Patents Assigned to Analysis & Technology, Inc.
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Patent number: 12154775Abstract: An analysis system, an auxiliary analysis apparatus, and an analysis method are provided. The analysis method is used to perform a composition analysis operation on an analyte of a sample, and includes: a first heating step, a first mass spectrometry analysis step, a second heating step, a second mass spectrometry analysis step, and an analysis step. A heating device heats a non-analyzed area and a to-be-analyzed area of the sample in the first and the second heating step, respectively. In the first and the second mass spectrometry analysis step, gas generated after heating of the sample is guided into a gas chromatography-mass spectrometer, and two pieces of analysis data are correspondingly obtained. The analysis step is to compare the two pieces of analysis data and generate analysis result data. The analysis result data contains components of a composition that forms at least one portion of the analyte.Type: GrantFiled: June 28, 2022Date of Patent: November 26, 2024Assignee: Materials Analysis Technology Inc.Inventors: Yu-Teh Chung, Yen-An Tsai, Hung-Jen Chen
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Publication number: 20240172372Abstract: Certain exemplary embodiments can provide structures used to form printed board layer-to-layer interconnects using solder. When the structures are laminated together, forming a printed board, the solders fuse or bond to other electrically conductive materials forming layer-to-layer interconnects. Benefits include reduced fabrication time and costs, fewer and simpler process steps, known metallurgy, increased reliability, and a significant reduction in environmental impact.Type: ApplicationFiled: June 19, 2023Publication date: May 23, 2024Applicant: Conductor Analysis Technologies, Inc.Inventors: Timothy A. Estes, Lance A. Auer, Nicholas J. Meeker
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Patent number: 11959834Abstract: A manufacturing method of a sample collection component, by which a removable light shielding component is disposed on a main body of the sample collection component to shield at least a portion of the light that passes through a storing space of the sample collection component.Type: GrantFiled: June 16, 2023Date of Patent: April 16, 2024Assignee: Materials Analysis Technology Inc.Inventors: Pin Chang, Ying-Chan Hung, Hung-Jen Chen
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Publication number: 20230332985Abstract: A manufacturing method of a sample collection component, by which a removable light shielding component is disposed on a main body of the sample collection component to shield at least a portion of the light that passes through a storing space of the sample collection component.Type: ApplicationFiled: June 16, 2023Publication date: October 19, 2023Applicant: Materials Analysis Technology Inc.Inventors: Pin Chang, Ying-Chan Hung, Hung-Jen Chen
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Publication number: 20230326000Abstract: A curve alignment method and apparatus are provided. In the method, data obtained by at least one equipment analyzing a test sample is retrieved to generate test curves. In response to an alignment operation of directing a first point around a first curve to a second point around a second curve among the test curves, a correspondence between features corresponding to the first and second points is recorded, and correspondences of alignment operations are collected as feature data. Data obtained by the equipment analyzing a current sample is retrieved to generate current curves, and a third point matching the first feature on a third curve and a fourth point matching the second feature on a fourth curve are searched according to the correspondences. At least one of the third curve and the fourth curve is adjusted to align the third point with the fourth point.Type: ApplicationFiled: July 5, 2022Publication date: October 12, 2023Applicant: Materials Analysis Technology Inc.Inventors: Hsiang-Yu Tsou, Hung-Jen Chen
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Patent number: 11291991Abstract: A sample carrier device including a single substrate, a penetration structure and a fixing structure is provided. The penetration structure is formed on a side of the substrate. The penetration structure has a fluid passage. The fixing structure is formed on a side of the penetration structure. The sample carrier device is divided into an end portion, an observation portion and an operation portion. The user can separate the observation portion from the end portion by operating the operation portion. After the observation portion is separated from the end portion, the user can inject the sample into the fluid passage through a port of the fluid passage exposed to the observation portion. Once the sample is carried by the fluid passage of the observation portion, the user can seal the port of the fluid passage and place the observation portion in an electron microscope device.Type: GrantFiled: September 20, 2019Date of Patent: April 5, 2022Assignee: Materials Analysis Technology Inc.Inventor: Hung-Jen Chen
