Patents Assigned to ANTEVERTA-MW B.V.
  • Patent number: 11467209
    Abstract: A method for measuring (and controlling) a characteristic performance parameter ?s of a device under test (DUT) having an input port (at the minimum). The method involves connecting the input port of the DUT to a signal generator, subjecting the DUT to a large signal input test signal, and executing a first measurement of the incident wave and reflected wave at a DUT input reference plane. The method further involves subjecting the DUT to a perturbation signal combined with the large signal input test signal, and executing a second measurement of the incident wave and reflected wave at the DUT input reference plane, and determining the characteristic performance parameter from the first measurement and the second measurement.
    Type: Grant
    Filed: March 1, 2019
    Date of Patent: October 11, 2022
    Assignee: Anteverta-mw B.V.
    Inventors: Mauro Marchetti, Michele Squillante
  • Publication number: 20200408838
    Abstract: A method for measuring (and controlling) a characteristic performance parameter S of a device under test (DUT) 10 having an input port(at the minimum). The method comprises connecting the input port of the DUT 10 to a signal generator 1, subjecting the DUT 10 to a large signal input test signal, and executing a first measurement a1?, b1? of the incident wave a1 and reflected wave b1 at a DUT input reference plane. The method further comprises subjecting the DUT 10 to a perturbation signal combined with the large signal input test signal, and executing a second measurement a1?, b1? of the incident wave a1 and reflected wave b1 at the DUT input reference plane, and determining the characteristic performance parameter from the first measurement and the second measurement.
    Type: Application
    Filed: March 1, 2019
    Publication date: December 31, 2020
    Applicant: Anteverta-mw B.V.
    Inventors: Mauro Marchetti, Michele Squillante
  • Patent number: 8456175
    Abstract: Measurement arrangement and method for active load pull measurements of a device under test (1). A wideband analog-to-digital conversion block (3) is provided for obtaining measurement data. First and second injection signal generators (7, 8) are connected to a source side and a load side of the device under test (1). This set up allows to create predetermined reflection coefficients at reference planes of the device under test (1). Injection signal parameters as determined are converted into the injection signals at the source and load side by digital-to-analog conversion. The wideband analog-to-digital conversion block (3) is further arranged for analog-to-digital conversion of the intermediate frequency signals to obtain the actual measured reflection coefficient versus frequency functions with a first frequency resolution. The first frequency resolution applied in the analog-to-digital conversion is equal to or better than a second frequency resolution applied in the digital-to-analog conversion.
    Type: Grant
    Filed: April 1, 2009
    Date of Patent: June 4, 2013
    Assignee: Anteverta-MW B.V.
    Inventors: Mauro Marchetti, Marco Johannes Pelk, Leonardus Cornelis Nicolaas De Vreede
  • Publication number: 20110163762
    Abstract: Measurement arrangement and method for active load pull measurements of a device under test (1). A wideband analog-to-digital conversion block (3) is provided for obtaining measurement data. First and second injection signal generators (7, 8) are connected to a source side and a load side of the device under test (1). This set up allows to create predetermined reflection coefficients at reference planes of the device under test (1). Injection signal parameters as determined are converted into the injection signals at the source and load side by digital-to-analog conversion. The wideband analog-to-digital conversion block (3) is further arranged for analog-to-digital conversion of the intermediate frequency signals to obtain the actual measured reflection coefficient versus frequency functions with a first frequency resolution. The first frequency resolution applied in the analog-to-digital conversion is equal to or better than a second frequency resolution applied in the digital-to-analog conversion.
    Type: Application
    Filed: April 1, 2009
    Publication date: July 7, 2011
    Applicant: ANTEVERTA-MW B.V.
    Inventors: Mauro Marchetti, Marco Johannes Pelk, Leonardus Cornelis NIicolaas De Vreede