Patents Assigned to AIXTRON
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Patent number: 7056388Abstract: A reaction chamber for carrying out substrate coating methods is disclosed, having at least one opening in at least one outer wall in which an HF feedthrough is inserted in a pressure or vacuum tight manner. The reaction chamber is further characterized by a combination of the following features: a support plate with coolant channels, and at least one opening for an HF line; an HF line collar in the zone disposed in the reaction chamber, a first seal on the collar; a first disc from an insulating material between a second seal on the support plate and the first seal on the collar; a thread in the zone outside the reaction chamber, a screw element being screwed onto the thread, all configured to prevent an electrical contact between the HF line and the support plate being established or an arc-over between the HF line and the support plate occurring.Type: GrantFiled: October 11, 2002Date of Patent: June 6, 2006Assignee: Aixtron AGInventors: Walter Franken, Gerd Strauch, Johannes Kappeler, Holger Jurgensen
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Patent number: 7048802Abstract: The invention relates to a device for depositing especially crystalline layers on especially crystalline substrates by means of reaction gases fed to a heated process chamber. Said process chamber is formed by the cavity of an especially multi-part graphite tube arranged in a reactor housing that especially comprises quartz walls. Said reactor housing, in the area of the process chamber, is enclosed by a high-frequency coil and the space between the reactor housing wall and the graphite tube is filled with a graphite foam sleeve. In order to improve heat insulation, the graphite foam sleeve is fully slit. The slot is wider than the maximum thermal elongation of the graphite foam sleeve in the peripheral direction to be expected when the device is heated up to process temperature.Type: GrantFiled: May 7, 2003Date of Patent: May 23, 2006Assignee: Aixtron AGInventors: Johannes Kaeppeler, Frank Wischmeyer, Rune Berge
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Patent number: 7033921Abstract: The invention relates to a method and device for depositing several crystalline semiconductor layers on at least one semiconductor crystalline substrate. According to said method, gaseous parent substances are introduced into a process chamber of a reactor by means of a gas inlet organ, said substances accumulating, optionally after a chemical gas phase and/or surface reaction, on the surface of a semiconductor substrate that is placed on a substrate holder in the process chamber, thus forming the semiconductor layer. Said semiconductor layer and the semiconductor substrate form a crystal consisting of either one or several elements from main group V, elements from main groups III and V, or elements from main groups II and VI.Type: GrantFiled: June 21, 2004Date of Patent: April 25, 2006Assignee: Aixtron AGInventor: Holger Jurgensen
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Method and device for the temperature control of surface temperatures of substrates in a CVD reactor
Patent number: 6983620Abstract: The invention relates to a method for controlling the surface temperatures of substrates arranged on substrate supports borne by a substrate support carrier on dynamic gas cushions in a processing chamber of a CVD-reactor. The aim of the invention is to reduce or adjust the temperature variations. According to the invention, an average surface temperature value is calculated, being measured in a particularly optical manner, and the level of the gas cushions is regulated by varying the individually controlled gas flow producing the gas cushions in such a way that the variations of the measured surface temperatures in relation to the average value lies within a predetermined temperature window.Type: GrantFiled: February 4, 2005Date of Patent: January 10, 2006Assignee: Aixtron AGInventor: Johannes Kaeppeler -
Patent number: 6972050Abstract: The invention relates to a method for depositing especially, crystalline layers onto especially, crystalline substrates, in a process chamber of a CVD reactor. At least one first and one second reaction gas are each led into a gas outlet area in an input area of the process chamber, by means of separate delivery lines. The gas outlet areas lie one above the other between the floor of the process chamber and the cover of the process chamber and have different heights. The first reaction gas flows out of the gas outlet area that is situated next to the process chamber floor, optionally together with a carrier gas. A carrier gas is added at least to the second reaction gas, which flows out of the gas outlet area lying further away from the process chamber floor.Type: GrantFiled: May 15, 2003Date of Patent: December 6, 2005Assignee: Aixtron AGInventors: Michael Bremser, Martin Dauelsberg, Gerhard Karl Strauch
