Abstract: A method and apparatus for automatically focussing a specimen image in an electron microscope. Excitation currents for an objective lens of the microscope are previously determined in accordance with predetermined magnifications in one-to-one correspondence. When one of the magnifications is selected, the objective lens is automatically excited with the current corresponding to the magnification, whereby the specimen image is automatically properly focussed.

Abstract: A specimen moving or manipulating apparatus for an electron beam apparatus which comprises a specimen holder extending slideably in the direction orthogonal to the electron beam axis and mounted on a lens column or barrel defining an electron beam path rotatably relative to the lens column in a plane orthogonal to the electron beam axis, and a lever mounted on the lens column at a position in the vicinity of the distal end of the specimen holder and extending in the direction intersecting the specimen holder, the lever being adapted to move slideably the specimen holder, and a coupling member interposed between the lever member and the specimen holder for rotatable engagement with both of them to thereby operatively coupling together the lever member and the specimen holder. The coupling member has a sharp apex edge and a bottom surface and is so disposed that the apex edge bears against a lateral side of the lever member while the bottom surface is rollingly engaged with the tip end of the specimen holder.