Patents Assigned to Anasys Instruments, Inc.
  • High frequency deflection measurement of IR absorption
    Patent number: 8402819
    Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Significant issues as to size, cost of implementation, and repeatability/robustness of results exist in commercializing the technique. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.
    Type: Grant
    Filed: December 5, 2008
    Date of Patent: March 26, 2013
    Assignee: Anasys Instruments, Inc.
    Inventors: A. Dazzi Dazzi, Clotilde Policar, Kevin Kjoller, Michael Reading, Konstantin Vodopyanov, Craig Prater
  • High frequency deflection measurement of IR absorption
    Patent number: 8001830
    Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.
    Type: Grant
    Filed: May 15, 2007
    Date of Patent: August 23, 2011
    Assignee: Anasys Instruments, Inc.
    Inventors: Alexandre Dazzi, Rui Prazeres, Kevin Kjoller, Michael Reading
  • Infrared imaging using thermal radiation from a scanning probe tip
    Patent number: 7977636
    Abstract: A method for performing sub-micron optical spectroscopy, using a heated SPM probe and far-field collection optics is described. The enhanced emission characteristics at a sharp heated tip constitute a highly localized wideband IR source. Thus the IR absorption and emission properties of a sample surface adjacent can be observed and measured in the farfield even though the interaction region is sub-micron in scale. . . . providing spatial resolution mapping of sample composition.
    Type: Grant
    Filed: August 12, 2008
    Date of Patent: July 12, 2011
    Assignee: Anasys Instruments, Inc.
    Inventor: Markus B. Raschke