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Patent number: 6964876Abstract: The invention relates to a device comprising a process chamber which is arranged in a reaction housing and which can be heated especially by supplying heat to a substrate holder, comprising a gas inlet for the admission of gaseous starting material, whereby the decomposition products thereof are deposited on a substrate maintained by a substrate holder to form a layer, also comprising at least one sensor acting upon the inside of the process chamber for determining layer properties further comprising an electronic control unit for controlling the heating of the process chamber, mass controllers for controlling the flow of the starting materials and a pump for controlling the pressure of the process chamber, characterized in that the electronic control unit forms modified process parameters from deviation values obtained upon growth of the calibrating layer with the aid of stored calibrating parameters, thereby controlling the heating of the process chamber, the flow controllers and the pump upon growth of theType: GrantFiled: November 17, 2003Date of Patent: November 15, 2005Assignee: Aixtron AGInventor: Michael Heuken
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Patent number: 6962624Abstract: The invention relates to a method and a device for depositing especially, organic layers. In a heated reactor, a non-gaseous starting material that is stored in a source in the form of a container is transported from said source to a substrate by a carrier gas in gaseous form and is deposited on said substrate. The rate of production of the gaseous starting material by the source is unpredictable due to a heat input that cannot be regulated in a reproducible manner and due to cooling resulting from the carrier gas. The invention therefore provides that the preheated carrier gas washes through the starting material from bottom to top, the starting material being kept essentially isothermal in relation to the carrier gas by the heated container walls.Type: GrantFiled: March 28, 2003Date of Patent: November 8, 2005Assignee: Aixtron AGInventors: Holger Jürgensen, Gerhard Karl Strauch, Markus Schwambera
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Patent number: 6932866Abstract: The invention relates to a method and a device for depositing especially crystalline layers on especially crystalline substrates in a process chamber of a reactor housing having a water-cooled wall. The floor of said process chamber is heated. At least one reaction gas as a process gas, and hydrogen as a carrier gas, are centrally introduced into the process chamber, and are extracted by a gas evacuation ring surrounding the process chamber. A flush gas flows between the cover of the reactor and the cover of the process chamber. Said flush gas and the flush gas which flushes the area between the reactor wall and the gas evacuation ring are introduced into the outer region of the process chamber, via a gap between the cover of the reactor and the gas evacuation ring which can be lowered for loading the process chamber, in order to be sucked through the openings in the gas evacuation ring with the process gas.Type: GrantFiled: June 23, 2003Date of Patent: August 23, 2005Assignee: Aixtron AGInventor: Martin Dauelsberg
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Patent number: 6908838Abstract: The invention relates to a method and to a device for treating semiconductor substrates. In conventional systems, the especially uncoated semiconductor substrates are fed to a treatment device through a charging sluice, said charging sluice adjoining a transfer chamber. A plurality of treatment chambers can be charged with the semiconductor substrates to be treated from said transfer chamber by first evacuating the transfer chamber and the treatment chamber and then opening the connecting door between the transfer chamber and the treatment chamber. The aim of the invention is to improve this system. To this end, at least one of the treatment chambers is operated at a low pressure or atmospheric pressure and the transfer chamber is flooded with an inert gas before the connecting door associated with the treatment chamber is opened, while a predetermined pressure difference between the transfer chamber and the treatment chamber is maintained.Type: GrantFiled: June 23, 2003Date of Patent: June 21, 2005Assignee: Aixtron AGInventor: Piotr Strzyzewski
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Patent number: 6905548Abstract: The invention relates to a device for the deposition of in particular, crystalline layers on one or several, in particular, equally crystalline substrates, comprising a process chamber, arranged in a reactor housing, which may be charged with the substrates from above, by a reactor housing opening which may be sealed by a cover. The reactor housing opening opens out into a glove box, in particular flushed with highly pure gas and connects electricity, liquid or gas supply lines to the cover. According to the invention, the connection of supply lines for electricity, fluid or gas sources arranged outside the glove box to the cover of the reactor housing arranged within the glove box may be improved, whereby the electricity, fluid or gas supply lines run freely, from outside the glove box, through a flexible tube which is sealed atone end to a flange arrangement rigidly fixed to the cover and sealed at the other end to an opening in the glove box wall.Type: GrantFiled: March 3, 2003Date of Patent: June 14, 2005Assignee: Aixtron AGInventors: Holger Jürgensen, Gerhard Karl Strauch, Johannes Käppeler
