Abstract: Electrostatic discharge protection device comprising a first highly p-doped region with a base contact, a first highly n-doped region with a collector contact, a second highly n-doped region with an emitter contact and located between the first highly p-doped region and the second highly n-doped region, the first highly p-doped region and the second highly n-doped region being applied in a weakly p-doped region which a has a lateral overlap extending towards the first highly n-doped region, the lateral overlap having a width, the first highly n-doped region being applied in a weakly n-doped region, the weakly p-doped region and the weakly n-doped region being applied in a more weakly n-doped region, and a highly n-doped buried layer located underneath the more weakly n-doped region and extending below at least a portion of the weakly n-doped region and at least a portion of the weakly p-doped region.
Type:
Grant
Filed:
April 25, 2002
Date of Patent:
March 16, 2004
Assignees:
Interuniversitair Microelektronica Centrum, Alcatel SA
Inventors:
Vincent De Heyn, Guido Groeseneken, Louis Vacaresse, Geert Gallopyn, Hugo Van Hove