Abstract: A semiconductor memory device may include an intergate dielectric layer of a high-K dielectric material interposed between a floating gate and a control gate. With this intergate high-K dielectric in place, the memory device may be erased using Fowler-Nordheim tunneling.
Type:
Grant
Filed:
August 4, 2005
Date of Patent:
November 4, 2008
Assignees:
Spansion, LLC, Advnaced Micro Devices, Inc.
Inventors:
Takashi Whitney Orimoto, Joong Jeon, Hidehiko Shiraiwa, Simon S. Chan, Harpreet K. Sachar