Abstract: A semiconductor die includes a processing circuit, a first bond pad, and a second bond pad. The first bond pad is electrically connected to a first node of the processing circuit and a first bond wire. The second bond pad is electrically connected to a second node of the processing circuit and a second bond wire. The first bond wire and the second bond wire are magnetically coupled to form a first bond wire T-coil circuit with equivalent negative inductance.

Abstract: A dummy signal generation circuit includes a consecutive identical digit (CID) detection circuit and a dummy transition circuit. The CID detection circuit detects occurrence of N CIDs in serial data, and sets a transition enable window in response to each sequence of N CIDs in the serial data, where N is a positive integer not smaller than 3. The dummy transition circuit generates a dummy signal that has transitions constrained to occur within transition enable windows set by the CID detection circuit.

Abstract: A semiconductor package includes a printed circuit board (PCB), a semiconductor device, an interposer, and a conductive adhesive. The PCB has a top surface with at least one ground area formed thereon. The semiconductor device has a bottom surface with at least one first first-type contact formed thereon. The interposer is located between the semiconductor device and the PCB. The bottom surface of the semiconductor device is adhered to a top surface of the interposer by the conductive adhesive. The conductive adhesive overflows from an edge of the top surface of the interposer to have contact with the at least one ground area on the top surface of the PCB.