Patents Assigned to Advantest Corporatin
  • Probe card for IC testing apparatus
    Patent number: 6292005
    Abstract: A probe card 2 for an IC testing apparatus electrically connected to a test head board 11 of the IC testing apparatus and having a plurality of needle contacts 211 provided on a main surface for electrical contact with a device under test, wherein a plurality of zero insertion force connectors electrically connected to the needle contacts are provided at substantially radial positions from the position where the needle contacts are provided.
    Type: Grant
    Filed: July 7, 1999
    Date of Patent: September 18, 2001
    Assignee: Advantest Corporatin
    Inventor: Kazunari Suga