Patents Assigned to Affymetrix Technologies, N.V.
  • Patent number: 6252236
    Abstract: A method and apparatus for imaging a sample are provided. An electromagnetic radiation source generates excitation radiation which is sized by excitation optics to a line. The line is directed at a sample resting on a support and excites a plurality of regions on the sample. Collection optics collect response radiation reflected from the sample I and image the reflected radiation. A detector senses the reflected radiation and is positioned to permit discrimination between radiation reflected from a certain focal plane in the sample and certain other planes within the sample.
    Type: Grant
    Filed: July 6, 1999
    Date of Patent: June 26, 2001
    Assignee: Affymetrix Technologies, N.V.
    Inventors: Mark Trulson, David Stern, Peter Fiekowsky, Richard Rava, Ian Walton, Stephen P. A. Fodor