Patents Assigned to Allstron Inc.
  • Patent number: 7977960
    Abstract: A cantilever type probe head, the head at least includes a probe having an introducing portion for contacting a pad of a member to be probed, the introducing portion is a conical column with its end face having a tapered portion and an extended rectangular portion, the tapered portion and the extended rectangular portion are provided in a coplanar position at the end face on the introducing portion.
    Type: Grant
    Filed: April 14, 2009
    Date of Patent: July 12, 2011
    Assignee: ALLSTRON Inc.
    Inventor: Shih-Ming Liu
  • Patent number: 7579850
    Abstract: A probe card and a method for assembling the same, the probe card has a base plate, a plurality of probes, a fixing ring, and a fixing member. The fixing ring is provided with a hole and the outer wall of its bottom is used for connecting the probes. The fixing ring is spaced from the probes in a distance so that when the fixing ring is inserted through a hole of the base plate, the terminal ends of main bodies of the probes are located under the hole while the anterior ends are electronically connected with the base plate or outer circuit. The fixing member is inserted through the hole of the fixing ring, the terminal end of which protrudes out of the hole so that a micro strip line is formed between the terminal end of the fixing member and the terminal ends of the probes.
    Type: Grant
    Filed: August 23, 2007
    Date of Patent: August 25, 2009
    Assignee: Allstron Inc.
    Inventor: Cheng-Yi Wang