Patents Assigned to AMO Wavefront Sciences, LLC
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Patent number: 7980699Abstract: Devices, systems, and methods that facilitate optical analysis, particularly for the diagnosis and treatment of refractive errors of the eye. Embodiments of the invention may facilitate the use of multi-modal diagnostic instruments and instrument systems, making it easier to acquire and fuse data from different measurements of the eye. For example, wavefront aberrometry may be fused with corneal topography, optical coherence topography and wavefront, optical coherence topography and topography, pachymetry and wavefront, etc. While some of these different optical datasets may be obtained simultaneously, it is often difficult and/or disadvantageous to attempt to acquire the images or other data at exactly the same time. Advantageously, both patient movement between measurements (and/or during a measurement sequence) can be identified, as well as changes in the eye itself (including those induced by the measurement, such as changes in the size of the pupil, changes in pupil location, etc.).Type: GrantFiled: April 6, 2009Date of Patent: July 19, 2011Assignee: AMO Wavefront Sciences, LLC.Inventors: Daniel R. Neal, Leander Zickler
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Patent number: 7976163Abstract: A system measures a corneal topography of an eye. The system includes a group of first light sources arranged around a central axis, the group being separated from the axis by a radial distance defining an aperture in the group; a plurality of second light sources; a detector array; and an optical system adapted to provide light from the second light sources through the aperture to a cornea of an eye, and to provide images of the first light sources and images of the second light sources from the cornea, through the aperture, to the detector array. The optical system includes an optical element having a focal length, f. The second light sources are disposed to be in an optical path approximately one focal length, f, away from the optical element.Type: GrantFiled: June 27, 2007Date of Patent: July 12, 2011Assignee: AMO Wavefront Sciences LLCInventors: Charles E. Campbell, Stephen W. Farrer, Daniel R. Neal, William S. Powers, Thomas D. Raymond
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Patent number: 7967440Abstract: A system includes a light pattern generator having light spots for illuminating front and back surfaces of a cornea with polarized light; one or more detectors for receiving one or more of first spot images from light reflected off the front surface, and second spot images from light reflected off the back surface, the light reflected off the front surface having a first polarization and the light reflected off the back surface having a second polarization; a polarization element in an optical path between the back surface and the one or more detectors, the polarization element being configured to attenuate an intensity of the light reflected off the front surface by an amount greater than an amount by which it attenuates the light reflected off the back surface; and a processor for determining a geometric characteristic of the cornea using at least the second plurality of spot images.Type: GrantFiled: January 25, 2010Date of Patent: June 28, 2011Assignee: AMO Wavefront Sciences LLC.Inventors: James Copland, Daniel R. Neal, Thomas D. Raymond, Stephen W. Farrer, Paul Pulaski
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Patent number: 7969585Abstract: A geometric measurement system is adapted to precisely measure one or more surfaces of objects such as corneas, molds, contact lenses in molds, contact lenses, or other objects in a fixture. The geometric measurement system can employ one or more of three possible methods of measurement: Shack-Hartmann wavefront sensing with wavefront stitching; phase diversity sensing; and white light interferometry.Type: GrantFiled: November 6, 2009Date of Patent: June 28, 2011Assignee: AMO Wavefront Sciences LLC.Inventors: Daniel R Neal, Thomas D Raymond, William S Powers
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Publication number: 20110149239Abstract: Devices, systems, and methods that facilitate optical analysis, particularly for the diagnosis and treatment of refractive errors of the eye. An optical diagnostic method for an eye includes obtaining a sequence of aberration measurements of the eye, identifying an outlier aberration measurement of the sequence of aberration measurements, and excluding the outlier aberration measurement from the sequence of aberration measurements to produce a qualified sequence of aberration measurements. The sequence of aberrations measurements can be obtained by using a wavefront sensor. An optical correction for the eye can be formulated in response to the qualified sequence of aberration measurements.Type: ApplicationFiled: October 21, 2010Publication date: June 23, 2011Applicant: AMO Wavefront Sciences, LLCInventors: Daniel R. Neal, Thomas D. Raymond, Leander Zickler
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Patent number: 7887184Abstract: Systems and methods for measuring a distance from a reference plane of an optical measurement instrument to a reference plane of an optical device under test are disclose. In one embodiment a system for measuring this distance includes an illumination system, an optical system, and optical sensor and a processor. The illumination system is configured or adapted to illuminate the object under test. The optical system is configured or adapted to receive light from the object under test and to produce an aberrated image. The optical sensor is configured or adapted to receive and sense the aberrated image. The processor determines the distance from the reference plane of the optical measurement instrument to the reference plane of the optical device based on an aspect of the aberrated image sensed by the optical sensor.Type: GrantFiled: November 9, 2007Date of Patent: February 15, 2011Assignee: AMO Wavefront Sciences LLC.Inventors: C. David Baer, Daniel R. Neal, Richard James Copland, David Austin Neal
