Abstract: The present invention relates to an embedded device testing method. Preferably, the present invention relates to a function testing method for an embedded device designed to execute a specific function. The embedded device testing method having a hierarchical host structure executed on a computing device according to the present invention includes: receiving, by a main host, setting information for an execution environment of a target device; constructing a virtualized execution environment on a sub host according to the setting information; executing specific software or a specific test case in the constructed execution environment; and monitoring a result of the execution. According to the present invention, resources may be utilized efficiently because there is no need to newly configure and prepare physical hardware resources every time during the development and testing of an embedded device.