Patents Assigned to Analytica of Branford
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Patent number: 6872941Abstract: A Time-Of-Flight mass spectrometer is configured with a pulsing region and electronic controls that generate a potential well for ions in the pulsing region, due to the repelling effect of a high-frequency electric field that is created in the space immediately proximate to a surface, and an additional static electric field that accelerates ions toward the surface. Ions can be constrained and accumulated over time in the potential well prior to acceleration into the Time-Of-Flight tube for mass analysis. Ions can also be directed to collide with the surface with high energy to cause Surface Induced Dissociation (SID) fragmentation, or with low energy to effect collisional cooling, hence, better spatial focusing, prior to mass analysis. The apparatus and method described in the invention result in refined control of ion fragmentation energy and improved Time-Of-Flight mass analysis performance.Type: GrantFiled: November 20, 2003Date of Patent: March 29, 2005Assignee: Analytica of Branford, Inc.Inventors: Craig M. Whitehouse, David G. Welkie
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Patent number: 6858437Abstract: A method and apparatus for Flow Injection Analysis (FIA) into Atmospheric Pressure Ion sources (API) including Electrospray (ES) and Atmospheric Pressure Chemical Ionization (APCI) sources whereby the sampling and spray needles are one and the same. The sampling and spray needle configured with an autoinjector apparatus or used in manual injection is introduced directly into a mating ES or APCI probe configured in an API source. Such a sampling and spray needle eliminates the need for injector valves, transfer lines or additional fluid delivery systems in FIA into API sources interfaced to mass spectrometers or other chemical analyzers. The use of a sampling and spray needle configuration reduces component costs, liquid dead volume, sample dilution effects, and minimizes cross contamination effects, solvent consumption and waste while increasing sample throughput.Type: GrantFiled: May 17, 2002Date of Patent: February 22, 2005Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., J. Fred Banks, James Boyle
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Patent number: 6753523Abstract: Multipole ion guides configured with one or more segments and positioned in a higher pressure vacuum region, are operated in mass to charge selection and ion fragmentation modes. Individual multipole ion guides are mounted in a linear assembly with no electrodes configured in between each multipole ion guide. At least a portion of each multipole ion guide mounted in a linear assembly resides in a vacuum region with higher background pressure. At least one ion guide can be configured to extend continuously from one vacuum stage into another. Individual sets of RF, +/− DC and secular frequency voltage supplies provide potentials to the rods of each multipole ion guide allowing the operation of ion transmission, ion trapping, mass to charge selection and ion fragmentation functions independently in each ion guide.Type: GrantFiled: September 6, 2002Date of Patent: June 22, 2004Assignee: Analytica of Branford, Inc.Inventors: Craig M. Whitehouse, Bruce A. Andrien, Jr., Erol E. Gulcicek
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Patent number: 6744047Abstract: A multipole ion guide which begins in one pumping stage and extends continuously into one or more subsequent pumping stages has been incorporated into an atmospheric pressure ion source mass spectrometer system. Ions delivered into vacuum from an Electrospray, Atmospheric Pressure Chemical Ionization or Inductively Coupled Plasma ion source are guided and focused into a mass analyzer with high efficiency using the multipole ion guide. The background pressure over a portion of the multipole ion guide length is high enough to cause kinetic energy cooling of ions traversing the ion guide length due to ion collisions with neutral background gas molecules. This ion kinetic energy cooling lowers energy spread of ions traversing the multipole ion guide length. The multipole ion guide DC offset potential can be used to adjust the mean ion energy and the ion guide an and qn values can be set to reduce or expand the range of ion mass to charge which will be transmitted through the ion guide.Type: GrantFiled: June 7, 2002Date of Patent: June 1, 2004Assignee: Analytica of Branford, Inc.Inventors: Craig M. Whitehouse, Erol Gulcicek
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Patent number: 6707037Abstract: A Matrix Assisted Laser Desorption Ionization (MALDI) Source operated at atmospheric or vacuum pressure is interfaced to a multipole ion guide or ion funnel with alternating current (AC or RF) waveforms applied. The multipole ion guides or ion funnels are configured to focus transport, trap and/or separate ions produced from a MALDI ion source and direct the MALDI produced ions to a mass analyzer for MS or MS/MSn mass to charge analysis. The MALDI sample targets can be positioned at the entrance of a multipole ion guide or ion funnel with gas flow and electric fields configured to direct ions efficiently into the ion guide or ion funnel. Alternatively, the MALDI target can be positioned inside the multipole ion guide or ion funnel so that ions produced are immediately exposed to the RF focusing electric fields inside the ion guide or ion funnel.Type: GrantFiled: May 24, 2002Date of Patent: March 16, 2004Assignee: Analytica of Branford, Inc.Inventor: Craig M. Whitehouse
