light reflected from a plurality of points on the calibration object (300) is detected, and intensities of the light reflected from the plurality of points on the calibration object (300) are measured. During a measurement stage, the portion of the subjects body is illuminated, and light reflected from the portion of the subjects body is detected. Measurements performed upon the light that was reflected from the portion of the subjects body are calibrated, using the measured intensities of the light reflected from the plurality of points on the calibration object (300). Other applications are also described.Type: GrantFiled: July 4, 2019Date of Patent: April 23, 2024Assignee: Adom, Advanced Optical Technologies LTD.Inventors: Yoel Cohen, Ra'anan Gefen, Shlomi Epstein, Yoel Arieli
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Publication number: 20220007933Abstract: Apparatus and methods are described for performing tear film structure measurement on a tear film of an eye of a subject. A broadband light source (100) is configured to generate broadband light. A spectrometer (250) is configured to measure a spectrum of light of the broadband light that is reflected from at least one spot on the tear film, the spot having a diameter of between 100 microns and 240 microns. A computer processor (28) is coupled to the spectrometer and configured to determine a characteristic of the tear film based upon the spectrum of light measured by the spectrometer. Other applications are also described.Type: ApplicationFiled: September 13, 2021Publication date: January 13, 2022Applicant: AdOM, ADVANCED OPTICAL TECHNOLOGIES LTD.Inventors: Yoel ARIELI, Yoel COHEN, Shlomi EPSTEIN, Dror ARBEL, Ra'anan GEFEN
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Patent number: 11116394Abstract: Apparatus and methods are described for performing tear film structure measurement on a tear film of an eye of a subject. A broadband light source (100) is configured to generate broadband light. A spectrometer (250) is configured to measure a spectrum of light of the broadband light that is reflected from at least one spot on the tear film, the spot having a diameter of between 100 microns and 240 microns. A computer processor (28) is coupled to the spectrometer and configured to determine a characteristic of the tear film based upon the spectrum of light measured by the spectrometer. Other applications are also described.Type: GrantFiled: August 2, 2017Date of Patent: September 14, 2021Assignee: AdOM, ADVANCED OPTICAL TECHNOLOGIES LTD.Inventors: Yoel Arieli, Yoel Cohen, Shlomi Epstein, Dror Arbel, Ra'anan Gefen
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Patent number: 10612913Abstract: Apparatus and methods are described for determining the tomography and/or topography of an object. A light source generates light, and an optical element generates a 2D pattern from the light and directs the 2D pattern toward the object. An objective lens focuses the 2D pattern at an image plane, and a 2D imager acquires at least one image of the 2D pattern. The image has variable image contrast that varies according to displacement of a surface of the object from the image plane, such that maximal image contrast of the 2D pattern is achieved when the surface of the object and the image plane are coincident. A processing unit, operatively coupled to the 2D imager, derives the object's tomography and/or topography at least partially responsively to the variable image contrast of the image. Other applications are also described.Type: GrantFiled: July 17, 2018Date of Patent: April 7, 2020Assignee: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.Inventors: Yoel Arieli, Yoel Cohen
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Patent number: 10456029Abstract: Apparatus and methods are described, for detecting the surface topography of a portion of a curved surface of an object. A beam of light is directed toward the surface from a broad angle of incidence with respect to an optical axis of a camera. Light reflected from the surface is received by the camera, via a narrow-angle aperture. One or more darkened regions in the received light are detected, and the surface topography of portion of the surface is detected at least partially in response to the detected darkened regions. Other applications are also described.Type: GrantFiled: November 3, 2017Date of Patent: October 29, 2019Assignee: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.Inventors: Yoel Arieli, Yoel Cohen, Shlomi Epstein, Dror Arbel, Ra'anan Gefen
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Patent number: 10415954Abstract: Apparatus and methods are described for determining tomographic and/or topographic data relating to an object. The object is illuminated with at least one wave packet from light generated by a multi-spectral light source. The wave packet is split into two split wave packets, and an optical path difference (OPD) is introduced between the two split wave packets, that is smaller than the coherence length of the wave packet. The two split wave packets are combined to generate a 2D image of the illuminated object, and the data relating to the object is determined by processing the 2D image using long coherence phase shift interferometry algorithms, by analyzing the 2D image as if the 2D image was generated using monochromatic light having a wavelength that is equal to a mean wavelength of the wave packet. Other applications are also described.Type: GrantFiled: July 17, 2018Date of Patent: September 17, 2019Assignee: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.Inventors: Yoel Arieli, Yoel Cohen