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Publication number: 20100277694Abstract: A geometric measurement system is adapted to precisely measure one or more surfaces of objects such as corneas, molds, contact lenses in molds, contact lenses, or other objects in a fixture. The geometric measurement system can employ one or more of three possible methods of measurement: Shack-Hartmann wavefront sensing with wavefront stitching; phase diversity sensing; and white light interferometry.Type: ApplicationFiled: November 6, 2009Publication date: November 4, 2010Applicant: AMO WaveFront Sciences, LLC.Inventors: DANIEL R. NEAL, THOMAS DANIEL RAYMOND, WILLIAM SHEA POWERS
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Publication number: 20100123873Abstract: A method of determining a wavefront of a received light beam includes: (a) receiving a light beam; (b) producing a group of light spots from the light beam; (c) qualifying a set of the light spots for use in determining a wavefront of the received light beam; and (d) determining the wavefront of the received light beam using the qualified set of light spots. Qualifying the set of light spots includes, for each light spot: calculating a first calculated location of the light spot using a first calculation algorithm; calculating a second calculated location of the light spot using a second calculation algorithm; and when a difference between the first and second calculated locations for the light spot is greater than an agreement threshold, excluding the light spot from the set of light spots and/or from being employed in determining the wavefront of the received light beam.Type: ApplicationFiled: October 28, 2009Publication date: May 20, 2010Applicant: AMO WAVEFRONT SCIENCES, LLCInventors: Thomas D. RAYMOND, John Grant DIXSON, Stephen W. FARRER, Wei XIONG, Daniel R. NEAL
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Publication number: 20100045934Abstract: An ophthalmic error measurement system includes a projecting optical system delivering light onto a retina of an eye, a pre-correction system which compensates a light beam to be injected into the eye for aberrations in the eye, the pre-correction system being positioned in between the projecting optical system and the eye, an imaging system which collects light scattered by the retina, and a detector receiving light returned by the retina from the imaging system. Use of the pre-correction system allows the end-to-end aberrations of the ocular system to be analyzed. The use of a pre-correction system also allows use of a minimized spot size on the retina, and all of its attendant advantages.Type: ApplicationFiled: November 3, 2009Publication date: February 25, 2010Applicant: AMO WAVEFRONT SCIENCES, LLCInventors: Daniel R. Neal, Richard James Copland
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Publication number: 20090316112Abstract: Devices, systems, and methods that facilitate optical analysis, particularly for the diagnosis and treatment of refractive errors of the eye. Embodiments of the invention may facilitate the use of multi-modal diagnostic instruments and instrument systems, making it easier to acquire and fuse data from different measurements of the eye. For example, wavefront aberrometry may be fused with corneal topography, optical coherence topography and wavefront, optical coherence topography and topography, pachymetry and wavefront, etc. While some of these different optical datasets may be obtained simultaneously, it is often difficult and/or disadvantageous to attempt to acquire the images or other data at exactly the same time. Advantageously, both patient movement between measurements (and/or during a measurement sequence) can be identified, as well as changes in the eye itself (including those induced by the measurement, such as changes in the size of the pupil, changes in pupil location, etc.).Type: ApplicationFiled: April 6, 2009Publication date: December 24, 2009Applicant: AMO Wavefront Sciences, LLCInventors: Daniel R. Neal, Leander Zickler
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Patent number: 7623251Abstract: A geometric measurement system is adapted to precisely measure one or more surfaces of objects such as corneas, molds, contact lenses in molds, contact lenses, or other objects in a fixture. The geometric measurement system can employ one or more of three possible methods of measurement: Shack-Hartmann wavefront sensing with wavefront stitching; phase diversity sensing; and white light interferometry.Type: GrantFiled: April 9, 2007Date of Patent: November 24, 2009Assignee: AMO Wavefront Sciences, LLC.Inventors: Daniel R. Neal, Thomas Daniel Raymond, William Shea Powers
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Publication number: 20090284753Abstract: A system for mapping a three-dimensional structure includes a projecting optical system adapted to project light onto an object, a correction system adapted to compensate the light for at least one aberration in the object, an imaging system adapted to collect light scattered by the object and a wavefront sensor adapted to receive the light collected by the imaging system and to sense a wavefront of the received light. For highly aberrated structures, a number of wavefront measurements are made which are valid over different portions of the structure, and the valid wavefront data is stitched together to yield a characterization of the total structure.Type: ApplicationFiled: May 29, 2009Publication date: November 19, 2009Applicant: AMO WAVEFRONT SCIENCES, LLCInventors: Daniel R. Neal, Richard James Copland, David A. Neal