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Patent number: 6683301Abstract: A Time-Of-Flight mass spectrometer is configured with a pulsing region and electronic controls that generate a potential well for ions in the pulsing region, due to the repelling effect of a high-frequency electric field that is created in the space immediately proximate to a surface, and an additional static electric field that accelerates ions toward the surface. Ions can be constrained and accumulated over time in the potential well prior to acceleration into the Time-Of-Flight tube for mass analysis. Ions can also be directed to collide with the surface with high energy to cause Surface Induced Dissociation (SID) fragmentation, or with low energy to effect collisional cooling, hence, better spatial focusing, prior to mass analysis. The apparatus and methods described in the invention result in refined control of ion fragmentation energy and improved Time-Of-Flight mass analysis performance.Type: GrantFiled: January 25, 2002Date of Patent: January 27, 2004Assignee: Analytica of Branford, Inc.Inventors: Craig Whitehouse, David G. Welkie
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Patent number: 6621073Abstract: A Time-of-Flight Mass Spectrometer (TOF-MS) is configured to improve resolution and sensitivity performance. The TOF-MS includes an arrangement of electrodes comprising an ion accelerator with two stages of homogeneous electric fields, an ion reflector with a single stage of a homogeneous electric field, accelerator and reflector being separated by a first drift space, and an ion detector which is separated from the reflector by a second drift space. Contrary to known TOF-MS of similar configuration, the set of electric potentials which must be applied to said electrodes is predetermined for a given geometry in such a way that a spatial distribution of ions initially at rest in the first gap of the said accelerator is compressed at the location of the detector in the longitudinal direction to a focus of first and second order in the initial axial coordinate.Type: GrantFiled: October 12, 2000Date of Patent: September 16, 2003Assignee: Analytica of Branford, Inc.Inventor: Thomas Dresch
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Patent number: 6600155Abstract: A Time-Of-Flight mass spectrometer (1) is configured with a pulsing region (10) and electronic controls to cause the directing of ions to a surface (12) in the Time-Of-Flight pulsing region (10). The population of ions resulting from the collecting of said ions on or near said surface (12) is subsequently accelerated into the Time-Of-Flight tube (17) for mass to charge analysis. Ions produced away from said surface (12) can be directed to the surface (12) with high or low surface collisional energies. Higher energy ion collisions with the surface (12) can result in Surface Induced Dissociation fragmentation and the resulting ion fragment population can be mass analyzed. Mass analysis can be performed prior to directing the ions to the surface allowing MS/MS Time-Of-Flight mass analysis with SID.Type: GrantFiled: September 6, 2001Date of Patent: July 29, 2003Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., Michael A. Sansone, Allan G. Burt, Craig M. Whitehouse
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Patent number: 6573494Abstract: A single or multiple layer curved Electrospray sample introduction means has been configured in an Atmospheric Pressure Ion (API) source interfaced to a mass analyzer. Sample solutions introduced through curved or bent sample introduction Electrospray (ES) probes configured in an API source are sprayed from the ES probe tip at an angle which differs from centerline of the ES probe body. Single or multiple curved ES probes can be configured in an Atmospheric Pressure Ion source interfaced to mass analyzers. Curved ES probes can also be configured in an API source which includes Atmospheric Pressure Chemical ionization.Type: GrantFiled: December 4, 2001Date of Patent: June 3, 2003Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., Michael A. Sansone, Allan G. Burt, Craig M. Whitehouse
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Patent number: 6541768Abstract: Multiple sample introduction means have been configured in Atmospheric Pressure Ion sources which are interfaced to mass analyzers. Different samples can be introduced through multiple Electrospray (ES) or Atmospheric Pressure Chemical Ionization (APCI) probes individually or simultaneously and ionized. The gas phase ion mixture resulting from individual solutions sprayed from multiple ES or APCI probe inputs is mass analyzed. In this manner a calibration solution can be introduced through one ES or APCI probe while one or more sample solutions are spray from additional probes. Simultaneous spraying of calibration and sample solutions, results in an acquired mass spectrum containing peaks of ions with known molecular weights as well as sample related peaks. The calibration peaks can be used as an internal calibration standard during data analysis.Type: GrantFiled: March 21, 2001Date of Patent: April 1, 2003Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., Craig M. Whitehouse, Shida Shen, Michael A. Sansone