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Patent number: 10330462Abstract: Apparatus and methods are described including a line spectrometer that receives a point of light. The line spectrometer includes a first optical element, and a second optical element configured to convert the point of light to a line of light and to direct the line of light toward the first optical element. The first optical element defines first and second surfaces, a distance between the first and second surface varying as a function of distance along the first optical element, the first optical element thereby being configured to generate first and second reflected lines of light that reflect respectively from the first and second surfaces. A detector array receives the first and second lines of light, and generates an interferogram in response thereto. A computer processor determines a spectrum of the point of light, by analyzing the interferogram. Other applications are also described.Type: GrantFiled: June 20, 2018Date of Patent: June 25, 2019Assignee: ADOM, Advanced Optical Technologies Ltd.Inventors: Yoel Arieli, Yoel Cohen
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Publication number: 20190183333Abstract: Apparatus and methods are described for performing tear film structure measurement on a tear film of an eye of a subject. A broadband light source (100) is configured to generate broadband light. A spectrometer (250) is configured to measure a spectrum of light of the broadband light that is reflected from at least one spot on the tear film, the spot having a diameter of between 100 microns and 240 microns. A computer processor (28) is coupled to the spectrometer and configured to determine a characteristic of the tear film based upon the spectrum of light measured by the spectrometer. Other applications are also described.Type: ApplicationFiled: August 2, 2017Publication date: June 20, 2019Applicant: AdOM, ADVANCED OPTICAL TECHNOLOGIES LTD.Inventors: Yoel ARIELI, Yoel COHEN, Shlomi EPSTEIN, Dror ARBEL, Ra'anan GEFEN
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Patent number: 10288407Abstract: Apparatus and methods are described for optically analyzing an object having a plurality of layers, without needing to use a reference mirror. An extended broadband light source produces light, and directs the light toward the object, such as to create respective images of the light source on the respective layers of the object. An imaging system gathers light that is reflected from a point of the object into a conjugate point in the detector. The detector determines the thicknesses of the plurality of layers at the point of the object by analyzing, within the gathered light, interference between light reflected from the plurality of layers of the object at the point. Other applications are also described.Type: GrantFiled: May 25, 2017Date of Patent: May 14, 2019Assignee: ADOM, ADVANCED OPTICAL TECHNOLOGIES, LTD.Inventors: Yoel Arieli, Yosef Weitzman
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Patent number: 10274371Abstract: There is provided a method for analyzing optical properties of an object, including utilizing a light illumination having a plurality of amplitudes, phases and polarizations of a plurality of wavelengths impinging from the object, obtaining modified illuminations corresponding to the light illumination, applying a modification to the light illumination thereby obtaining a modified light illumination, analyzing the modified light illumination, obtaining a plurality of amplitudes, phases and polarizations maps of the plurality of wavelengths, and employing the plurality of amplitudes, phases and polarizations maps for obtaining output representing the object's optical properties. An apparatus for analyzing optical properties of an object is also provided.Type: GrantFiled: December 11, 2015Date of Patent: April 30, 2019Assignee: ADOM, Advanced Optical Technologies Ltd.Inventors: Yoel Arieli, Yosef Weitzman
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Patent number: 10119903Abstract: An apparatus and method for determining optical properties of an object includes a tunable monochromatic light source and an optical system for illuminating at least one point of the object with light from the light source, and collecting light reflected from the object. A biaxial birefringent crystal intercepts a beam of light reflected from the object and propagates the beam along an optical axis of the crystal and transforms the beam of reflected light to a ring of light having a periphery, each point of which has a different polarization plane. A detector array detects respective points along the periphery of the ring and a processing unit is coupled to the detector and is responsive to signals thereby for determining optical properties of the object.Type: GrantFiled: May 29, 2018Date of Patent: November 6, 2018Assignee: ADOM, Advanced Optical Technologies Ltd.Inventors: Yoel Arieli, Yoel Cohen
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Patent number: 10054419Abstract: A method for high dynamic range and high accuracy interferometry measurements is described. The method uses a broadband light source for generating light, an interferometer, a phase shifting device, an imaging optical system and a detector array for collecting and measuring the reflected light from an object. The detected light is processed by a processor unit to obtain the object's surface.Type: GrantFiled: April 29, 2015Date of Patent: August 21, 2018Assignee: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.Inventors: Yoel Arieli, Yoel Cohen
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Patent number: 10054429Abstract: A system (10) for analyzing an object (11) includes a light source (12) producing multiple light components, each of different wavelength and a respective amplitude, phase and polarization. An optical element (13) directs the light components on to the object to create known 2D patterns at different image planes displaced from the optical element by distances that are known functions of the wavelength of the light component. A 2D imager (20) images the 2D patterns and produces a plurality of full view 2D wavelength dependent patterns each corresponding to a known distance from the optical element and each having variable image contrast dependent on displacement of a surface of the object from the image plane, maximal image contrast being achieved when the surface of the object and image plane are coincident. A processing unit (25) determines the object surface based on the variable image contrast of each image.Type: GrantFiled: May 14, 2015Date of Patent: August 21, 2018Assignee: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.Inventors: Yoel Arieli, Yoel Cohen
