Abstract: Surface measurement probe comprising: a hollow probe body extending along a longitudinal axis and comprising a proximal end adapted to be mounted to a test apparatus and a distal end; a retaining arrangement situated inside the probe body and extending along said longitudinal axis, the retaining arrangement being arranged to maintain the surface measurement probe in an assembled state; a probe tip supported at the distal end of the probe body and arranged to contact a sample; a bead situated inside the probe body and interposed between the probe tip and the retaining arrangement, the bead comprising a thermally-insulating material.

Abstract: Heating arrangement for a materials testing device, the materials testing device comprising at least one surface measurement probe adapted to be brought into contact with a surface of a sample, the heating arrangement comprising a probe heater comprising: an infrared emitting element adapted to emit infrared radiation; a reflector having a reflective surface arranged to direct said infrared radiation towards a distal end of said surface measurement probe. According to the invention, the reflector comprises a first focal point and a second focal point, the infrared emitting element being situated substantially at said first focal point.