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Patent number: 11282669Abstract: A carrier device and a carrier kit are provided. The carrier kit includes the carrier device and a specimen carrier. The carrier device carries the specimen carrier and is configured to be fixedly disposed on a specimen holder. The specimen carrier has two observation grooves and a containing channel that is formed therein, and the two observation grooves are configured to expose a part of the containing channel. The carrier device has a containing groove that is recessed on a side of a main body and an observation port. When the specimen carrier is disposed in the containing groove, one of the observation grooves is exposed from the main body through the observation port. At least one limiting element is configured to limit a range of movement of the specimen carrier disposed in the containing groove relative to the main body.Type: GrantFiled: September 21, 2020Date of Patent: March 22, 2022Assignee: Materials Analysis Technology Inc.Inventor: Hung-Jen Chen
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Patent number: 10416050Abstract: A liquid sample drying device, dried sample test piece and the preparation method for the dried sample test piece are provided. The liquid sample drying device includes two substrates, at least one spacer and a clamping member. Each of the two substrates includes a surface. The two surfaces face each other. The at least one spacer is located in between the substrates so as to form a sample region between the surfaces for receiving a liquid sample. The clamping member touches the two substrates so as to temporarily clamp and fix the two substrates and the at least one spacer together.Type: GrantFiled: September 10, 2014Date of Patent: September 17, 2019Assignee: Materials Analysis Technology, Inc.Inventors: Lin-Ai Tai, Yu-Ching Chen, Chih-Jung Sun, Pin Chang
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Patent number: 10379075Abstract: A sample collection device includes two substrates and a spacer. The two substrates are disposed oppositely. Each substrate has a first surface, a second surface opposing to the first surface, a first recess and at least one second recess. The two substrates are arranged with the first surfaces facing each other, and the first and second recesses are respectively located on each first surface. The first recesses of the substrates jointly form a first channel, and the second recesses of the substrates jointly form a second channel connected to the outside of the sample collection device. The first channel and the second channel are interconnected. The spacer is disposed between the two first surfaces for bonding and fixing the two substrates. A sample containing space is formed between the two substrates and the spacer. The sample containing space includes the first chancel and the second channel. In addition, a manufacturing method of the sample collection device is also provided.Type: GrantFiled: June 6, 2016Date of Patent: August 13, 2019Assignee: Materials Analysis Technology Inc.Inventors: Pin Chang, Hung-Jen Chen
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Publication number: 20190226946Abstract: A manufacturing method of a sample collection component, by which a removable light shielding component is disposed on a main body of the sample collection component to shield at least a portion of the light that passes through a storing space of the sample collection component.Type: ApplicationFiled: April 3, 2019Publication date: July 25, 2019Applicant: Materials Analysis Technology Inc.Inventors: Pin Chang, Ying-Chan Hung, Hung-Jen Chen
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Patent number: 10309875Abstract: A sample collection component including a main body and a removable light shielding component is provided. The main body has a sample storing space which is sealable and allows light to pass through. The removable light shielding component is disposed on the main body and located outside the sample storing space for shielding at least a portion of the light passing through the sample storing space. In addition, a manufacturing method of the sample collection component is also provided.Type: GrantFiled: March 8, 2016Date of Patent: June 4, 2019Assignee: Materials Analysis Technology Inc.Inventors: Pin Chang, Ying-Chan Hung, Hung-Jen Chen
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Patent number: 10267713Abstract: A sample preparation system includes a slicing module, a first tank, a sequencing module and a pickup module. The slicing module is utilized to sequentially slice a sample block into a plurality of sample slices. The first tank is utilized to receive the sample slices. The sample slices float on a fluid in the first tank, and the sample slices are moved by the flowing fluid. The sequencing module is disposed at a side of the first tank, so as to separate the sample slices sequentially. The pick module is coupled with the first tank, so as to pick up the sample slices sequentially and place the sample slices on corresponding sample holders. In addition, a sample preparation method is also provided.Type: GrantFiled: December 8, 2016Date of Patent: April 23, 2019Assignee: Materials Analysis Technology Inc.Inventor: Hung-Jen Chen