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Patent number: 6899764Abstract: A chemical vapor deposition reactor having a process chamber accommodating a substrate holder for wafers, a first gas flow of reactive gases to process the wafers and a crown-shaped gas-collector surrounding the substrate-holder, wherein said reactor further comprises: a base plate and a cover plate disposed respectively beneath and above the substrate-holder, an outer ring surrounding the gas-collector and touching both the base plate and the cover-plate, and a second flow of non-reactive gases propagating in spaces outside the process chamber limited by the base and cover plates and the outer ring, and said second flow acting as a counter-flow for preventing the first reactive gas flow to exit from the process chamber but through the gas-collector.Type: GrantFiled: June 19, 2002Date of Patent: May 31, 2005Assignee: Aixtron AGInventor: Peter Frijlink
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Method and device for the temperature control of surface temperatures of substrates in a CVD reactor
Patent number: 6878395Abstract: The invention relates to a method for controlling the surface temperatures of substrates arranged on substrate supports borne by a substrate support carrier on dynamic gas cushions in a processing chamber of a CVD-reactor. The aim of the invention is to reduce or adjust the temperature variations. According to the invention, an average surface temperature value is calculated, being measured in a particularly optical manner, and the level of the gas cushions is regulated by varying the individually controlled gas flow producing the gas cushions in such a way that the variations of the measured surface temperatures in relation to the average value lies within a predetermined temperature window.Type: GrantFiled: May 12, 2003Date of Patent: April 12, 2005Assignee: Aixtron AG,Inventor: Johannes Kaeppeler -
Patent number: 6849241Abstract: The invention relates to a device and method for depositing one or more layers onto at least one substrate placed inside a reaction chamber. The layers are deposited while using a liquid or solid starting material for one of the reaction gases utilized, which are fed via a gas admission unit to the reaction chamber where they condense or epitaxially grow on the substrate. The gas admission unit comprises a multitude of buffer volumes in which the reaction gasses enter separate of one another, and exit through closely arranged outlet openings while also being spatially separate of one another. The temperature of reaction gases is moderated while passing through the gas admission unit.Type: GrantFiled: August 1, 2002Date of Patent: February 1, 2005Assignee: Aixtron AG.Inventors: Martin Dauelsberg, Marcus Schumacher, Holger Juergensen, Gerd Strauch, Piotr Strzyzewski
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Patent number: 6811614Abstract: The invention relates to a device for depositing layers, particularly crystalline layers, onto substrates. Said device comprises a process chamber arranged in a reactor housing where the floor thereof, comprises at least one substrate holder which is rotatably driven by a gas flow flowing in a feed pipe associated with said floor. Said substrate holder is disposed in a bearing cavity on a gas cushion and held in place thereby. The aim of the invention is to technologically improve the design of a substrate holder which is rotatably mounted in a gas flow, particularly in a linear cross-flowing process chamber. Said bearing cavity is associated with a tray-shaped element arranged below the outflow of the feed pipe.Type: GrantFiled: May 8, 2003Date of Patent: November 2, 2004Assignee: Aixtron AGInventors: Johannes Käppeler, Frank Wischmeyer, Rune Berge
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Patent number: 6786973Abstract: The invention relates to a method and to a device for carrying out the method for depositing, in particular, crystalline layers on substrates that are also, in particular, crystalline. According to the invention, at least two process gases are introduced separate from one another into a process chamber of a reactor, whereby the first process gas flows through a central line having a central outlet opening, and the second process gas flows through a line, which is peripheral thereto and which has a peripheral outlet opening. The second process gas flows through one or more supply lines and into a mixing chamber and flows through additional means, which influence the gas stream and which are provided for homogenizing the radial flow profile of the process gas exiting the peripheral outlet opening. The aim of the invention is to obtain a homogeneous radial flow profile by using simple means.Type: GrantFiled: March 24, 2003Date of Patent: September 7, 2004Assignee: Aixtron AGInventors: Gerd Strauch, Markus Reinhold
