Patents Assigned to Anasys Instruments
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Publication number: 20180203039Abstract: This invention involves measurement of optical properties of materials with sub-micron spatial resolution through infrared scattering scanning near field optical microscopy (s-SNOM). Specifically, the current invention provides substantial improvements over the prior art by achieving high signal to noise, high measurement speed and high accuracy of optical amplitude and phase. Additionally, it some embodiments, it eliminates the need for an in situ reference to calculate wavelength dependent spectra of optical phase, or absorption spectra. These goals are achieved via improved asymmetric interferometry where the near-field scattered light is interfered with a reference beam in an interferometer. The invention achieves dramatic improvements in background rejection by arranging a reference beam that is much more intense than the background scattered radiation.Type: ApplicationFiled: August 31, 2017Publication date: July 19, 2018Applicant: Anasys InstrumentsInventors: Honghua Yang, Kevin Kjoller, Sam Berweger, Craig Prater
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Publication number: 20180120344Abstract: Methods and apparatus for obtaining extremely high sensitivity chemical composition maps with spatial resolution down to a few nanometers. In some embodiments these chemical composition maps are created using a combination of three techniques: (1) Illuminating the sample with IR radiation than is tuned to an absorption band in the sample; and (2) Optimizing a mechanical coupling efficiency that is tuned to a specific target material; (3) Optimizing a resonant detection that is tuned to a specific target material. With the combination of these steps it is possible to obtain (1) Chemical composition maps based on unique IR absorption; (2) spatial resolution that is enhanced by extremely short-range tip-sample interactions; and (3) resonant amplification tuned to a specific target material. In other embodiments it is possible to take advantage of any two of these steps and still achieve a substantial improvement in spatial resolution and/or sensitivity.Type: ApplicationFiled: November 10, 2016Publication date: May 3, 2018Applicant: Anasys InstrumentsInventors: Craig Prater, Kevin Kjoller
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Patent number: 9778282Abstract: This invention involves measurement of optical properties of materials with sub-micron spatial resolution through infrared scattering scanning near field optical microscopy (s-SNOM). Specifically, the current invention provides substantial improvements over the prior art by achieving high signal to noise, high measurement speed and high accuracy of optical amplitude and phase. Additionally, it some embodiments, it eliminates the need for an in situ reference to calculate wavelength dependent spectra of optical phase, or absorption spectra. These goals are achieved via improved asymmetric interferometry where the near-field scattered light is interfered with a reference beam in an interferometer. The invention achieves dramatic improvements in background rejection by arranging a reference beam that is much more intense than the background scattered radiation.Type: GrantFiled: April 14, 2017Date of Patent: October 3, 2017Assignee: Anasys InstrumentsInventors: Honghua Yang, Kevin Kjoller, Sam Berweger, Craig Prater
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Publication number: 20170219622Abstract: This invention involves measurement of optical properties of materials with sub-micron spatial resolution through infrared scattering scanning near field optical microscopy (s-SNOM). Specifically, the current invention provides substantial improvements over the prior art by achieving high signal to noise, high measurement speed and high accuracy of optical amplitude and phase. Additionally, it some embodiments, it eliminates the need for an in situ reference to calculate wavelength dependent spectra of optical phase, or absorption spectra. These goals are achieved via improved asymmetric interferometry where the near-field scattered light is interfered with a reference beam in an interferometer. The invention achieves dramatic improvements in background rejection by arranging a reference beam that is much more intense than the background scattered radiation.Type: ApplicationFiled: April 14, 2017Publication date: August 3, 2017Applicant: Anasys InstrumentsInventors: Honghua Yang, Kevin Kjoller, Sam Berweger, Craig Prater
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Patent number: 9658247Abstract: This invention involves measurement of optical properties of materials with sub-micron spatial resolution through infrared scattering scanning near field optical microscopy (s-SNOM). Specifically, the current invention provides substantial improvements over the prior art by achieving high signal to noise, high measurement speed and high accuracy of optical amplitude and phase. Additionally, it some embodiments, it eliminates the need for an in situ reference to calculate wavelength dependent spectra of optical phase, or absorption spectra. These goals are achieved via improved asymmetric interferometry where the near-field scattered light is interfered with a reference beam in an interferometer. The invention achieves dramatic improvements in background rejection by arranging a reference beam that is much more intense than the background scattered radiation.Type: GrantFiled: March 1, 2015Date of Patent: May 23, 2017Assignee: Anasys InstrumentsInventors: Honghua Yang, Kevin Kjoller, Sam Berweger, Craig Prater
