Patents Assigned to Advanced Monitors Corp.
  • Patent number: 6751497
    Abstract: An infrared (IR) thermometer for performing temperature measurement of an object without having contact with the object. The IR thermometer comprises at least one IR sensing element which, upon exposure to IR radiation, produces a response. The IR sensing element comprises a flat themistor flake supported by a substrate. The IR thermometer further comprises a processing circuit which analyzes the response to predict the steady-state response of the at least one IR sensing element and temperature of the object. In one embodiment, the processing circuit may obtain two or more responses separated by a predetermined period of time to predict temperature of the object. The processing circuit may also associate reference data in its prediction algorithm.
    Type: Grant
    Filed: March 14, 2002
    Date of Patent: June 15, 2004
    Assignee: Advanced Monitors Corp.
    Inventor: Jacob Fraden
  • Patent number: 6447160
    Abstract: A blackbody cavity having two types of wall surfaces wherein a first type has high emissivity and a second type has low emissivity. The low emissivity wall surface has an aperture from where the infrared radiation escapes the cavity, and is preferably shaped to minimize the escape through the aperture of radiation emanated directly from the low emissivity wall itself. The combination of high and low emissivity wall surfaces allows the blackbody to reduce the influence of the environmental temperature while maintaining emissivity approaching unity.
    Type: Grant
    Filed: October 17, 2001
    Date of Patent: September 10, 2002
    Assignee: Advanced Monitors Corp.
    Inventor: Jacob Fraden
  • Publication number: 20020123690
    Abstract: An infrared (IR) thermometer for performing temperature measurement of an object without having contact with the object. The IR thermometer comprises at least one IR sensing element which, upon exposure to IR radiation, produces a response. The IR sensing element comprises a flat themistor flake supported by a substrate. The IR thermometer further comprises a processing circuit which analyzes the response to predict the steady-state response of the at least one IR sensing element and temperature of the object. In one embodiment, the processing circuit may obtain two or more responses separated by a predetermined period of time to predict temperature of the object. The processing circuit may also associate reference data in its prediction algorithm.
    Type: Application
    Filed: March 14, 2002
    Publication date: September 5, 2002
    Applicant: Advanced Monitors Corp.
    Inventor: Jacob Fraden
  • Publication number: 20020021739
    Abstract: A blackbody cavity having two types of wall surfaces wherein a first type has high emissivity and a second type has low emissivity. The low emissivity wall surface has an aperture from where the infrared radiation escapes the cavity, and is preferably shaped to minimize the escape through the aperture of radiation emanated directly from the low emissivity wall itself. The combination of high and low emissivity wall surfaces allows the blackbody to reduce the influence of the environmental temperature while maintaining emissivity approaching unity.
    Type: Application
    Filed: October 17, 2001
    Publication date: February 21, 2002
    Applicant: Advanced Monitors Corp.
    Inventor: Jacob Fraden
  • Patent number: 6347243
    Abstract: A probe cover for infrared (IR) thermometers having two distinct portions, one which is stable, and the other that may change. The optical portion of the cover is precisely pre-shaped. This portion engages with the end of the IR probe and remains unchanged during the installation and temperature measurement. The remainder of the cover may freely change its shape and conform to the probe body configuration for easy installation.
    Type: Grant
    Filed: March 5, 1998
    Date of Patent: February 12, 2002
    Assignee: Advanced Monitors Corp.
    Inventor: Jacob Fraden
  • Patent number: 6129673
    Abstract: An infrared (IR) thermometer for performing temperature measurement of an object without having contact with the object. The IR thermometer comprises at least one IR sensing element which, upon exposure to IR radiation, produces a response. The IR sensing element comprises a flat thermistor flake supported by a substrate. The IR thermometer further comprises a processing circuit which analyzes the response to predict the steady-state response of the at least one IR sensing element and temperature of the object. In one embodiment, the processing circuit may obtain two or more responses separated by a predetermined period of time to predict temperature of the object. The processing circuit may also associate reference data in its prediction algorithm.
    Type: Grant
    Filed: June 8, 1998
    Date of Patent: October 10, 2000
    Assignee: Advanced Monitors, Corp.
    Inventor: Jacob Fraden