Patents Assigned to AFI Corporation
  • Patent number: 10876974
    Abstract: An inspection device (1) inspects an amount of dielectric particles contained in a sample liquid. The inspection device includes a dielectric collection unit (3), a pump unit (10) and an AC voltage supply unit (11). The dielectric collection unit includes at least one pair of electrodes (41, 42) and a flow channel (13) extending in a predetermined direction on the pair of electrodes. The pump unit is configured to feed the sample liquid to follow the flow channel in the predetermined direction. The AC voltage supply unit is configured to supply, to the pair of electrodes, an AC voltage with a predetermined frequency to cause dielectrophoresis for dielectric particles in the fed sample liquid. The dielectric collection unit includes a plurality of slit regions (Rs) aligned in the predetermined direction between the pair of electrodes. Each of the plurality of slit regions is separated from each other within the flow channel.
    Type: Grant
    Filed: October 30, 2019
    Date of Patent: December 29, 2020
    Assignee: AFI CORPORATION
    Inventors: Takaharu Enjoji, Yoshikazu Wakizaka, Satoshi Uchida, Eiko Kato, Masayo Takano
  • Patent number: 10766040
    Abstract: An analysis device (200) analyzes a crossover frequency at which a dielectrophoretic force on dielectric particles switches from a repulsive force to an attractive force or from the attractive force to the repulsive force, comprising a flow channel (5), a pair of electrodes (22, 23), a power supply (24), an imaging unit (25) and an analyzer (26). Through the flow channel (5), a sample solution containing the dielectric particles in the dielectrophoretic liquid flows. The pair of electrodes (22, 23) are arranged in the first channel. The power supply (24) applies a frequency-modulated AC voltage to the first electrodes (22, 23). The imaging unit (25) captures an image of a movement trajectory of each of the dielectric particles flowing between the electrodes (22, 23) in the flow channel. The analyzer (26) obtains the crossover frequency of the dielectric particles based on the captured image of the movement trajectory.
    Type: Grant
    Filed: January 27, 2017
    Date of Patent: September 8, 2020
    Assignee: AFI CORPORATION
    Inventors: Yoshikazu Wakizaka, Masayo Takano, Takayuki Itoi, Takaharu Enjoji, Masakazu Toi, Tomomi Nishimura
  • Patent number: 10495580
    Abstract: An inspection device (1) inspects an amount of dielectric particles contained in a sample liquid. The inspection device includes a dielectric collection unit (3), a pump unit (10) and an AC voltage supply unit (11). The dielectric collection unit includes at least one pair of electrodes (41, 42) and a flow channel (13) extending in a predetermined direction on the pair of electrodes. The pump unit is configured to feed the sample liquid to follow the flow channel in the predetermined direction. The AC voltage supply unit is configured to supply, to the pair of electrodes, an AC voltage with a predetermined frequency to cause dielectrophoresis for dielectric particles in the fed sample liquid. The dielectric collection unit includes a plurality of slit regions (Rs) aligned in the predetermined direction between the pair of electrodes. Each of the plurality of slit regions is separated from each other within the flow channel.
    Type: Grant
    Filed: October 5, 2016
    Date of Patent: December 3, 2019
    Assignee: AFI Corporation
    Inventors: Takaharu Enjoji, Yoshikazu Wakizaka, Satoshi Uchida, Eiko Kato, Masayo Takano