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Publication number: 20170003316Abstract: This invention involves measurement of optical properties of materials with sub-micron spatial resolution through infrared scattering scanning near field optical microscopy (s-SNOM). Specifically, the current invention provides substantial improvements over the prior art by achieving high signal to noise, high measurement speed and high accuracy of optical amplitude and phase. Additionally, it some embodiments, it eliminates the need for an in situ reference to calculate wavelength dependent spectra of optical phase, or absorption spectra. These goals are achieved via improved asymmetric interferometry where the near-field scattered light is interfered with a reference beam in an interferometer. The invention achieves dramatic improvements in background rejection by arranging a reference beam that is much more intense than the background scattered radiation.Type: ApplicationFiled: March 1, 2015Publication date: January 5, 2017Applicant: ANASYS INSTRUMENTSInventors: Honghua Yang, Kevin Kjoller, Sam Berweger, Craig Prater
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Patent number: 9372154Abstract: This invention involves measurement of optical properties of materials with sub-micron spatial resolution through infrared scattering scanning near field optical microscopy (s-SNOM). Specifically, the current invention provides substantial improvements over the prior art by achieving high signal to noise, high measurement speed and high accuracy of optical amplitude and phase. Additionally, it some embodiments, it eliminates the need for an in situ reference to calculate wavelength dependent spectra of optical phase, or absorption spectra. These goals are achieved via improved asymmetric interferometry where the near-field scattered light is interfered with a reference beam in an interferometer. The invention achieves dramatic improvements in background rejection by arranging a reference beam that is much more intense than the background scattered radiation.Type: GrantFiled: July 2, 2014Date of Patent: June 21, 2016Assignee: Anasys InstrumentsInventor: Craig Prater
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Publication number: 20160003868Abstract: This invention involves measurement of optical properties of materials with sub-micron spatial resolution through infrared scattering scanning near field optical microscopy (s-SNOM). Specifically, the current invention provides substantial improvements over the prior art by achieving high signal to noise, high measurement speed and high accuracy of optical amplitude and phase. Additionally, it some embodiments, it eliminates the need for an in situ reference to calculate wavelength dependent spectra of optical phase, or absorption spectra. These goals are achieved via improved asymmetric interferometry where the near-field scattered light is interfered with a reference beam in an interferometer. The invention achieves dramatic improvements in background rejection by arranging a reference beam that is much more intense than the background scattered radiation.Type: ApplicationFiled: July 2, 2014Publication date: January 7, 2016Applicant: ANASYS INSTRUMENTSInventor: Craig Prater
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Patent number: 9046492Abstract: A method for achieving measurable sample heating in the vicinity of a probe microscope tip using Stimulated Raman Spectroscopy. Two laser sources, preferably in the UV visible or near IR illuminate the sample, preferably in overlapping diffraction limited spots. At least one of the sources is swept through a frequency range such that the difference frequency corresponds to IR spectral regions of interest. Selective Absorption by differing sample materials at the difference frequency causes measurable sample heating detectable by the probe tip related to IR spectral absorption bands. Thus very high spatial resolution IR spectroscopy may be achieved.Type: GrantFiled: November 3, 2012Date of Patent: June 2, 2015Assignee: Anasys Instruments Corp.Inventor: Craig Prater
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Patent number: 8914911Abstract: Described are methods for magnetically actuating microcantilevers and magnetically actuated and self-heated microcantilevers. Also described are methods for determining viscoelastic properties and thermal transition temperatures of materials.Type: GrantFiled: March 14, 2013Date of Patent: December 16, 2014Assignees: The Board of Trustees of the University of Illinois, Anasys InstrumentsInventors: William P. King, Craig Prater, Byeonghee Lee, Doug Gotthard
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Patent number: 8869602Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface by using the AFM probe to detect wavelength dependent IR radiation interaction, typically absorption with the sample in the region of the tip. The tip may be configured to produce electric field enhancement when illuminated by a radiation source. This enhancement allows for significantly reduced illumination power levels resulting in improved spatial resolution by confining the sample-radiation interaction to the region of field enhancement which is highly localized to the tip.Type: GrantFiled: November 30, 2011Date of Patent: October 28, 2014Assignee: Anasys Instruments Corp.Inventors: Mikhail Belkin, Feng Lu, Vladislav V. Yakolev, Craig Prater, Kevin Kjoller, Markus Raschke
