Patents Assigned to Advanced Metrological Development
  • Patent number: 5426861
    Abstract: Accurate measurements of production parts are obtained from a system which includes a first measuring apparatus in a laboratory, and a second measuring apparatus which is in a non-laboratory environment where it is subjected to greater temperature fluctuations than in the laboratory. A reference part of substantially the same size and shape as the production parts is inspected by both measuring apparatuses, and the production part is inspected by the second measuring apparatus. While being inspected, both parts occupy substantially the same location on the second measuring apparatus. Results of these inspections are processed by a computer to provide (1) target values which the shop machine would perceive when inspecting a perfect part as specified by the part drawings, or (2) values which indicate what the laboratory machine would perceive for the production part.
    Type: Grant
    Filed: April 19, 1993
    Date of Patent: June 27, 1995
    Assignee: Advanced Metrological Development
    Inventor: Russell S. Shelton