Patents Assigned to Analytical Pixels Technology-Apix Technology
  • Patent number: 9696285
    Abstract: The invention relates to a gas analysis system comprising, from upstream to downstream: a module (SEP) for separating at least a portion of the species contained in the gas to be analysed, comprising at least one microcapillary column (GC) for gas phase chromatography, and a time-of-flight mass spectrometer (TOFMS) coupled to said separation module, said spectrometer comprising a ion source (MS1, MS2) adapted to ionise at least a portion of said species and to emit a ion beam, and a free-flight zone (MS4) for said ions, said mass spectrometer (TOFMS) being arranged in the volume of at least one substrate and comprising a micro-reflectron (R) arranged between the source (MS1, MS2) and the free-flight zone (MS4), a wall (R1) of said micro-reflectron comprising a layer made from a resistive material designed to be polarised between at least two regions so as to create a continuous electrostatic field gradient in said reflectron.
    Type: Grant
    Filed: August 5, 2013
    Date of Patent: July 4, 2017
    Assignees: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, Analytical Pixels Technology-Apix Technology
    Inventors: Laurent Duraffourg, Philippe Andreucci, Charles-Marie Tassetti, Eric Colinet, Pierre Puget, Joshua Whiting, Peter Thomas Stevens, Mélanie Petitjean
  • Publication number: 20150204827
    Abstract: The invention relates to a gas analysis system comprising, from upstream to downstream: a module (SEP) for separating at least a portion of the species contained in the gas to be analysed, comprising at least one microcapillary column (GC) for gas phase chromatography, and a time-of-flight mass spectrometer (TOFMS) coupled to said separation module, said spectrometer comprising a ion source (MS1, MS2) adapted to ionise at least a portion of said species and to emit a ion beam, and a free-flight zone (MS4) for said ions, said mass spectrometer (TOFMS) being arranged in the volume of at least one substrate and comprising a micro-reflectron (R) arranged between the source (MS1, MS2) and the free-flight zone (MS4), a wall (R1) of said micro-reflectron comprising a layer made from a resistive material designed to be polarised between at least two regions so as to create a continuous electrostatic field gradient in said reflectron.
    Type: Application
    Filed: August 5, 2013
    Publication date: July 23, 2015
    Applicants: Commissariat a L'Energie Atomique et Aux Energies Alternatives, Analytical Pixels Technology-Apix Technology
    Inventors: Laurent Duraffourg, Philippe Andreucci, Charles-Marie Tassetti, Eric Colinet, Pierre Puget, Joshua Whiting, Peter Thomas Stevens, Mélanie Petitjean