Patents Assigned to AMF Tuboscope, Inc. - Justia Patents Search

Patents Assigned to AMF Tuboscope, Inc.

Lift-off compensation of eddy current probes by translating without rotation the X-Y coordinate plot of the complex locus of the probe output

Patent number: 4620152

Abstract: This invention relates to a method and apparatus for compensating the output signal of a reflection type eddy current probe so as to minimize the change in the phase shift of the probe output signal that otherwise would occur as a result of a change in the spacing of the probe from the surface of the metal sample being inspected or investigated.

Type: Grant

Filed: January 11, 1983

Date of Patent: October 28, 1986

Assignee: AMF Tuboscope, Inc.

Inventor: James A. Bains, Jr.