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Patent number: 7583389Abstract: A geometric measurement system is adapted to precisely measure one or more surfaces of objects such as corneas, molds, contact lenses in molds, contact lenses, or other objects in a fixture. The geometric measurement system can employ one or more of three possible methods of measurement: Shack-Hartmann wavefront sensing with wavefront stitching; phase diversity sensing; and white light interferometry.Type: GrantFiled: April 9, 2007Date of Patent: September 1, 2009Assignee: Amo Wavefront Sciences, LLCInventors: Daniel R. Neal, Thomas Daniel Raymond, William Shea Powers
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Publication number: 20090207377Abstract: A method and associated system improve accuracy in objective refraction measurements by including the measured distance between the photoreceptors of a subjects eye and the scattering location of light during the objective refraction measurements. Chromatic aberrations in the objective measurements are also compensated. The distance between the photoreceptors and the scattering location may be determined by adjusting a distance between a rotating speckled light pattern and an eye until the speckled light pattern appears to be stationary, or by employing a Scheiner disk.Type: ApplicationFiled: February 18, 2009Publication date: August 20, 2009Applicant: AMO Wavefront Sciences, LLCInventor: Richard J. Copland
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Patent number: 7570351Abstract: A system and method of measuring the curvature of a surface of a object operate by illuminating the object surface with a light pattern having a known size to produce a virtual reflected image from the object surface; measuring a size of the virtual reflected image produced by the object surface from the light pattern; and calculating a curvature of the object surface from the known size of the light pattern and the size of the virtual reflected image.Type: GrantFiled: June 30, 2006Date of Patent: August 4, 2009Assignee: Amo Wavefront Sciences, LLC.Inventors: Zino Altman, Daniel R. Neal, Richard James Copland
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Publication number: 20090185132Abstract: A phase diversity wavefront sensor includes an optical system including at least one optical element for receiving a light beam; a diffractive optical element having a diffractive pattern defining a filter function, the diffractive optical element being arranged to produce, in conjunction with the optical system, images from the light beam associated with at least two diffraction orders; and a detector for detecting the images and outputting image data corresponding to the detected images. In one embodiment, the optical system, diffractive optical element, and detector are arranged to provide telecentric, pupil plane images of the light beam. A processor receives the image data from the detector, and executes a Gerchberg-Saxton phase retrieval algorithm to measure the wavefront of the light beam.Type: ApplicationFiled: October 28, 2008Publication date: July 23, 2009Applicant: AMO WAVEFRONT SCIENCES, LLC.Inventors: Thomas D. RAYMOND, Paul PULASKI, Stephen W. FARRER, Daniel R. NEAL, Alan H. GREENAWAY, David M. FAICHNIE, Heather I. CAMPBELL DALGARNO, Graham N. CRAIK
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Publication number: 20090175525Abstract: A system for determining a surface shape of a test object includes a pattern having a plurality of first elements dispose about a central axis and defining an aperture containing the central axis. The first elements includes a plurality of common elements having a common form and a reference element having a reference form that is different than the common form. The system further comprises a detector array and an optical system. The optical system is adapted to provide an image of the first elements when light reflects off a surface of a test object, passes through the aperture, and is received by the detector array. The reference form may be configured to facilitate an association between the common elements and the spot images of the common elements.Type: ApplicationFiled: January 8, 2009Publication date: July 9, 2009Applicant: AMO Wavefront Sciences LLCInventors: Stephen W. Farrer, James Copland, Thomas D. Raymond, Wei Xiong
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Patent number: 7553022Abstract: A system for mapping a three-dimensional structure includes a projecting optical system adapted to project light onto an object, a correction system adapted to compensate the light for at least one aberration in the object, an imaging system adapted to collect light scattered by the object and a wavefront sensor adapted to receive the light collected by the imaging system and to sense a wavefront of the received light. For highly aberrated structures, a number of wavefront measurements are made which are valid over different portions of the structure, and the valid wavefront data is stitched together to yield a characterization of the total structure.Type: GrantFiled: July 27, 2007Date of Patent: June 30, 2009Assignee: AMO Wavefront Sciences, LLCInventors: Daniel R. Neal, Richard James Copland, David A. Neal
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Patent number: 7455407Abstract: A system for mapping a three-dimensional structure includes a projecting optical system adapted to project light onto an object, a correction system adapted to compensate the light for at least one aberration in the object, an imaging system adapted to collect light scattered by the object and a wavefront sensor adapted to receive the light collected by the imaging system and to sense a wavefront of the received light. For highly aberrated structures, a number of wavefront measurements are made which are valid over different portions of the structure, and the valid wavefront data is stitched together to yield a characterization of the total structure.Type: GrantFiled: April 21, 2004Date of Patent: November 25, 2008Assignee: AMO Wavefront Sciences, LLCInventors: Daniel R. Neal, Richard James Copland, David A. Neal