Patents Assigned to Alpha Innotech Corporation
  • Patent number: 6995901
    Abstract: A system for the optical analysis of a sample. An illumination source illuminates the sample, exciting fluorescence. The fluorescence is collected by an objective lens, which transmits the collected illumination light onto an imaging lens, which focuses the collected light onto an area array detector. Collected light rays between the objective lens and the imaging lens are parallel and pass through an emission filter. Both the objective lens and the imaging lens are positioned on a mount that allows an alternative objective or imaging lens to be positioned to collect or image the emitted light. Any objective lens/imaging lens pair is optically symmetrical, greatly reducing the optically degrading effects.
    Type: Grant
    Filed: January 15, 2004
    Date of Patent: February 7, 2006
    Assignee: Alpha Innotech Corporation
    Inventor: David M. Heffelfinger
  • Patent number: 6909459
    Abstract: The invention is a method and apparatus to extend the signal range of a digital image beyond the nominal sensor or data format range. The method and apparatus automatically acquires a scaled series of source data, applies noise reduction to the source data, and constructs a scaled composite with usable signal ranges greater than that of the individual data sources. Applied to digital images, the invention permits presentation and analysis of all signals from a subject in a single composite or an image resulting from the method and apparatus of the present invention. The present invention overcomes two defects in prior art systems: increased noise in the resultant composite image arising from rescaling of component images and dependence on evaluating image content to determine image scaling. Because this invention can be automated, it can be applied in numerous fields requiring high throughput.
    Type: Grant
    Filed: June 18, 2003
    Date of Patent: June 21, 2005
    Assignee: Alpha Innotech Corporation
    Inventors: Robert M. Watson, Jr., John J. Kang
  • Patent number: 6853454
    Abstract: A system for optical detection of kinetic samples. The system includes a dual set of detectors linked to a single processor. The time of signal integration is different for each detector, allowing one detector to have a higher sensitivity by integrating over a longer time period while the second detector using shorter integration periods is able to measure kinetic events.
    Type: Grant
    Filed: January 15, 2004
    Date of Patent: February 8, 2005
    Assignee: Alpha Innotech Corporation
    Inventor: David M. Heffelfinger
  • Publication number: 20040036775
    Abstract: The invention is a method and apparatus to extend the signal range of a digital image beyond the nominal sensor or data format range. The method and apparatus automatically acquires a scaled series of source data, applies noise reduction to the source data, and constructs a scaled composite with usable signal ranges greater than that of the individual data sources. Applied to digital images, the invention permits presentation and analysis of all signals from a subject in a single composite or an image resulting from the method and apparatus of the present invention. The present invention overcomes two defects in prior art systems: increased noise in the resultant composite image arising from rescaling of component images and dependence on evaluating image content to determine image scaling. Because this invention can be automated, it can be applied in numerous fields requiring high throughput.
    Type: Application
    Filed: June 18, 2003
    Publication date: February 26, 2004
    Applicant: Alpha Innotech Corporation
    Inventors: Robert M. Watson, John J. Kang
  • Patent number: 6271042
    Abstract: A biochip detection system detects and locates samples that are labeled with multiple fluorescent tags and are located on a biochip. This biochip detection system includes a charge coupled device (CCD) sensor, a broad spectrum light source, a lens, a light source filter, and a sensor filter. The CCD sensor comprises two dimensional CCD arrays to simultaneously detect light waves from at least a substantial portion of the biochip. The broad spectrum light source is optically coupled to the CCD sensor and is configured to be utilized with a variety of different fluorescent tags which have differing excitation wavelengths.
    Type: Grant
    Filed: August 26, 1998
    Date of Patent: August 7, 2001
    Assignee: Alpha Innotech Corporation
    Inventors: Robert Malcolm Watson, Jr., Haseeb R. Chaudhry, James S. Lee
  • Patent number: 5970167
    Abstract: A method and apparatus for analyzing failures in integrated circuits. A first image is obtained using an emission or electron microscope while an integrated circuit is operating under a first set of conditions. The image is integrated for improved resolution with a camera in front of the microscope screen or with a digitizer coupled to receive video signals from the microscope. The first image is digitized and stored in a first channel of an RGB digitizer board and displayed on a display screen. A second image is obtained in the same way and is digitized and stored in a second channel of the RGB digitizer board and displayed on the display screen. The remaining channel of the RGB digitizer board is coupled to receive live images. The resulting combined image appears as a black and white image so long as the images are aligned. Any differences between the three images will appear conspicuously in color. The input logic levels to the integrated circuit are changed.
    Type: Grant
    Filed: November 7, 1996
    Date of Patent: October 19, 1999
    Assignee: Alpha Innotech Corporation
    Inventor: James Barry Colvin
  • Patent number: 5892539
    Abstract: A more efficient portable emission microscope system comprising a cooled CCD camera coupled to microscope optics for detection of photon emissions from integrated circuits. Portability is achieved with a small light tight box and rubber boot combination which are used in conjunction with a probe station or portable stand. The optics are modified to contain an illuminating ring of light emitting diodes for sample illumination prior to or after emission acquisition. Sensitivity is increased by elevating the substrate temperature. In operation, an integrated circuit is enclosed by a rubber boot. An illuminated reference image is then obtained with the LEDs "on," and a background image is obtained with the LEDs "off." The background image represents illumination noise. The temperature of the circuit is then raised while the circuit is biased. Temperature elevation is accomplished by installing small power resistors at the base of an appropriate burn-in socket.
    Type: Grant
    Filed: November 8, 1995
    Date of Patent: April 6, 1999
    Assignee: Alpha Innotech Corporation
    Inventor: James Barry Colvin