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Patent number: 6506450Abstract: A reactor for coating flat substrates and particularly wafers is described which has a reaction vessel into which reaction gases can be introduced, and a substrate holder unit in which substrates are held in a holder such that the main surface of the substrates to be coated is oriented downward during the deposition operation and is aligned essentially in parallel to the flow direction of the reaction gases. The invention is characterized in that at least two spaces for substrates are provided on the substrate holder unit and in that the holder or holders is/are constructed in the manner of a template which has openings for the surfaces of the substrates to be coated.Type: GrantFiled: May 30, 2001Date of Patent: January 14, 2003Assignee: Aixtron AGInventors: Holger Jürgensen, Karl Heinz Bachem
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Patent number: 6475286Abstract: The invention relates to seal means (I, TR) for sealing two substantially flat closing surfaces (9a,7a), respectively of two separable elements (9,7), for forming a boundary between a first space (101) and a second space (102), in order to prevent a first gas flow (&PHgr;1) propagating in the first space to exit through an interface (I) between said two closing surfaces disposed one opposite to the other for sealing, comprising the construction of a set of troughs (TR) in at least one of the closing surfaces (9), carried out throughout the length (L) of said boundary in the direction of said first flow, and comprising a counter-flow (&PHgr;2), propagating from the second space (102) through said troughs, which have construction parameters including a width (w), a depth (h) and a separating width (W), determined in combination with the height (H) of the interface (I) and said length (L) of the boundary, for preventing the first flow (&PHgr;1) to exit through the interface (I) along the troughs (TR) and along tType: GrantFiled: July 12, 2000Date of Patent: November 5, 2002Assignee: Aixtron AktiengesellschaftInventor: Peter Frijlink
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Patent number: 6309465Abstract: A CVD reactor comprising: a reactor casing with a casing cover, a heated susceptor for one wafer or several wafers, which is disposed in the reactor casing, a fluid inlet unit including a plurality of openings facing said wafer or wafers through which the CVD media, which is moderately heated, enter the reactor, and a fluid outlet disposed on the periphery of the reactor casing, through which the introduced media is discharged; wherein the fluid outlet has roughly the shape of a disk with a plurality of outlet openings for the discharge of CVD media, and is disposed between the susceptor and the reactor cover in such a way that the fluid outlet is heated by the susceptor by radiation and hence adjusts itself to a temperature between the temperature of the susceptor and the reactor cover through which the CVD media enter in a moderately heated state.Type: GrantFiled: November 18, 1999Date of Patent: October 30, 2001Assignee: Aixtron AG.Inventors: Holger Jürgensen, Marc Deschler, Gerd Strauch, Markus Schumacher, Johannes Käppeler
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Patent number: 6279506Abstract: A reactor for coating flat substrates and particularly wafers is described which has a reaction vessel into which reaction gases can be introduced, and a substrate holder unit in which substrates are held in a holder such that the main surface of the substrates to be coated is oriented downward during the deposition operation and is aligned essentially in parallel to the flow direction of the reaction gases. The invention is characterized in that at least two spaces for substrates are provided on the substrate holder unit and in that the holder or holders is/are constructed in the manner of a template which has openings for the surfaces of the substrates to be coated.Type: GrantFiled: July 3, 1997Date of Patent: August 28, 2001Assignee: Aixtron AGInventors: Holger Jürgensen, Karl Heinz Bachem
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Patent number: 6196251Abstract: Disclosed is a gas inlet device comprising a gas reservoir (5), which is connected via a supply line (11) via a supply flow restrictor (10) which can be closed by a supply valve 13). The gas can be supplied into the antechamber (5) via a control valve (6) and a control flow restrictor (4). As the control valve (6) and the supply valve (13) close the antechamber from the outside, there are only minimal fluctuations in pressure during switching. By this means the pressure in the antechamber (5) can be controlled precisely and the gas flow from the antechamber (5) into the supply line (11) can be set with great precision.Type: GrantFiled: May 4, 1998Date of Patent: March 6, 2001Assignee: AIXTRON Semiconductor Technologies GmbHInventor: Helmut Roehle