Patents Assigned to Anritsu Corporation
  • Publication number: 20130210370
    Abstract: The measurement apparatus 10 includes a transmission and reception unit 14 that receives a continuous test signal which is output from the mobile terminal 30 and in which test signals based on the plurality of communication methods continue at predetermined time intervals, an acquisition section 21 that sequentially acquires the test signals based on the plurality of communication methods included in the continuous test signal, a measurement section 22 that sequentially measures the test signals acquired by the acquisition section 21, a measurement result storage section 23 that sequentially stores the data of the measurement result of the measurement section 22, and a display unit 15 that displays the data of the measurement result stored in the measurement result storage section 23.
    Type: Application
    Filed: February 11, 2013
    Publication date: August 15, 2013
    Applicant: ANRITSU CORPORATION
    Inventor: ANRITSU CORPORATION
  • Publication number: 20130211781
    Abstract: To provide a measurement apparatus and measurement method capable of shortening the measurement time, a measurement apparatus 10 includes: an acquisition section 21 that acquires the data of a plurality of slots; a setting unit 12 that sets measurement items for each slot; an additional time table 23 that stores additional time set in advance for each measurement item; a measurement period setting section 22 that sets a measurement period for measuring the data of a slot by adding additional time before and after time assigned to the slot; and a measurement section 30 that measures the characteristics of the data of the slot in a measurement period.
    Type: Application
    Filed: February 11, 2013
    Publication date: August 15, 2013
    Applicant: ANRITSU CORPORATION
    Inventor: ANRITSU CORPORATION
  • Patent number: 8509294
    Abstract: To provide a signal generator, a signal generating system, and a signal generating method capable of repeatedly generating an arbitrary waveform and making the phases of the head and tail of the generated waveform continuous with each other, without changing the frequency of the waveform. A signal generator (10, 11, 12) includes phase shift means (30) that receives waveform data which is repeatedly output n times, shifts the phase of each sample data item in an n-th waveform data item by a phase shift amount ?n corresponding to the number of times n the waveform data is repeatedly output, and outputs the waveform data to D/A conversion means.
    Type: Grant
    Filed: November 30, 2011
    Date of Patent: August 13, 2013
    Assignee: Anritsu Corporation
    Inventors: Shinichi Ito, Tatsuro Hanaya, Jun Ono
  • Patent number: 8509296
    Abstract: There is provided a spectrum analyzer and a spectrum analysis method capable of promptly performing measurement while preventing the spectrum waveform caused by the fractional spurious components from being displayed. When the width of a designated span (analysis target frequency range) is larger than a boundary value, a reference signal frequency is set to a predetermined reference value, and a loop filter band narrower than a RBW (resolution bandwidth) is selected to thereby make the fractional spurious components be within the RBW and prevent it from being displayed as a spectrum waveform.
    Type: Grant
    Filed: December 14, 2010
    Date of Patent: August 13, 2013
    Assignee: Anritsu Corporation
    Inventors: Momoko Inadomaru, Toru Otani, Yuji Kishi
  • Publication number: 20130200923
    Abstract: A phase adjuster 2a receives a trigger clock synchronized with a data signal to be measured as input, and controls the phase of the trigger clock such that the trigger period of samples of the data signal to be measured becomes one sample per bit. An adjustable frequency divider 2b has a frequency division ratio which is set such that a trigger pulse is generated at the fixed timing of the waveform pattern of the data signal to be measured. An interleaving unit 4d uses a discrete value which is in prime relation to the measured pattern length of the data signal to be measured, and acquires data for the number of samples corresponding to the measured pattern length from a sampler 3 by the trigger pulse from the adjustable frequency divider 2b.
