Patents Assigned to ANRITSU INFIVIS CO., LTD.
  • Patent number: 10996363
    Abstract: A metal detection apparatus comprises: a detection circuit unit (30) that detects a first variation component having a large influence of workpiece and a second variation component having a large influence of metal; a determination unit (40) that compares the two variation components to perform a metal determination process in the workpiece (W); and a detection condition adjustment unit (60) that adjusts detection conditions of both variation components. A foreign matter waveform storage unit (50) stores a test variation component accompanying temporal change due to metal influence is further provided. The detection condition adjustment unit sets a specific processing condition of detection processing in the detection circuit unit based on the first variation component based on the magnetic field variation signal at the time when the work W including no metal passes through the inspection zone Z and the second variation component constituted by the test variation component.
    Type: Grant
    Filed: May 22, 2018
    Date of Patent: May 4, 2021
    Assignee: ANRITSU INFIVIS CO., LTD.
    Inventors: Yuki Hayakawa, Eiji Taniguchi, Akira Ohashi, Tomohiko Yamaguchi
  • Patent number: 10999918
    Abstract: An X-ray tube, including: an envelope (11) that holds inside thereof at a predetermined pressure; a filament (12) for emitting electrons and a focus electrode (13) provided in the envelope: and a target (15) for generating X-ray provided in the envelope facing to the filament (12) and the focus electrode (13), wherein the envelope (11) has an envelope body (11a) and an X-ray window portion (16) having a higher X-rays transmissivity and a higher electric conductivity than the envelope body (11a), when the X-ray window portion (16) or the anode (14) is set to a lower electric potential than both of an electric potential of the anode (14) or the X-ray window portion (16) and an electric potential of the filament (12) and the focus electrode (13), detection of at least one of an ion current (Ii) or an electron current (Ie) through the X-ray window portion (16) or the anode (14) is possible.
    Type: Grant
    Filed: December 11, 2018
    Date of Patent: May 4, 2021
    Assignees: ANRITSU INFIVIS CO., LTD., YAMAGUCHI UNIVERSITY
    Inventors: Hiroyuki Koba, Jyunichi Moriya, Yoshifumi Takahashi, Hiroki Kurisu
  • Patent number: 10866331
    Abstract: Provided is an X-ray inspection apparatus that can inspect an object to be inspected with high sensitivity by using a multiple-stage X-ray sensor without widening a slit of a collimator, and can prevent the apparatus from becoming large-sized due to prevention of X-ray leakage. An X-ray inspection apparatus includes an X-ray irradiation portion having an X-ray tube generating an X-ray, an X-ray sensor having detection element arrays in a plurality of stages in a carrying direction, the detection element arrays each formed of a plurality of detection elements linearly arranged in a main scanning direction orthogonal to the carrying direction on a plane parallel to the carrying surface of an object to be inspected, a collimator restricting an X-ray irradiation region for the X-ray sensor, and an imaging condition input section that designates one or more detection element arrays to be used for inspection.
    Type: Grant
    Filed: September 23, 2019
    Date of Patent: December 15, 2020
    Assignee: ANRITSU INFIVIS CO., LTD.
    Inventors: Naoya Saito, Itaru Miyazaki
  • Patent number: 10790067
    Abstract: An X-ray inspection device performs inspection by irradiating an X-ray on an inspection object conveyed in an X-ray shielded space. The device has a shielding gate, having a passage part the shape of which is changeable in correspondence with the outer shape of the inspection object, so as to pass the inspection object. The shielding gate may be retractably provided in a shielding position inside the shielded space.
    Type: Grant
    Filed: November 1, 2017
    Date of Patent: September 29, 2020
    Assignee: ANRITSU INFIVIS CO., LTD.
    Inventors: Koji Omori, Daiki Kataoka
  • Patent number: 10718725
    Abstract: To correctly acquire image data of an inspected article by preventing a difference in shade between images caused by a difference in position or sensitivity between sensor elements. An X-ray generation source irradiates an inspection region where an inspected article passes with an X-ray. X-ray detection means receives the X-ray passing through the inspection region using a plurality of sensor elements. Image data generation means generates image data of the inspected article from an output of the X-ray detection means. Incidence condition changing means changes two or more kinds of X-ray incidence conditions common for all of the plurality of sensor elements of the X-ray detection means in a state of absence of the inspected article in the inspection region. Correction data generation means acquires correction data that is needed for making a shade of an image uniform for each incidence condition.
    Type: Grant
    Filed: June 27, 2018
    Date of Patent: July 21, 2020
    Assignee: ANRITSU INFIVIS CO., LTD.
    Inventors: Itaru Miyazaki, Akihiro Tanaka, Takashi Kanai, Hisashi Hayashi
  • Patent number: 10338260
    Abstract: Detection of contained metal contained in an article can be carried out with a high sensitivity with a simple operation in a limited space. A transmission coil 42 that generates a magnetic field for inspection from an upper surface side through a lower surface side of a placing table 21 and a plurality of magnetic sensors 43 for detecting the magnetic field are provided in a head 40 disposed on a lower surface side of the placing table 21 for placing an article which is an inspection object. When the head 40 is scanned so as to cover the entire lower surface-side region of the placing table 21, metal being contained in the article placed on the placing table 21 is detected on the basis of a change in the magnetic field being detected by the magnetic sensors 43.
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: July 2, 2019
    Assignee: ANRITSU INFIVIS CO., LTD.
    Inventors: Yoshifumi Takahashi, Osamu Tanaka, Kazunori Sakata
  • Patent number: 10292251
    Abstract: An X-ray inspection device achieves a high cooling effect without using an expensive air conditioner and is excellent in cleaning property. The inside of a first case of an X-ray inspection device is separated into plural cooling partitions by separation walls by the use limit temperature and the like, and heat sources respectively having intrinsic use limit temperature are stored in respective partitions. Because a flow passage of air is set inside the cooling partition so that the heat sources having low use limit temperature are disposed upstream of the heat sources having high use limit temperature, the cooling efficiency is excellent. A heat absorption member of a heat exchange device exists inside the first case, and a heat radiation member exists inside a second case communicating with the external air. Because there is no protrusion of the heat radiation member as the total cases, cleaning property is excellent.
    Type: Grant
    Filed: October 6, 2016
    Date of Patent: May 14, 2019
    Assignee: ANRITSU INFIVIS CO., LTD.
    Inventors: Toshiaki Kikuchi, Naoya Saito, Hisashi Hayashi, Takashi Kanai
  • Publication number: 20180122526
    Abstract: An X-ray inspection device performs inspection by irradiating an X-ray on an inspection object conveyed in an X-ray shielded space. The device has a shielding gate, having a passage part the shape of which is changeable in correspondence with the outer shape of the inspection object, so as to pass the inspection object. The shielding gate may be retractably provided in a shielding position inside the shielded space.
    Type: Application
    Filed: November 1, 2017
    Publication date: May 3, 2018
    Applicant: ANRITSU INFIVIS CO., LTD.
    Inventors: Koji OMORI, Daiki KATAOKA