Patents Assigned to Anritsu Company
  • Patent number: 10505648
    Abstract: A method of estimating a location of an interference signal source includes using a first antenna configured to receive a signal from the interference signal source and using a second antenna arranged proximate to the first antenna and configured to receive global positioning system (GPS) signals. An initial trend in variation in power of a received signal from the interference signal source is determined relative to a position of the second antenna, wherein upon determining the initial trend, the initial trend is a current trend. In an iterative manner, the second antenna is directed to be repositioned. A secondary area associated with a lack of power measurement outside of an area traveled is identified and a further repositioning of the second antenna is determined to reduce the secondary area. An estimate of the location of the interference signal source is then determined.
    Type: Grant
    Filed: August 29, 2018
    Date of Patent: December 10, 2019
    Assignee: ANRITSU COMPANY
    Inventors: Randy Lundquist, Thomas A. Elliott
  • Patent number: 10481178
    Abstract: A method for marking relevant data within an acquired set of data in accordance with an embodiment includes receiving a location of a first synchronization event within a synchronizing time pulse synchronized with the acquired set of data, searching the synchronizing time pulse within a predetermined window for the first synchronization event based on the location, identifying the first synchronization event based on the search, and obtaining data from the acquired set of data within an offset range determined based on the identified first synchronization event. The steps are then iteratively repeated for a number of periods.
    Type: Grant
    Filed: October 22, 2014
    Date of Patent: November 19, 2019
    Assignee: ANRITSU COMPANY
    Inventors: Jon Martens, David Judge, Jamie Tu
  • Patent number: 10469296
    Abstract: An in-phase (I) and quadrature (Q) demodulator includes an input for receiving a signal, a reference frequency source, and a sampler connected with the input. The sampler includes a sampler strobe connected with the reference frequency source, and a non-linear transmission line (NLTL) connected with the sampler strobe. The NLTL receives a strobe signal generated by the sampler strobe and multiplies a frequency of the strobe signal to generate a sampler signal. When the sampler receives a signal from the input, the sampler is configured to generate and output an intermediate frequency (IF) signal using the sampler signal. A splitter of the demodulator separates the IF signal into an in-phase (I) component and a quadrature (Q) component. Mixers receive the I and Q components and generate I and Q output signals shifted 90° in phase.
    Type: Grant
    Filed: August 8, 2018
    Date of Patent: November 5, 2019
    Assignee: ANRITSU COMPANY
    Inventor: Karam Noujeim
  • Patent number: 10386444
    Abstract: A method of synchronizing a reference oscillator frequency of a first network analyzer with a reference oscillator frequency of a second network analyzer through a device under test (DUT) includes measuring a drift in a transmitted signal measured at the second network analyzer. The method includes connecting the first network analyzer to a first end of the DUT and connecting the second network analyzer to a second end of the DUT. A local oscillator (LO) signal of the first network analyzer is locked to a reference frequency of the first network analyzer. A LO signal of the second network analyzer is locked to a reference frequency of the second network analyzer. A RF signal is transmitted from the first network analyzer to the second network analyzer and an intermediate frequency (IF) of the transmitted signal is generated using the LO signal of the second network analyzer. The second network analyzer measures the transmitted IF signal.
    Type: Grant
    Filed: October 17, 2016
    Date of Patent: August 20, 2019
    Assignee: ANRITSU COMPANY
    Inventor: Kyle Stickle
  • Patent number: 10365345
    Abstract: A calibration device adapted to be used with a measurement instrument includes a controller, two or more ports, two or more power measurement circuits each connectable with one of the two or more ports, and a non-transitory computer readable storage medium accessible to the controller within which characterization data related to the two or more ports is storable. The calibration device is adapted to be connected with the measurement instrument via a data bus to transmit data and receive commands between the controller and the measurement instrument. The two or more ports are adapted to be interchangeably connectable with ports of the measurement instrument.