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Publication number: 20020168778Abstract: A method and apparatus for Flow Injection Analysis (FIA) into Atmospheric Pressure Ion sources (API) including Electrospray (ES) and Atmospheric Pressure Chemical Ionization (APCI) sources whereby the sampling and spray needles are one and the same. The sampling and spray needle configured with an autoinjector apparatus or used in manual injection is introduced directly into a mating ES or APCI probe configured in an API source. Such a sampling and spray needle eliminates the need for injector valves, transfer lines or additional fluid delivery systems in FIA into API sources interfaced to mass spectrometers or other chemical analyzers. The use of a sampling and spray needle configuration reduces component costs, liquid dead volume, sample dilution effects, and minimizes cross contamination effects, solvent consumption and waste while increasing sample throughput.Type: ApplicationFiled: May 17, 2002Publication date: November 14, 2002Applicant: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, J. Fred Banks, James Boyle
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Patent number: 6458597Abstract: A method and apparatus for Flow Injection Analysis (FIA) into Atmospheric Pressure Ion sources (API) including Electrospray (ES) and Atmospheric Pressure Chemical Ionization (APCI) sources whereby the sampling and spray needles are one and the same. The sampling and spray needle configured with an autoinjector apparatus or used in manual injection is introduced directly into a mating ES or APCI probe configured in an API source. Such a sampling and spray needle eliminates the need for injector valves, transfer lines or additional fluid delivery systems in FIA into API sources interfaced to mass spectrometers or other chemical analyzers. The use of a sampling and spray needle configuration reduces component costs, liquid dead volume, sample dilution effects, and minimizes cross contamination effects, solvent consumption and waste while increasing sample throughput.Type: GrantFiled: March 22, 2000Date of Patent: October 1, 2002Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., J. Fred Banks, James Boyle
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Patent number: 6403953Abstract: A multipole ion guide which begins in one pumping stage and extends continuously into one or more subsequent pumping stages has been incorporated into an atmospheric pressure ion source mass spectrometer system. Ions delivered into vacuum from an Electrospray, Atmospheric Pressure Chemical Ionization or Inductively Coupled Plasma ion source are guided and focused into a mass analyzer with high efficiency using the multipole ion guide. The background pressure over a portion of the multipole ion guide length is high enough to cause kinetic energy cooling of ions traversing the ion guide length due to ion collisions with neutral background gas molecules. This ion kinetic energy cooling lowers energy spread of ions traversing the multipole ion guide length. The multipole ion guide DC offset potential can be used to adjust the mean ion energy and the ion guide an and qn values can be set to reduce or expand the range of ion mass to charge which will be transmitted through the ion guide.Type: GrantFiled: November 30, 2000Date of Patent: June 11, 2002Assignee: Analytica of Branford, Inc.Inventors: Craig M. Whitehouse, Erol Gulcicek
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Patent number: 6403952Abstract: A multipole ion guide is configured to improve the transmission efficiency of ions which traverse the length of one ion guide and enter either another multipole ion guide such as a quadrupole mass analyzer or a three dimensional ion trap. The ion transfer multipole ion guide radial dimensions are reduced such that the pole assembly and an appropriately shaped exit lens can be positioned within a portion of the internal space defined by the larger radius second multipole ion guide poles. Ions exiting the first ion guide of reduced size find themselves inside the second ion guide close to the centerline. In this manner ions can be efficiently transferred from one ion guide to another, even for those ions with low kinetic energies. In a second embodiment of the invention, the exit region of a multipole ion guide is configured such that the multipole ion guide poles can be extended into a counterbore of a three dimensional ion trap end cap electrode.Type: GrantFiled: May 5, 2000Date of Patent: June 11, 2002Assignee: Analytica of Branford, Inc.Inventors: Craig M. Whitehouse, Erol Gulcicek
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Patent number: 6337480Abstract: An Electrospray probe which includes a replaceable or disposable micron size diameter Electrospray tip used for low flow rate Electrospray has been developed. The Electrospray probe assembly combines the use of a low pressure gas and electric fields to initiate and sustain the Electrospray process at low liquid flow rates. The operational flow rates of this probe range from below 25 nL/min to over 1 &mgr;L/min, with total sample volume loaded ranging from less than 1 &mgr;L to over 20 &mgr;L. The Electrospray probe assembly includes axial and radial adjustment of the Electrospray tip position relative to the sampling orifice into vacuum and that tip position can be locked in place. The replaceable microtip can be safely removed from the Electrospray (ES) chamber without turning off high voltage within the ES chamber. Telescoping support ways have been included to prevent ES tip damage by guiding the Electrospray probe tip during removal from and insertion into the ES chamber.Type: GrantFiled: August 4, 2000Date of Patent: January 8, 2002Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., Craig M. Whitehouse, Michael A. Sansone, Denise M. Sauro, Glenn P. Whitehouse
