Abstract: The invention relates to a gas analysis system comprising, from upstream to downstream: a module (SEP) for separating at least a portion of the species contained in the gas to be analysed, comprising at least one microcapillary column (GC) for gas phase chromatography, and a time-of-flight mass spectrometer (TOFMS) coupled to said separation module, said spectrometer comprising a ion source (MS1, MS2) adapted to ionise at least a portion of said species and to emit a ion beam, and a free-flight zone (MS4) for said ions, said mass spectrometer (TOFMS) being arranged in the volume of at least one substrate and comprising a micro-reflectron (R) arranged between the source (MS1, MS2) and the free-flight zone (MS4), a wall (R1) of said micro-reflectron comprising a layer made from a resistive material designed to be polarised between at least two regions so as to create a continuous electrostatic field gradient in said reflectron.
Type:
Grant
Filed:
August 5, 2013
Date of Patent:
July 4, 2017
Assignees:
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, Analytical Pixels Technology-Apix Technology
Inventors:
Laurent Duraffourg, Philippe Andreucci, Charles-Marie Tassetti, Eric Colinet, Pierre Puget, Joshua Whiting, Peter Thomas Stevens, Mélanie Petitjean
Abstract: The invention relates to a gas analysis system comprising, from upstream to downstream: a module (SEP) for separating at least a portion of the species contained in the gas to be analysed, comprising at least one microcapillary column (GC) for gas phase chromatography, and a time-of-flight mass spectrometer (TOFMS) coupled to said separation module, said spectrometer comprising a ion source (MS1, MS2) adapted to ionise at least a portion of said species and to emit a ion beam, and a free-flight zone (MS4) for said ions, said mass spectrometer (TOFMS) being arranged in the volume of at least one substrate and comprising a micro-reflectron (R) arranged between the source (MS1, MS2) and the free-flight zone (MS4), a wall (R1) of said micro-reflectron comprising a layer made from a resistive material designed to be polarised between at least two regions so as to create a continuous electrostatic field gradient in said reflectron.
Type:
Application
Filed:
August 5, 2013
Publication date:
July 23, 2015
Applicants:
Commissariat a L'Energie Atomique et Aux Energies Alternatives, Analytical Pixels Technology-Apix Technology
Inventors:
Laurent Duraffourg, Philippe Andreucci, Charles-Marie Tassetti, Eric Colinet, Pierre Puget, Joshua Whiting, Peter Thomas Stevens, Mélanie Petitjean