    Type: Application
    Filed: January 29, 2013
    Publication date: August 8, 2013
    Applicant: ANRITSU CORPORATION
    Inventor: Anritsu Corporation
  • Patent number: 8498581
    Abstract: A communication test device can assist in identifying a cause of a change in throughput of a mobile communication terminal. The communication test device accumulates (a) trace data on a specific unit of data complying with a designated communication standard, and (b) throughput data on throughput of the specific unit of data transmitted to and received from a mobile communication terminal. Trace data and throughput data are extracted from the accumulation, and trace data is displayed. A graph of the variation of throughput with time is displayed on the display unit. Trace data corresponding to a time designated by an operating unit can also be displayed.
    Type: Grant
    Filed: August 20, 2012
    Date of Patent: July 30, 2013
    Assignee: Anritsu Corporation
    Inventors: Yuichi Negami, Akihide Egawa, Hiroyuki Tsuda, Tsuyoshi Sato, Takuma Goto
  • Patent number: 8487935
    Abstract: There is provided a technique for smoothly performing position (movement) adjustment of a waveform marker by making switching between rough adjustment and fine adjustment in a series of marker operations possible with a single means and continuously. A display control section displays a measured waveform on the two-dimensional coordinates, which have a first axis and a second axis perpendicular to the first axis, on the display section. A waveform marker is movable by a marker operation corresponding to a direction parallel to the first axis. The display control section has a detecting section, which detects the marker operation corresponding to a direction parallel to the second axis, and changes either setting of the waveform marker or the display range of the measured waveform according to the detection result of the detecting section.
    Type: Grant
    Filed: March 31, 2010
    Date of Patent: July 16, 2013
    Assignee: Anritsu Corporation
    Inventor: Kazunori Aoki
  • Publication number: 20130161516
    Abstract: To provide a small and high-performance optical pulse tester using a light emitting device including semiconductor light emitting element capable of emitting light beams with wavelengths in a plurality of wavelength ranges with a high optical output. An optical pulse tester includes: a light emitting device including a semiconductor light emitting element having first and second light emitting end facets formed by cleavage respectively, and a light emitting element driving circuit which applies a driving current to each of a plurality of active layers; a light receiving section which converts returned light of the optical pulse from the optical fiber to be measured into an electric signal; and a signal processor which analyzes a loss distribution characteristic of the optical fiber to be measured on the basis of the electric signal converted by the light receiving section.
    Type: Application
    Filed: February 19, 2013
    Publication date: June 27, 2013
    Applicant: ANRITSU CORPORATION
    Inventor: Anritsu Corporation
  • Publication number: 20130135062
    Abstract: A radio-wave half mirror for millimeter waveband is fixed inside a transmission line propagating electromagnetic waves of millimeter waveband in a single mode so as to transmit a part of incident electromagnetic waves and reflect a part thereof. The radio-wave half mirror includes: a half mirror body where a slit for transmitting electromagnetic waves is provided on a metal plate; and a dielectric plate that is provided on one surface side of the half mirror body so as to form a dielectric resonator which resonates at a frequency determined by the thickness and the permittivity, and has a transmittance characteristic having a degree of inclination substantially the same as that of the half mirror body in a slope which is inverse to a slope of a transmittance characteristic of the half mirror body in a desired frequency range of the millimeter waveband.
    Type: Application
    Filed: November 27, 2012
    Publication date: May 30, 2013
    Applicant: ANRITSU CORPORATION
    Inventor: ANRITSU CORPORATION
  • Publication number: 20130135063
    Abstract: The millimeter waveband filter includes: a transmission line that is formed by a waveguide which propagates electromagnetic waves with a predetermined frequency range of a millimeter waveband from one end to the other end in a TE10 mode; and a pair of radio-wave half mirrors that are disposed opposite each other with a space interposed therebetween so as to block the inside of the transmission line and have planar shapes and a characteristic of transmitting a part of the electromagnetic waves with the predetermined frequency range and reflecting a part thereof. In the electromagnetic waves incident from the one end side of the transmission line, a frequency component centered on a resonant frequency of a resonator, which is formed between the pair of radio-wave half mirrors, is selectively output from the other end of the transmission line.
