Patents Assigned to AMBER PRECISION INSTRUMENTS, INC.
  • Using computer-aided design layout in scanning system
    Patent number: 10325057
    Abstract: A system and method for testing a device under test (DUT) combines measurement data of field components values made at different sampling locations away from the DUT with computer-aided design layout of the DUT. The combined computer-aided design layout of the DUT and the measurement data can then be displayed for analysis.
    Type: Grant
    Filed: August 17, 2016
    Date of Patent: June 18, 2019
    Assignee: AMBER PRECISION INSTRUMENTS, INC.
    Inventors: Giorgi Muchaidze, Besarion Chikhradze, Hamed Kajbaf
  • EMISSION SOURCE MICROSCOPY FOR ELECTROMAGNETIC INTERFERENCE APPLICATIONS
    Publication number: 20150177301
    Abstract: A system and method for performing radiation source analysis on a device under test (DUT) uses discrete Fourier transform on measured field components values at different sampling locations away from the DUT to derive field component values at locations on the DUT. The results of the discrete Fourier transform are multiplied by a complex phase adjustment term as a function of distance from the sampling locations to the DUT to translate the measured field component values back to the locations on the surface of the DUT.
    Type: Application
    Filed: December 24, 2014
    Publication date: June 25, 2015
    Applicant: AMBER PRECISION INSTRUMENTS, INC.
    Inventor: Hamed Kajbaf