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Patent number: 8793811Abstract: This invention involves measurement of optical properties of materials with sub-micron spatial resolution through infrared scattering scanning near field optical microscopy (s-SNOM). Specifically, the current invention provides substantial improvements over the prior art by achieving high signal to noise, high measurement speed and high accuracy of optical amplitude and phase. Additionally, it eliminates the need for an in situ reference to calculate wavelength dependent spectra of optical phase, or absorption spectra. These goals are achieved via improved asymmetric interferometry where the near field scattered light is interfered with a reference beam in an interferometer. The invention achieves dramatic improvements in background rejection by arranging a reference beam that is much more intense than the background scattered radiation. Combined with frequency selective demodulation techniques, the near-field scattered light can be efficiently and accurately discriminated from background scattered light.Type: GrantFiled: March 15, 2013Date of Patent: July 29, 2014Assignee: Anasys InstrumentsInventors: Craig Prater, Markus B. Raschke, Sam Berweger
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Patent number: 8680467Abstract: A method of obtaining submicron resolution IR absorption data from a sample surface. A probe microscope probe interacts with the sample surface while a tunable source of IR radiation illuminates the sample-tip interaction region. The source is modulated at a frequency substantially overlapping the resonant frequency of the probe and may be modulated at the contact resonance frequency of the probe when the probe is in contact with the sample surface. The modulation frequency is continually adjusted to account for shifts in the probe resonant frequency due to sample or other variations. A variety of techniques are used to observe such shifts and accomplish the adjustments in a rapid manner.Type: GrantFiled: September 19, 2011Date of Patent: March 25, 2014Assignee: Anasys Instruments Corp.Inventors: Craig Prater, Kevin Kjoller
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Patent number: 8646319Abstract: Dynamic IR radiation power control for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise.Type: GrantFiled: February 23, 2010Date of Patent: February 11, 2014Assignee: Anasys Instruments Corp.Inventors: Craig Prater, Kevin Kjoller
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Patent number: 8607622Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.Type: GrantFiled: July 18, 2011Date of Patent: December 17, 2013Assignee: Anasys Instruments CorporationInventors: Alexandre Dazzi, Rui Prazeres, Kevin Kjoller, Michael Reading
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Patent number: 8418538Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Significant issues as to size, cost of implementation, and repeatability/robustness of results exist in commercializing the technique. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.Type: GrantFiled: November 4, 2011Date of Patent: April 16, 2013Assignee: Anasys Instruments Inc.Inventors: A. Dazzi Dazzi, Clotilde Policar, Kevin Kjoller, Michael Reading, Konstantin Vodopyanov, Craig Prater
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Patent number: 8402819Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Significant issues as to size, cost of implementation, and repeatability/robustness of results exist in commercializing the technique. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.Type: GrantFiled: December 5, 2008Date of Patent: March 26, 2013Assignee: Anasys Instruments, Inc.Inventors: A. Dazzi Dazzi, Clotilde Policar, Kevin Kjoller, Michael Reading, Konstantin Vodopyanov, Craig Prater
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Patent number: 8387443Abstract: Described herein are devices and methods for sensing pulsed forces. Some of the described devices and methods are also useful for measuring infrared absorbances and compiling spectral and chemical maps of surfaces. Also described are microcantilever having reduced harmonic frequencies when operating in contact mode. Some of the described microcantilevers comprise an internal resonator configured to vibrate substantially independent of friction between the microcantilever tip and a surface when the microcantilever operates in contact mode. A number of the described devices and methods are useful for monitoring pulsed forces with enhanced sensitivity.Type: GrantFiled: September 11, 2009Date of Patent: March 5, 2013Assignees: The Board of Trustees of The University of Illinois, Anasys InstrumentsInventors: William P. King, Jonathan R. Felts, Craig Prater, Kevin Kjoller
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Patent number: 8242448Abstract: Dynamic IR radiation power control, beam steering and focus adjustment for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination with a beam from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise. Beam alignment and focus optimization as a function of wavelength are automatically performed.Type: GrantFiled: November 9, 2010Date of Patent: August 14, 2012Assignee: Anasys Instruments CorporationInventors: Craig Prater, Michael Lo, Doug Gotthard, Anthony Kurtz, Kevin Kjoller
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Patent number: 8177422Abstract: A system and method for automatic analysis of temperature transition data over an area of a sample surface. The system relies on the use of a microfabricated probe, which can be rapidly heated and cooled and has a sharp tip to provide high spatial resolution. The system also has fast x-y-z positioners, data collection, and algorithms that allow automatic analysis of and visualization of temperature transition data.Type: GrantFiled: August 15, 2008Date of Patent: May 15, 2012Assignee: Anasys InstrumentsInventors: Kevin Kjoller, Khoren Sahagian, Doug Gotthard, Anthony Kurtz, Craig Prater, Roshan Shetty, Michael Reading