    Type: Application
    Filed: November 27, 2012
    Publication date: May 30, 2013
    Applicant: ANRITSU CORPORATION
    Inventor: Anritsu Corporation
  • Patent number: 8442662
    Abstract: A measurement parameter input control method and a measurement parameter input control device are provided which can intuitively change measurement parameters, which are set for a target device and are necessary for various measuring processes, with high operability.
    Type: Grant
    Filed: February 7, 2011
    Date of Patent: May 14, 2013
    Assignee: Anritsu Corporation
    Inventors: Yohei Niki, Eiji Takeda, Tadanori Nishikobara, Keita Masuhara, Takashi Murakami
  • Patent number: 8432958
    Abstract: An apparatus for rapidly measuring jitter transfer characteristics is provided. A modulation signal generator generates a modulation signal M including a plurality of sinusoidal components having known amplitudes m1 to mn and different frequencies f1 to fn, and outputs the modulation signal M to a jitter generator. A clock signal C phase-modulated by the modulation signal M is input to a data signal generator, a data signal D synchronized with the clock signal C is provided to a measurement object, a data signal D? output from the measurement object is input to a clock recovery unit to recover a clock signal component C?, and the clock signal component C? is phase-detected by a phase detector.
    Type: Grant
    Filed: January 21, 2010
    Date of Patent: April 30, 2013
    Assignee: Anritsu Corporation
    Inventors: Seiya Suzuki, Takashi Aoki, Ken Mochizuki
  • Patent number: 8433740
    Abstract: An M-sequence generator includes EXCLUSIVE-OR gates feeding back pieces of bit data from m number of series registers to the registers in response to a clock. A period of a cyclic group {(?1k), (?2k), (?3k), . . . } falls within a maximum period (2m?1), the group being produced as an element (?k) obtained by raising a root ? of a polynomial to a specified power value k (k?2), which have the terms in polynomials of a Galois field GF(2m). In a multiplying unit including the gates, pieces of bit data is fed into one end of the multiplying unit in response to the clock while the element (?k) is fed into the other end. The multiplying unit performs Galois field multiplication between each piece of bit data and the element (?k), the gate supplies the multiplication result as feedback bit data to the respective registers.
    Type: Grant
    Filed: April 28, 2010
    Date of Patent: April 30, 2013
    Assignee: Anritsu Corporation
    Inventors: Takashi Furuya, Masahiro Kuroda, Kazuhiko Ishibe
  • Patent number: 8422378
    Abstract: [Task] To provide a mobile communication terminal test apparatus capable of displaying an EVM or a transmission power measurement result in a frequency division multiple access communication scheme by distinguishing between the allocation band and the non-allocation band. [Means for Resolution] A test signal including control information representing the communication channel and the allocation band is transmitted to the mobile communication terminal, the test signal output from the mobile communication terminal is received, the output waveform data are analyzed, a measurement value of a predetermined measurement item is obtained on a symbol-by-symbol basis, the obtained symbol-based measurement value is displayed on a graph, and the allocation band on the corresponding graph and the non-allocation band within the communicate channel are displayed to be distinguished therebetween.
    Type: Grant
    Filed: December 14, 2010
    Date of Patent: April 16, 2013
    Assignee: Anritsu Corporation
    Inventor: Kazunori Aoki
  • Publication number: 20130084853
    Abstract: In a system for testing a mobile communication device under test, a calculation part calculates, before a control part starts processing according to a designated measurement sequence, a total value of a data amount to be acquired as an analysis target by a transmission/reception unit in the designated measurement sequence. A determination part determines whether the calculated total value of the data amount exceeds a permissible value which has been set in advance according to a predetermined capacity of a reception data memory. If the determination part determines that the calculated total value exceeds the permissible value, the control part displays the determination result on the display unit.