    Type: Grant
    Filed: December 2, 2016
    Date of Patent: July 30, 2019
    Assignee: ANRITSU COMPANY
    Inventor: Donald Anthony Bradley
  • Patent number: 10348421
    Abstract: In accordance with an embodiment a device is usable to measure radio frequency (RF) signals including microwave signals to provide an alarm when a power level at its input exceeds predetermined levels. A user can attach the device to a coax cable on a microwave or wireless tower to determine if certain power levels are present and what levels are exceeded. If high power is indicated by the device, the user will then avoid attaching that coax cable to other measurement equipment which would be damaged by excessive RF power. The device is further usable, for example, to apply power to one coax cable in a cable bundle then identify which cable of the bundle is getting the power by connecting the device on the output end of each coax in the bundle, one by one.
    Type: Grant
    Filed: October 30, 2015
    Date of Patent: July 9, 2019
    Assignee: ANRITSU COMPANY
    Inventors: Donald Anthony Bradley, Richard Glenn Barber, Stephen Andrew Robertson, Russel A. Brown, Elijah Brandon Jones, Danny Quintos Barrera
  • Patent number: 10267910
    Abstract: An imaging device includes an antenna configured to transmit millimeter waves, a connector adapted to connect a radio frequency (RF) signal source with the imaging device and a signal path connected between the connector and the antenna. A nonlinear transmission line (NLTL)-based frequency multiplier is arranged along the signal path to receive an RF signal from the RF signal source and increase a frequency of the RF signal to millimeter frequency to produce a millimeter wave. A NLTL-based variable delay line is arranged along the signal path between the NLTL-based frequency multiplier and the antenna. A time delay of an NLTL of the NLTL-base variable delay line is variable to steer a beam of the millimeter wave in at least one dimension as the millimeter wave is transmitted by the antenna. A receiver processes a return signal received in response to the millimeter wave.
    Type: Grant
    Filed: October 14, 2016
    Date of Patent: April 23, 2019
    Assignee: ANRITSU COMPANY
    Inventors: Karam Noujeim, Kyle Stickle
  • Patent number: 10237765
    Abstract: A measuring instrument for detecting a source of passive intermodulation (PIM) includes a signal source, a reference signal source, and a first transmitter module and a second transmitter module each configured to receive a signal from the signal source and a reference signal from the reference signal source and generate a tone at a first frequency and a second frequency, respectively. The measuring instrument further includes a receiver and a receiver module configured to receive the signal from the signal source and a harmonic of the test signal generated by a source of PIM to generate a sample signal at the fixed frequency of the reference signal. The receiver is configured to determine a shift in phase between the reference signal and the sample signal. The receiver determines an estimate of distance to the source of PIM using determinations of the shift in phase as the signal source is swept.
    Type: Grant
    Filed: September 7, 2018
    Date of Patent: March 19, 2019
    Assignee: ANRITSU COMPANY
    Inventor: Donald Anthony Bradley
  • Patent number: 10225073
    Abstract: A system for obtaining measurements for a device under test (DUT) includes a vector network analyzer including a storage medium and a controller for controlling a sweep and a trigger driver configured to provide a synchronization signal to the DUT and the controller to synchronize internal signal components of the vector network analyzer including signal sources, local oscillators (LOs) and an analog-to-digital converter (ADC) clock. A signal is received by the vector network analyzer in response to a test signal generated and transmitted to the DUT. Data related to the received signal is acquired and stored in at the storage medium. The controller inserts a mark into the time record based on an event of the sweep for identifying data from the received signal associated with the event within the time record.
    Type: Grant
    Filed: February 24, 2017
    Date of Patent: March 5, 2019
    Assignee: ANRITSU COMPANY
    Inventors: Jon S. Martens, Elena Vayner, Jamie Tu
  • Patent number: 10200021
    Abstract: In accordance with an embodiment, a synchronous N pulse burst generator includes an input for an intermediate frequency trigger signal and a signal path extending from the input. The signal path includes a series of N AND gates and an OR gate. Each AND gate is arranged to receive two inputs from the signal path. The signal path introduces a time delay between the two inputs received by each AND gate. A second input of the two inputs is inverted. The signal path introduces the time delay between successive AND gates from the series of N AND gates. An OR gate receives outputs from the series of N AND gates and outputs an A/D clock signal.
