Patents Assigned to Alcatel Cables
  • Process for the characterization of an insulator and the corresponding electron microscope
    Patent number: 5635715
    Abstract: Process and apparatus for the characterization of an insulator (5) at breakdown with the aid of an electron microscope (1), in which the electron flow rate of the beam (3) is adjusted as a function of in particular backscattered, lost, secondary or absorbed electrons. An automatic controller (9) sensitive to certain sensors (10,12) is provided for this purpose. The electron flow rate is proportional to the voltage to be simulated in the insulator.
    Type: Grant
    Filed: June 18, 1996
    Date of Patent: June 3, 1997
    Assignees: A L'Energie Atomique, Alcatel Cables
    Inventors: Claude Le Gressus, Claude Faure, Daniel Acroute, Jose Bezille, Hakim Janah, Gerard Moya, Guy Blaise