Patents Assigned to Amdata, Inc.
  • Patent number: 5311128
    Abstract: An eddy current imaging system includes an eddy current sensing coil positioned proximate a workpiece for scanning the workpiece to produce a signal indicative of the integrity of the workpiece for regions in an x,y array of data. Such a signal may be a complex impedance signal representative of the amplitude and/or the phase of the signal. Two data processing techniques are disclosed for enhancing the display of a flay in the workpiece. The first includes the step of calculating a spatial derivative of the amplitude and/or phase indicative signal from the coil and providing an image of the spatial derivative to produce a C scan of the spatial derivative. The second includes the steps of determining the regions of maximum ascent and/or descent of the signal for regions in the scan and calculating an impedance plane trajectory from the data array of path points for displaying a reconstructed optimum signal independent of path pattern.
    Type: Grant
    Filed: June 26, 1992
    Date of Patent: May 10, 1994
    Assignee: Abb Amdata Inc.
    Inventors: John P. Lareau, David S. Leonard
  • Patent number: 5089700
    Abstract: A method of nondestructively identifying regions "R" of high density in a substrate (10) of a bonded matrix of carbon fibers by resistively heating the substrate and taking an infrared image of the heated substrate. Terminals 12, 14, 16 and 18 are connected to a power supply 26 by wires 22 and cable 24 of which they are a part, to effect the heating.
    Type: Grant
    Filed: January 30, 1990
    Date of Patent: February 18, 1992
    Assignee: Amdata, Inc.
    Inventors: Mark A. Sapia, John G. Clark