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Patent number: 10024650Abstract: In a system for analyzing optical properties of an object (350) a point source of light (100) composed of multiple spectral bands each having a respective amplitude, phase and polarization is converted by first optics (120, 150) into a line light source to illuminate an object line on the object. A beam splitter (200) splits the light exiting the first optics and directs a first portion of light on to the object (350) as an illuminated line and a second portion of the light on to a reference mirror (450). Second optics (500) collects respective first and second lines of light reflected by the object and mirror of and collinearly images the reflected lines of light as an image line on to an imaging spectrometer (550) wherein mutual interference allows determination of the optical properties of the object at each point along the object line.Type: GrantFiled: August 7, 2015Date of Patent: July 17, 2018Assignee: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.Inventors: Yoel Arieli, Yoel Cohen
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Patent number: 10024783Abstract: An apparatus and method for determining optical properties of an object (50) includes a light source (10) and an optical system for illuminating at least one point of the object with light from the light source, and collecting light reflected from the object. A biaxial birefringent crystal (30) intercepts a beam of light reflected from the object and propagates the beam along an optical axis of the crystal and transforms the beam of reflected light to a ring of light having a periphery, each point of which has a different polarization plane. A detector array (40) detects respective points along the periphery of the ring and a processing unit (45) is coupled to the detector and is responsive to signals thereby for determining optical properties of the object.Type: GrantFiled: January 22, 2015Date of Patent: July 17, 2018Assignee: ADOM, Advanced Optical Technologies Ltd.Inventors: Yoel Arieli, Yoel Cohen
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Patent number: 9833139Abstract: Apparatus and methods are described for performing structure measurement on a tear film of an eye of a subject. At least a portion of a surface of the tear film is illuminated using a broadband light source. A spectrum of light of the broadband light that is reflected from at least one point of the tear film is measured, using a spectrometer. Color information for a plurality of points of the tear film is obtained, by imaging a field of view of the tear film using a color camera. Using a processing unit, data from the color camera and data from the spectrometer that are indicative of characteristics of the tear film are received, and based upon a combination of the data received from the color camera and the data received from the spectrometer, an output is generated that is indicative of a structure of the tear film.Type: GrantFiled: August 8, 2017Date of Patent: December 5, 2017Assignee: ADOM, Advanced Optical Technologies Ltd.Inventors: Yoel Arieli, Yoel Cohen, Shlomi Epstein, Dror Arbel, Ra'anan Gefen
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Patent number: 9757027Abstract: A system and method are described for performing tear film structure measurement. A broadband light source illuminates the tear film. A spectrometer measures respective spectra of reflected light from at least one point of the tear film. A color camera performs large field of view imaging of the tear film, so as to obtain color information for all points of the tear film imaged by the color camera. A processing unit calibrates the camera at the point measured by the spectrometer so that the color obtained by the camera at the point matches the color of the spectrometer at the same point. The processing unit determines, from the color of respective points of the calibrated camera, thicknesses of one or more layers of the tear film at the respective points. Other applications are also described.Type: GrantFiled: August 3, 2016Date of Patent: September 12, 2017Assignee: ADOM, Advanced Optical Technologies Ltd.Inventors: Yoel Arieli, Yoel Cohen, Shlomi Epstein, Dror Arbel, Ra'anan Gefen
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Patent number: 9696134Abstract: A system (10) for measuring a physical characteristic of an object (11) using dual path, two-dimensional Optical Coherence Tomography (OCT) includes an extended broadband light source (13) producing an incident light beam (14) and an interferometer (15) having a beam splitter (16) that splits the incident beam into first and second component (17, 18) beams and directs the second component beam (18) on to a moveable mirror (19) for creating an optical path difference between the first component beam (17) and a reflection (20) of the second component beam. A focusing lens (21) having a focal plane (22) focuses the first component beam and the reflection of the second component beam to form a fringe pattern (23) on the focal plane, and a configurable imaging system (25) images the fringe pattern on to a plane (12) of the object to allow two-dimensional measurement of the object without spatial scanning.Type: GrantFiled: July 28, 2013Date of Patent: July 4, 2017Assignee: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.Inventors: Yoel Arieli, Yosef Weitzman