Patents Assigned to Aegis Analytical Corporation
  • Patent number: 9275367
    Abstract: Described is the display on a visual display device of one or more first visual indicators that indicate that one or more first process parameters of a process are critical process parameters. The critical process parameters are displayed on the visual display device as part of a hierarchical data structure.
    Type: Grant
    Filed: May 4, 2012
    Date of Patent: March 1, 2016
    Assignee: AEGIS ANALYTICAL CORPORATION
    Inventor: Justin Neway
  • Publication number: 20120281012
    Abstract: Described is the display on a visual display device of one or more first visual indicators that indicate that one or more first process parameters of a process are critical process parameters.
    Type: Application
    Filed: May 4, 2012
    Publication date: November 8, 2012
    Applicant: AEGIS ANALYTICAL CORPORATION
    Inventor: Justin Neway
  • Patent number: 6741998
    Abstract: The present invention provides a method for analyzing a process based on displaying data to a user from a plurality of different sources and a machine-readable medium for implementing such a method. The present invention also provides a mapping system and a method for displaying data to a user employing a hierarchy including data nodes and data leaves.
    Type: Grant
    Filed: January 30, 2003
    Date of Patent: May 25, 2004
    Assignee: Aegis Analytical Corporation
    Inventors: Joseph D. Ruth, Susan A. Dorr, Jeffrey A. Junak, Olivier Libouban, Justin A. Neway
  • Patent number: 6725230
    Abstract: The present invention provides a method for analyzing a process based on displaying data to a user from a plurality of different sources and a machine-readable medium for implementing such a method. The present invention also provides a mapping system and a method for displaying data to a user employing a hierarchy including data nodes and data leaves.
    Type: Grant
    Filed: March 26, 2001
    Date of Patent: April 20, 2004
    Assignee: Aegis Analytical Corporation
    Inventors: Joseph D. Ruth, Susan A. Dorr, Nick Galemmo, Jeffrey A. Junak, Olivier Libouban, Justin A. Neway
  • Patent number: 6243615
    Abstract: A method for displaying a visual process signature for ready visual recognition and communication of otherwise complex manufacturing process information. Process data may be stored in a plurality of data stores, each data store holding a plurality of records containing process data, each record associated with at least one process component. A proxy virtual database is created from copies of records selected from the data stores. Statistical analysis operations are applied to the selected records within the proxy virtual database to identify process components or combinations of process components having a significant effect on characteristics of a product produced as well as the magnitude of that effect. At least three characteristics of the identified process components including the outcome of the statistical analysis operations are selected and visually displayed in a static or animated three-dimensional representation shown on a two-dimensional display.
    Type: Grant
    Filed: September 9, 1999
    Date of Patent: June 5, 2001
    Assignee: Aegis Analytical Corporation
    Inventors: Justin O. Neway, Steven L. Durfee, Gretchen L. Jahn