Abstract: The invention relates to a device for three-dimensionally measuring an object, comprising a first projection device having a first infrared light source for projecting a displaceable first pattern onto the object, and at least one image capturing device for capturing images of the object in an infrared spectral range. The invention further relates to a method for three-dimensionally measuring an object, comprising the steps of projecting a first infrared pattern onto the object using a first projection device having a first infrared light source; and capturing images of the object using at least one image capturing device sensitive to infrared radiation, wherein the pattern is shifted between image captures.