    Type: Application
    Filed: September 12, 2012
    Publication date: April 4, 2013
    Applicant: ANRITSU CORPORATION
    Inventors: Keiichi MINEDA, Yoshitaka KIHARA
  • Publication number: 20130085737
    Abstract: A relay node simulator includes a marker display control unit that correlates a base station marker, a relay node marker, and a terminal marker to a predetermined coordinate system and allows the makers to be displayed on an operation screen, and that allows at least one of the markers to be displayed on the operation screen in a movable manner in accordance with an operation input, a position specifying unit that specifies respective positions of the respective markers in the coordinate system, and a pattern display control unit that allows a magnitude of a characteristic value relating to a first RF signal or a second RF signal to be displayed on the operation screen as a discriminable pattern, wherein, a test signal to which the characteristic value corresponding to the specified position is applied is output.
    Type: Application
    Filed: October 1, 2012
    Publication date: April 4, 2013
    Applicant: Anritsu Corporation
    Inventor: Anritsu Corporation
  • Patent number: 8401044
    Abstract: [Task] To provide a semiconductor light emitting element capable of emitting light beams with wavelengths in a plurality of wavelength ranges with a high optical output, a driving method of a semiconductor light emitting element capable of making a semiconductor light emitting element that can emit light beams with wavelengths in a plurality of wavelength ranges operate with a high optical output, a light emitting device, and a small and high-performance optical pulse tester using the light emitting device. [Means for Resolution] In a driving method of a semiconductor light emitting element with a configuration in which an active layer 13a with a gain wavelength ?1 of about 1.55 ?m and an active layer 13b with a gain wavelength ?2 of about 1.
    Type: Grant
    Filed: June 2, 2011
    Date of Patent: March 19, 2013
    Assignee: Anritsu Corporation
    Inventors: Shintaro Morimoto, Hiroshi Mori, Yasuaki Nagashima
  • Publication number: 20130064117
    Abstract: A relay node simulator that outputs a test signal obtained by simulating a signal in which a first RF signal from a base station and a second RF signal transmitted to a mobile communication terminal by a relay node receiving the first RF signal are multiplexed, the relay node simulator including a relay processing unit that generates a second baseband signal on the basis of a first baseband signal, a delay processing unit that provides a predetermined delay to the second baseband signal, a gain adjustment unit that changes a level of the first baseband signal, an adder that adds the first baseband signal and the second baseband signal, and a transmission unit that converts an added signal into an RF signal and transmits a converted signal as the test signal.
    Type: Application
    Filed: August 27, 2012
    Publication date: March 14, 2013
    Applicant: ANRITSU CORPORATION
    Inventors: Reiichi Hashimoto, Syun Hosokawa
  • Patent number: 8396429
    Abstract: A communication test device can assist in identifying a cause of a change in throughput of a mobile communication terminal. The communication test device accumulates (a) trace data on a specific unit of data complying with a designated communication standard, and (b) throughput data on throughput of the specific unit of data transmitted to and received from a mobile communication terminal. Trace data and throughput data are extracted from the accumulation, and trace data is displayed. A graph of the variation of throughput with time is displayed on the display unit. Trace data corresponding to a time designated by an operating unit can also be displayed.
    Type: Grant
    Filed: August 20, 2012
    Date of Patent: March 12, 2013
    Assignee: Anritsu Corporation
    Inventors: Yuichi Negami, Akihide Egawa, Hiroyuki Tsuda, Tsuyoshi Sato, Takuma Goto
  • Patent number: 8391346
    Abstract: When an operating unit is operated to designate an arbitrary width W and an arbitrary angle ?, a mask region limiting unit limits the effective range of a reference mask set for compliance measurement of the data signal to be evaluated by a reference mask setting unit to the range determined by the designated width and angle and displays the limited effective range on a display unit. When the mask region limiting unit limits the effective range of the reference mask, a quality evaluating unit performs compliance measurement and quality evaluation for the limited effective range in operative association with the limitation of the effective range.
    Type: Grant
    Filed: April 12, 2011
    Date of Patent: March 5, 2013
    Assignee: Anritsu Corporation
    Inventors: Keita Masuhara, Tadanori Nishikobara