Patents Assigned to Analog Test Engines
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Patent number: 10180453Abstract: Methods and systems for sourcing and/or sinking current from power supplies of differing voltage levels. A driving circuit may, for example, receive power from first and second power supplies, where the first power supply provides current to the driving circuit at a first voltage level and the second power supply provides current to the driving circuit at a second voltage level, and where the first voltage is greater than the second voltage. As a result, the first power supply allows the driving circuit to provide current over a wide voltage range, and the second power supply allows the driving circuit to provide current at lower voltages with less power consumption.Type: GrantFiled: September 4, 2015Date of Patent: January 15, 2019Assignee: Analog Test EnginesInventor: Jeffrey Allen King
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Patent number: 9939490Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.Type: GrantFiled: August 6, 2013Date of Patent: April 10, 2018Assignee: Analog Test EnginesInventor: Jeffrey Allen King
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Patent number: 9851402Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.Type: GrantFiled: August 6, 2013Date of Patent: December 26, 2017Assignee: Analog Test EnginesInventor: Jeffrey Allen King
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Patent number: 9797951Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.Type: GrantFiled: August 6, 2013Date of Patent: October 24, 2017Assignee: Analog Test EnginesInventor: Jeffrey Allen King
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Patent number: 9746520Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.Type: GrantFiled: August 6, 2013Date of Patent: August 29, 2017Assignee: Analog Test EnginesInventor: Jeffrey Allen King
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Patent number: 9442163Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.Type: GrantFiled: August 6, 2013Date of Patent: September 13, 2016Assignee: Analog Test EnginesInventor: Jeffrey Allen King
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Patent number: 9423461Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.Type: GrantFiled: August 6, 2013Date of Patent: August 23, 2016Assignee: Analog Test EnginesInventor: Jeffrey Allen King
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Publication number: 20150028901Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.Type: ApplicationFiled: August 6, 2013Publication date: January 29, 2015Applicant: ANALOG TEST ENGINES, INC.Inventor: Jeffrey Allen King
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Publication number: 20150032403Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.Type: ApplicationFiled: August 6, 2013Publication date: January 29, 2015Applicant: ANALOG TEST ENGINES, INC.Inventor: Jeffrey Allen King
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Publication number: 20150028899Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.Type: ApplicationFiled: August 6, 2013Publication date: January 29, 2015Applicant: ANALOG TEST ENGINES, INC.Inventor: Jeffrey Allen King
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Publication number: 20150028900Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.Type: ApplicationFiled: August 6, 2013Publication date: January 29, 2015Applicant: ANALOG TEST ENGINES, INC.Inventor: Jeffrey Allen King
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Publication number: 20150028906Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.Type: ApplicationFiled: March 20, 2014Publication date: January 29, 2015Applicant: Analog Test Engines, Inc.Inventor: Jeffrey Allen King
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Publication number: 20150028905Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.Type: ApplicationFiled: August 6, 2013Publication date: January 29, 2015Applicant: Analog Test Engines, Inc.Inventor: Jeffrey Allen King
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Publication number: 20150028902Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.Type: ApplicationFiled: August 6, 2013Publication date: January 29, 2015Applicant: ANALOG TEST ENGINES, INC.Inventor: Jeffrey Allen King
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Publication number: 20150028903Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.Type: ApplicationFiled: August 6, 2013Publication date: January 29, 2015Applicant: ANALOG TEST ENGINES, INC.Inventor: Jeffrey Allen King
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Publication number: 20150028904Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.Type: ApplicationFiled: August 6, 2013Publication date: January 29, 2015Applicant: ANALOG TEST ENGINES, INC.Inventor: Jeffrey Allen King
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Patent number: 8760180Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.Type: GrantFiled: July 29, 2013Date of Patent: June 24, 2014Assignee: Analog Test EnginesInventor: Jeffrey Allen King