    Type: Grant
    Filed: October 31, 2016
    Date of Patent: February 5, 2019
    Assignee: ANRITSU COMPANY
    Inventor: Donald Anthony Bradley
  • Patent number: 10116432
    Abstract: A measuring instrument for measuring electrical characteristics of a device under test (DUT) includes a signal generator for generating a synchronization signal transmittable to a receiver and a phase shifter. The measuring instrument is configured to receive a retransmission of the synchronization signal from the receiver. The phase shifter configured to receive the synchronization signal from the signal generator and the retransmission of the synchronization signal from the receiver and shift a phase of the synchronization signal so that pulse edges of the synchronization signal are aligned at the measuring instrument and the receiver.
    Type: Grant
    Filed: December 29, 2017
    Date of Patent: October 30, 2018
    Assignee: ANRITSU COMPANY
    Inventor: Donald Anthony Bradley
  • Patent number: 10064317
    Abstract: In accordance with an embodiment, a method of providing a gasket on an electromagnetic interference (EMI) shield adapted to isolate a plurality of components of a measurement instrument includes obtaining a shield bottom of the EMI shield, cleaning the shield bottom, plugging threaded holes within the shield bottom so that threads of the threaded holes are substantially unexposed, applying a gasket layer to the shield bottom, and unplugging the threaded holes so that the threads are exposed.
    Type: Grant
    Filed: October 27, 2016
    Date of Patent: August 28, 2018
    Assignee: ANRITSU COMPANY
    Inventors: Donald Anthony Bradley, Anthony Alan Vega, Somesh M. Wadhwa
  • Patent number: 10006952
    Abstract: A method of eliminating spurs in measurements of an electrical response of a device under test (OUT) obtained uses a measurement instrument including a mixer and a receiver. The measurement instrument is configured to generate, via the mixer, an intermediate frequency (IF) signal for use by the receiver from a radio frequency (RF) signal and a local oscillator (LO) signal. Input is received from a user at the measurement instrument and includes start frequency and end frequency. Parameters for a frequency sweep are generated based on the input. A measurement for each frequency of the frequency sweep is calculated using averaging of a plurality of samples obtained at that frequency. Frequencies are identified within the frequency sweep at which spurs will occur due to the measurement instrument. The parameters for a frequency of the frequency sweep at which a spur will occur are modified so that a null for a measurement at the frequency falls on the spur.
    Type: Grant
    Filed: January 26, 2017
    Date of Patent: June 26, 2018
    Assignee: ANRITSU COMPANY
    Inventor: Donald Anthony Bradley
  • Patent number: 10003453
    Abstract: A system for measuring electrical characteristics of a device under test (DUT) includes a measuring instrument adapted to be connected with the DUT for transmitting tests signals to the DUT, a receiver adapted to be connected with the DUT and arranged remote from the measuring instrument, an optical transceiver having a first coupler electrically connectable with the measuring instrument and a second coupler electrically connectable with the receiver, and a first and second free space transceivers connected to respective couplers by fiber optic cable. The measuring instrument includes a clock signal generated from a synchronization signal. The synchronization signal is converted to an optical signal by the optical transceiver and transmitted from the first free space transceiver to the second free space transceiver. The second coupler converts the optical signal to the synchronization signal and a clock signal of the receiver is locked to the synchronization signal.
    Type: Grant
    Filed: June 2, 2017
    Date of Patent: June 19, 2018
    Assignee: ANRITSU COMPANY
    Inventor: Donald Anthony Bradley
  • Patent number: 9977068
    Abstract: A device for combining two or more tones generated by a measuring instrument for output to a port includes a combiner point, a transmission path extending from the combiner point to the port, two or more signal source filters each adapted to be connected to a respective signal source of the measuring instrument and one or more receiver filters each adapted to be connected to a receiver of the measuring instrument. Each of the signal source filters and receiver filters includes a cavity, a resonator arranged within the cavity and connected with the combiner point at a distance of one quarter of a wavelength of a signal having a center frequency of the passband of the filter, and a solid dielectric filter connected with the cavity.
