Patents Assigned to AllTeq Industries
  • Patent number: 4774768
    Abstract: A coplanarity tester for surface mounted devices is disclosed. The coplanarity tester provides an electromechanical means and method for assuring the coplanarity of surface mounted devices to be within any given specification. The tester measures the coplanarity of a surface mounted device where the plane is defined by the three longest leads of that device. The present invention provides an indication of whether a surface mounted device has coplanarity within a predetermined thickness. The present invention can be utilized with any surface mounted device such as a gull-wing or j-bend type device.
    Type: Grant
    Filed: April 14, 1987
    Date of Patent: October 4, 1988
    Assignee: AllTeq Industries
    Inventor: Lawrence J. Chiponis