Patents Assigned to Advanced Measurement Systems
  • Patent number: 8319979
    Abstract: A single laser beam measurement system employing retro-reflective striped targets is disclosed having an error correction mechanism which compensates for errors arising from the target not being square to a laser scanning beam.
    Type: Grant
    Filed: October 26, 2010
    Date of Patent: November 27, 2012
    Assignee: Advanced Measurement Systems
    Inventors: Mike Hanchett, James Hartl