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Patent number: 6329654Abstract: A miniature multipole rod assembly, an apparatus and a technique for constructing such an assembly used for ion guide and mass spectrometers.Type: GrantFiled: December 22, 1998Date of Patent: December 11, 2001Assignee: Analytica of Branford, Inc.Inventors: Erol C. Gulcicek, Craig M. Whitehouse, Allan Burt, Michael Sansone, Clement Catalano
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Patent number: 6326616Abstract: A single or multiple layer curved Electrospray sample introduction means has been configured in an Atmospheric Pressure Ion (API) source interfaced to a mass analyzer. Sample solutions introduced through curved or bent sample introduction Electrospray (ES) probes configured in an API source are sprayed from the ES probe tip at an angle which differs from centerline of the ES probe body. Single or multiple curved ES probes can be configured in an Atmospheric Pressure Ion source interfaced to mass analyzers. Curved ES probes can also be configured in an API source which includes Atmospheric Pressure Chemical ionization.Type: GrantFiled: October 15, 1998Date of Patent: December 4, 2001Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., Michael A. Sansone, Allan G. Burt, Craig M. Whitehouse
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Patent number: 6207954Abstract: Multiple sample introduction means have been configured in Atmospheric Pressure Ion sources which are interfaced to mass analyzers. Different samples can be introduced through multiple Electrospray (ES) or Atmospheric Pressure Chemical Ionization (APCI) probes individually or simultaneously and ionized. The gas phase ion mixture resulting from individual solutions sprayed from multiple ES or APCI probe inputs is mass analyzed. In this manner a calibration solution can be introduced through one ES or APCI probe while one or more sample solutions are spray from additional probes. Simultaneous spraying of calibration and sample solutions, results in an acquired mass spectrum containing peaks of ions with known molecular weights as well as sample related peaks. The calibration peaks can be used as an internal calibration standard during data analysis.Type: GrantFiled: September 11, 1998Date of Patent: March 27, 2001Assignee: Analytica of Branford, Inc.Inventors: Bruce A. Andrien, Jr., Craig M. Whitehouse, Shida Shen, Michael A. Sansone
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Patent number: 6204500Abstract: A Time-Of-Flight mass spectrometer is configured with a pulsing region and electronic controls to cause the directing of ions to a surface in the Time-Of-Flight pulsing region. The population of ions resulting from the collecting of said ions on or near said surface is subsequently accelerated into the Time-Of-Flight tube for mass to charge analysis. Ions produced away from said surface located in the pulsing region of a Time-Of-Flight mass spectrometer can be directed to the surface with high or low surface collisional energies. Higher energy ion collisions with the surface can result in Surface Induced Dissociation fragmentation and the resulting ion fragment population can be accelerated into Time-Of-Flight tube where the ions are mass to charge analyzed. Ion mass to charge selection can occur prior to directing ions to the pulsing region surface allowing MS/MS Time-Of-Flight mass analysis with SID.Type: GrantFiled: October 6, 1999Date of Patent: March 20, 2001Assignee: Analytica of Branford, Inc.Inventors: Craig M. Whitehouse, Bruce Andrien
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Patent number: 6188066Abstract: A multipole ion guide which begins in one pumping stage and extends continuously into one or more subsequent pumping stages has been incorporated into an atmospheric pressure ion source mass spectrometer system. Ions delivered into vacuum from an Electrospray, Atmospheric Pressure Chemical Ionization or Inductively Coupled Plasma ion source are guided and focused into a mass analyzer with high efficiency using the multipole ion guide. The background pressure over a portion of the multipole ion guide length is high enough to cause kinetic energy cooling of ions traversing the ion guide length due to ion collisions with neutral background gas molecules. This ion kinetic energy cooling lowers energy spread of ions traversing the multipole ion guide length. The multipole ion guide DC offset potential can be used to adjust the mean ion energy and the ion guide an and qn values can be set to reduce or expand the range of ion mass to charge which will be transmitted through the ion guide.Type: GrantFiled: August 12, 1999Date of Patent: February 13, 2001Assignee: Analytica of Branford, Inc.Inventors: Craig M. Whitehouse, Erol Gulcicek