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Publication number: 20180095015Abstract: A sample preparation system includes a slicing module, a first tank, a sequencing module and a pickup module. The slicing module is utilized to sequentially slice a sample block into a plurality of sample slices. The first tank is utilized to receive the sample slices. The sample slices float on a fluid in the first tank, and the sample slices are moved by the flowing fluid. The sequencing module is disposed at a side of the first tank, so as to separate the sample slices sequentially. The pick module is coupled with the first tank, so as to pick up the sample slices sequentially and place the sample slices on corresponding sample holders. In addition, a sample preparation method is also provided.Type: ApplicationFiled: December 8, 2016Publication date: April 5, 2018Applicant: Materials Analysis Technology Inc.Inventor: Hung-Jen Chen
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Patent number: 7337683Abstract: A sampling system for separating gaseous samples from a gas stream containing particulate matter and transporting the gaseous samples to a location outside of the flowing gas stream comprises an inertial filter mounted on the end of a hollow probe, the inertial filter positioned within the flowing gaseous stream. The inertial filter comprises a filter media mounted within a tube such that a portion of the particulate-containing gaseous steam flows through an annular space between the filter media and the tube wall, the gas to be sampled passes through the filter media into an inner space and the filtered gas is then delivered through the hollow probe to analytical devices external to the space containing the flowing gas stream, such as a flue stack.Type: GrantFiled: April 27, 2005Date of Patent: March 4, 2008Assignee: M & C Products Analysis Technology, Inc.Inventors: Herbert H. DeFriez, Clifford Gordon, David Whitcomb, Joseph Gregoria
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Patent number: 7287903Abstract: An apparatus for rapid thermal testing of samples consisting of a single sample chamber in which the samples are preferably arranged circularly around the opening through which a fluid of varying temperature, preferably air, is introduced to provide for rapid, uniform cooling and heating of the samples. The samples are preferably uniformly spaced to allow for uniform air flow. The samples are mounted in slots which are preferably oriented radially outward from the opening. The sample mounts comprise electrical connectors which form a network connected to at least one ohmmeter for measuring the resistance of the samples. The samples preferably comprise test coupons, each with multiple daisy-chained nets of vias or other components to be tested. Also a method for thermal testing of samples consisting of steps to characterize the samples before the test is run.Type: GrantFiled: February 20, 2004Date of Patent: October 30, 2007Assignee: Conductor Analysis Technologies, Inc.Inventors: Timothy A. Estes, Robert Neves
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Publication number: 20040233966Abstract: An apparatus for rapid thermal testing of samples consisting of a single sample chamber in which the samples are preferably arranged circularly around the opening through which a fluid of varying temperature, preferably air, is introduced to provide for rapid, uniform cooling and heating of the samples. The samples are preferably uniformly spaced to allow for uniform air flow. The samples are mounted in slots which are preferably oriented radially outward from the opening. The sample mounts comprise electrical connectors which form a network connected to at least one ohmmeter for measuring the resistance of the samples. The samples preferably comprise test coupons, each with multiple daisy-chained nets of vias or other components to be tested. Also a method for thermal testing of samples consisting of steps to characterize the samples before the test is run.Type: ApplicationFiled: February 20, 2004Publication date: November 25, 2004Applicant: Conductor Analysis Technologies, Inc.Inventors: Timothy A. Estes, Robert Neves
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Patent number: 6066181Abstract: A Java native interface code generator is disclosed to facilitate mixed language programming, by making native code programmed in a native language accessible to Java application programs. A programmer generates a native interface definition for native code, preferably using a neutral Interface Definition Language (IDL) to describe native code components (functions, data structures, constants and other user-defined data types), for which native mappings are to be generated. The Java native interface code generator supports complex data types, including nested data structures and multi-dimensional arrays. The Java native interface code generator reads and parses the user-derived native interface definition and generates Java Classes, data conversion code stubs and related header files. The Java Classes consist of classes of native methods, as well as classes for complex data types, which are called from Java.Type: GrantFiled: December 8, 1997Date of Patent: May 23, 2000Assignee: Analysis & Technology, Inc.Inventor: Jerry D. DeMaster