Patents Assigned to AMO Delevopment, LLC
  • Patent number: 8545016
    Abstract: Methods and systems for obtaining an ocular aberration measurement of an eye of a patient are provided. Exemplary techniques involve obtaining a first induced metric for the eye that corresponds to a first accommodation state of the eye, obtaining a second induced metric for the eye that corresponds to a second accommodation state of the eye, and determining a natural metric of the eye based on the first and second induced metrics. An induced metric may include a pupil size or a spherical aberration. Techniques can also include determining a target metric for the eye base on the natural metric, determining whether an actual metric of the eye meets the target metric, obtaining an ocular aberration measurement of the eye if the actual metric meets the target metric, and determining a treatment for the eye based on the ocular aberration measurement.
    Type: Grant
    Filed: July 3, 2012
    Date of Patent: October 1, 2013
    Assignee: AMO Delevopment, LLC
    Inventors: Guang-Ming Dai, Leander Zickler