Abstract: A method for communicating test information from a source to a destination is disclosed. The method includes providing a modular test system, where the modular test system comprises a system controller for controlling at least one site controller, the at least one site controller for controlling at least one test module. The method further includes providing a datalog framework for supporting extension of user-defined datalog formats, providing support classes for supporting user-initiated datalog events, receiving a datalog event requesting for communicating input test information from the source to the destination, configuring output test information based upon the destination, the datalog framework and the support classes, and transferring the output test information to the destination.

Abstract: A method for simulating a modular test system is disclosed. The method includes providing a controller, where the controller controls at least one vendor module and its corresponding device under test (DUT) model, creating a simulation framework for establishing standard interfaces between the at least one vendor module and its corresponding DUT model, configuring the simulation framework, and simulating the modular test system using the simulation framework.

Abstract: A method for managing a pattern object file in a modular test system is disclosed. The method includes providing a modular test system, where the modular test system comprises a system controller for controlling at least one site controller, and where the at least one site controller controls at least one test module and its corresponding device under test (DUT). The method further includes creating an object file management framework for establishing a standard interface between vendor-supplied pattern compilers and the modular test system, receiving a pattern source file, creating a pattern object metafile based on the pattern source file using the object file management framework, and testing the device under test through the test module using the pattern object metafile.

Abstract: A method for developing a test program for a semiconductor test system is disclosed. The method includes describing a test plan file in a test program language (TPL), where the test plan file describes at least one test of the test program, describing a test class file in a system program language (SPL) and a corresponding pre-header file of the test class file in the TPL, where the test class file describes an implementation of the at least one test of the test program, and generating the test program using the test plan file, the test class file, and the pre-header file.

Abstract: A method for integrating test modules in a modular test system includes creating component categories for integrating vendor-supplied test modules and creating a calibration and diagnostics (C&D) framework for establishing a standard interface between the vendor-supplied test modules and the modular test system, where the C&D framework comprises interface classes communicating vendor-supplied module integration information. The method further includes receiving a vendor-supplied test module, retrieving module integration information from the vendor-supplied test module in accordance with the component categories, and integrating the vendor-supplied test module into the modular test system based on the module integration information using the C&D framework.

Abstract: A method for integrating test modules in a modular test system is disclosed. The method includes controlling at least one test module and its corresponding device under test (DUT) with a controller, establishing a standard module control interface between a vendor-supplied test module and the modular test system with a module control framework, installing the vendor-supplied test module and a corresponding vendor-supplied control software module, where the vendor-supplied control software module is organized into a plurality of vendor-supplied module control components, configuring the modular test system based on the module control framework and the plurality of vendor-supplied module control components, and accessing the vendor-supplied test module in accordance with the plurality of vendor-supplied module control components using the module control framework.

Abstract: Method and system for associating software components with vendor hardware module versions in an open architecture test system are disclosed. The method includes receiving a set of hardware versions of a vendor hardware module, receiving a set of software components supported by the vendor hardware module, processing the set of hardware versions, where the set of hardware versions is represented as an equivalence class of hardware version numbers using a mask value, obtaining user choices of hardware versions of the vendor hardware module, validating the user choices of hardware versions of the vendor hardware module, and creating a system profile in accordance with the user choices of hardware versions.

Abstract: A method for communicating test information from a source to a destination is disclosed. The method includes providing a modular test system, where the modular test system comprises a system controller for controlling at least one site controller, the at least one site controller for controlling at least one test module. The method further includes providing a datalog framework for supporting extension of user-defined datalog formats, providing support classes for supporting user-initiated datalog events, receiving a datalog event requesting for communicating input test information from the source to the destination, configuring output test information based upon the destination, the datalog framework and the support classes, and transferring the output test information to the destination.

Abstract: A method for simulating a modular test system is disclosed. The method includes providing a controller, where the controller controls at least one vendor module and its corresponding device under test (DUT) model, creating a simulation framework for establishing standard interfaces between the at least one vendor module and its corresponding DUT model, configuring the simulation framework, and simulating the modular test system using the simulation framework.

Abstract: A method for integrating test modules in a modular test system includes creating component categories for integrating vendor-supplied test modules and creating a calibration and diagnostics (C&D) framework for establishing a standard interface between the vendor-supplied test modules and the modular test system, where the C&D framework comprises interface classes communicating vendor-supplied module integration information. The method further includes receiving a vendor-supplied test module, retrieving module integration information from the vendor-supplied test module in accordance with the component categories, and integrating the vendor-supplied test module into the modular test system based on the module integration information using the C&D framework.

Abstract: A method for managing a pattern object file in a modular test system is disclosed. The method includes providing a modular test system, where the modular test system comprises a system controller for controlling at least one site controller, and where the at least one site controller controls at least one test module and its corresponding device under test (DUT). The method further includes creating an object file management framework for establishing a standard interface between vendor-supplied pattern compilers and the modular test system, receiving a pattern source file, creating a pattern object metafile based on the pattern source file using the object file management framework, and testing the device under test through the test module using the pattern object metafile.