Patents Assigned to Albion Instruments, Inc.
  • Patent number: 5596404
    Abstract: A mechanism for aligning the elements of an optical system is disclosed. One aspect of the present invention is an alignment mechanism which includes lead screws placed on opposite corners of the elements to be aligned. The elements are provided with threaded holes of different pitch, and the lead screw is provided with threads of the same unequal pitches as the elements, thereby forming a differential lead screw. The threads include a locking thread which assures a positive lock between the lead screw and the elements to be aligned and eliminates backlash between them. Another aspect of the present invention is an interference fit mechanism which is provided by the employment of a slightly-oversized flexible boss which mates with a cavity. The boss is provided with a thin outer wall capable of flexing when the boss is inserted into the cavity. Yet another aspect of the present invention includes a wobble plate comprising a spherical socket and housing.
    Type: Grant
    Filed: December 30, 1994
    Date of Patent: January 21, 1997
    Assignee: Albion Instruments, Inc.
    Inventors: Kent F. Beck, Charles V. Owen
  • Patent number: 5521703
    Abstract: A method and apparatus for determining the composition and concentration of gases present in a gas sample by measurement of the spectrum of Raman scattered light from these gases. A diode laser illuminates the unknown gas which is contained inside a long hollow tube having a highly reflective interior wall. A laser line pass filter at an entrance aperture of the hollow tube prevents all wavelengths except specific wavelengths characteristic of the laser from entering the long hollow tube. The laser beam and Raman scattered light from the gas sample reflect inside the hollow tube from the highly reflective interior wall. A laser line rejection filter at an exit aperture of the hollow tube prevents the laser beam from exiting the hollow tube but transmits the Raman scattered light from the gas sample. A spectrograph detector or array of discrete filters and detectors detects the Raman scattered light.
    Type: Grant
    Filed: October 17, 1994
    Date of Patent: May 28, 1996
    Assignee: Albion Instruments, Inc.
    Inventor: John R. Mitchell
  • Patent number: 5452084
    Abstract: A Raman spectroscopy system and method for determining a zero-calibration level. A gas sample chamber is located within a resonant cavity. A light source is located to cause light to be incident on the gas sample, the light resonates in the resonant cavity. Typically, the light source and resonator cavity in conjunction form a laser source which propagates coherent, monochromatic laser light energy through the gas sample. This causes Raman scattering from the gases constituent in the gas sample. The amount of Raman scattered light is measured at detectors along with light due to dark noise inherent in the detectors and glow from the laser source, i.e., light at wavelengths other than the laser light wavelength produced by the laser source. The resonator cavity is obstructed, via a ball inserted into the path of the laser beam for example, to prevent resonance. If the light source and resonant cavity in conjunction form a laser, prevention of resonance causes cessation of lasing.
    Type: Grant
    Filed: March 29, 1993
    Date of Patent: September 19, 1995
    Assignee: Albion Instruments, Inc.
    Inventors: John Mitchell, Scott D. Miles, Donald E. Gregonis, Kent F. Beck