    Type: Grant
    Filed: July 22, 2015
    Date of Patent: May 22, 2018
    Assignee: ANRITSU COMPANY
    Inventor: Donald Bradley
  • Patent number: 9964585
    Abstract: A measurement instrument for measuring electrical characteristics of a device under test (DUT) includes a synchronization signal generator, a coarse phase detection counter and a fine phase detection counter. The synchronization signal generator is connectable with a receiver via a fiber optic cable and a duplexer configured to transmit a synchronization signal from the measurement instrument to the receiver and retransmit the received synchronization signal from the receiver to the measurement instrument. The coarse phase detection counter and the fine phase detection counter are configured to determine one or both of a distance from the receiver to the measurement instrument and a phase shift in the synchronization signal between the receiver and the measurement instrument.
    Type: Grant
    Filed: November 14, 2016
    Date of Patent: May 8, 2018
    Assignee: ANRITSU COMPANY
    Inventor: Donald Anthony Bradley
  • Patent number: 9967085
    Abstract: A measurement instrument for measuring electrical characteristics of a device under test (DUT) includes a synchronization signal generator configured to generate a synchronization signal transmittable from the measurement instrument to a receiver. The synchronization generator comprises a phase-locked loop (PLL) that locks the phase of the LO signal to the synchronization signal. The A/D clock signal is generated from the synchronization signal.
    Type: Grant
    Filed: November 14, 2016
    Date of Patent: May 8, 2018
    Assignee: ANRITSU COMPANY
    Inventor: Donald Anthony Bradley
  • Patent number: 9860054
    Abstract: A measurement instrument for measuring electrical characteristics of a device under test (DUT) includes a synchronization signal generator for generating a synchronization signal transmittable to a receiver, a voltage controlled phase shifter (VCPS) connected with the synchronization signal generator and a phase-to-voltage converter configured to drive the VCPS. The synchronization signal is transmitted via a duplexer configured to transmit the synchronization signal from the measurement instrument to the receiver via a fiber optic cable and retransmit the received synchronization signal from the receiver to the measurement instrument via the fiber optic cable. The phase-to-voltage converter receives as inputs the synchronization signal input to the VCPS, the synchronization signal output from the VCPS and the retransmitted synchronization signal received at the measurement instrument from the receiver. An output of the phase-to-voltage converter is provided as input to the VCPS.
    Type: Grant
    Filed: November 14, 2016
    Date of Patent: January 2, 2018
    Assignee: ANRITSU COMPANY
    Inventor: Donald Anthony Bradley
  • Patent number: 9768892
    Abstract: In an embodiment, a method for measuring passive intermodulation (PIM) associated with a device under test (DUT) includes generating a test signal using a measuring instrument and obtaining measurements of PIM for the DUT. The test signal comprises two or more tones each amplified to a target output power by a respective amplifier according to a duty cycle. Measurements are obtained by the measuring instrument during an active portion of each duty cycle over a sweep of frequencies. PIM is calculated for the DUT by averaging a plurality of measurements obtained for each frequency from the sweep of frequencies. The duty cycle is determined based on the target output power.
    Type: Grant
    Filed: March 30, 2015
    Date of Patent: September 19, 2017
    Assignee: ANRITSU COMPANY
    Inventor: Donald Anthony Bradley
  • Patent number: 9753071
    Abstract: A method for obtaining improved resolution pulsed radio frequency (RF) measurements with phase coherence for a device under test (DUT) using a vector network analyzer (VNA) includes generating a pulsed RF test signal, transmitting the pulsed RF test signal to the DUT and receiving a signal from the DUT at the VNA in response to the pulsed RF test signal. An intermediate frequency (IF) signal is generated using a local oscillator (LO) signal. A phase of the LO signal is shifted by a prescribed amount while generating the IF signal. The IF signal is then sampled over multiple pulses and measurements are constructed from the measurements. A discrete Fourier transform (DFT) is then applied to the constructed measurements.
    Type: Grant
    Filed: March 14, 2014
    Date of Patent: September 5, 2017
    Assignee: ANRITSU COMPANY
    Inventor: Jon S. Martens