Abstract: Non-volatile memory devices utilizing polarizable ferroelectric-semiconductor materials as the floating gate in floating-gate field-effect metal oxide transistors are described. Such materials can be annealed at temperatures less than 450° C., and fields below about 250 kV/cm can be used for changing polarization of the ferroelectric semiconductor materials, leading to devices capable of high endurance (>1010 cycles).
Type:
Application
Filed:
December 21, 2021
Publication date:
June 23, 2022
Applicant:
Advanced Nanoscale Devices
Inventors:
Carlos A. Paz de Araujo, Jolanta B. Celinska, Christopher R. McWilliams, Jason E. Nobles