Patents Assigned to ANALOG TEST ENGINES, INC.
  • SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES
    Publication number: 20150032403
    Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.
    Type: Application
    Filed: August 6, 2013
    Publication date: January 29, 2015
    Applicant: ANALOG TEST ENGINES, INC.
    Inventor: Jeffrey Allen King
  • SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES
    Publication number: 20150028901
    Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.
    Type: Application
    Filed: August 6, 2013
    Publication date: January 29, 2015
    Applicant: ANALOG TEST ENGINES, INC.
    Inventor: Jeffrey Allen King
  • SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES
    Publication number: 20150028905
    Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.
    Type: Application
    Filed: August 6, 2013
    Publication date: January 29, 2015
    Applicant: Analog Test Engines, Inc.
    Inventor: Jeffrey Allen King
  • SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES
    Publication number: 20150028899
    Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.
    Type: Application
    Filed: August 6, 2013
    Publication date: January 29, 2015
    Applicant: ANALOG TEST ENGINES, INC.
    Inventor: Jeffrey Allen King
  • SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES
    Publication number: 20150028900
    Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.
    Type: Application
    Filed: August 6, 2013
    Publication date: January 29, 2015
    Applicant: ANALOG TEST ENGINES, INC.
    Inventor: Jeffrey Allen King
  • SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES
    Publication number: 20150028906
    Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.
    Type: Application
    Filed: March 20, 2014
    Publication date: January 29, 2015
    Applicant: Analog Test Engines, Inc.
    Inventor: Jeffrey Allen King
  • SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES
    Publication number: 20150028903
    Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.
    Type: Application
    Filed: August 6, 2013
    Publication date: January 29, 2015
    Applicant: ANALOG TEST ENGINES, INC.
    Inventor: Jeffrey Allen King
  • SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES
    Publication number: 20150028902
    Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.
    Type: Application
    Filed: August 6, 2013
    Publication date: January 29, 2015
    Applicant: ANALOG TEST ENGINES, INC.
    Inventor: Jeffrey Allen King
  • SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES
    Publication number: 20150028904
    Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.
    Type: Application
    Filed: August 6, 2013
    Publication date: January 29, 2015
    Applicant: ANALOG TEST ENGINES, INC.
    Inventor: Jeffrey Allen King